Abstract:
Techniques and mechanisms for providing termination for a plurality of chips of a memory device. In an embodiment, a memory device is an integrated circuit (IC) package which includes a command and address bus and a plurality of memory chips each coupled thereto. Of the plurality of memory chips, only a first memory chip is operable to selectively provide termination to the command and address bus. Of the respective on-die termination control circuits of the plurality of memory chips, only the on-die termination control circuit of the first memory chip is coupled via any termination control signal line to any input/output (I/O) contact of the IC package. In another embodiment, the plurality of memory chips are configured in a series with one another, and wherein the first memory chip is located at an end of the series
Abstract:
A register not connected to a data bus is read by transferring data across an address bus to a device connected to the data bus, from which the data is read by a device connected to the data bus. The register resides in a register device connected via the address bus to a memory device that is connected to both the address bus and the data bus. A host processor triggers the register device to transfer information over the address bus to a register on the memory device. The host processor then reads the information from the register of the memory device.
Abstract:
On the fly enabling and disabling of error detection for memory access transactions on a transaction basis is provided. Dynamic enabling and disabling of error detection for memory access transactions can also be applied for multiple transactions. Control logic associated with the memory device determines whether to apply error detection, and selectively enables error detection in the memory access transaction. The selective enabling of error detection in a memory access transaction can apply to either reads or writes.
Abstract:
Embodiments of the invention are generally directed to systems, methods, and apparatuses for a common memory device for variable device width and scalable pre-fetch and page size. In some embodiments, a common memory device (such as a DRAM) can operate in any of a number of modes including, for example, a x4 mode, a x8 mode, and a x16 mode. The page size provided by the DRAM may vary depending on the mode of the DRAM. In some embodiments, the amount of data pre-fetched by the DRAM also varies depending on the mode of the DRAM.
Abstract:
Techniques and mechanisms for determining a timing of a command to access a memory device resource. In an embodiment, a multi-cycle command which is exchanged from a memory controller to a memory device, wherein the multi-cycle command indicates an access to a bank of the memory device. Timing of the one or more other commands is controlled, based on the multi-cycle command, to enforce a time delay parameter which describes an operational constraint of the memory device. In another embodiment, timing of one or more commands is determined with reference to a beginning of a last cycle of a multi-cycle command.
Abstract:
Techniques and mechanisms for a memory device to concurrently receive and process signals each based on a different respective reference voltage level. In an embodiment, an input/output (I/O) interface of a memory device includes receiver circuits each to process a respective signal received via a corresponding signal line of a bus. In response to one or more configuration commands, a first receiver circuit is configured to process a first signal based on a first reference voltage level and a second receiver circuit is configured to process a second signal based on a second reference voltage level. In another embodiment, a memory controller sends the one or more configuration commands to such a memory device based on an evaluation of voltage swing characteristics each corresponding to a different respective signal line of a bus.
Abstract:
Embodiments of an apparatus, system and method for using Per DRAM Addressability (PDA) to program Multi-Purpose Registers (MPRs) of a dynamic random access memory (DRAM) device are described herein. Embodiments of the invention allow unique 32 bit patterns to be stored for each DRAM device on a rank, thereby enabling data bus training to be done in parallel. Furthermore, embodiments of the invention provide 32 bits of storage per DRAM device on a rank for the system BIOS for storing codes such as MR values, or for any other purpose (e.g., temporary scratch storage to be used by BIOS processes).
Abstract:
Embodiments of the invention are generally directed to improving the reliability, availability, and serviceability of a memory device. In some embodiments, a memory device includes a memory core having a first portion to store data bits and a second portion to store error correction code (ECC) bits corresponding to the data bits. The memory device may also include error correction logic on the same die as the memory core. In some embodiments, the error correction logic enables the memory device to compute ECC bits and to compare the stored ECC bits with the computed ECC bits.
Abstract:
Embodiments of the present disclosure describe memory module bus termination voltage (VTT) regulation and management techniques and configurations. A method includes receiving, by a register, a signal that is driven over a bus to a memory device comprising a plurality of memory cells and setting, within the register, a termination voltage (VTT) for the bus based on the signal. Other embodiments may be described and/or claimed.
Abstract:
Embodiments of the invention describe systems, methods, and apparatuses to reduce the instantaneous power necessary to execute a DRAM device initiated self-refresh. Embodiments of the invention describe a DRAM device enabled to stagger self-refreshes between a plurality of banks. Staggering self-refreshes between banks reduces the current required for a DRAM self-refresh, thus reducing the amount of current required by the DRAM device.