THERMOAKUSTISCHES TOMOGRAPHIEVERFAHREN UND THERMOAKUSTISCHER TOMOGRAPH
    3.
    发明申请
    THERMOAKUSTISCHES TOMOGRAPHIEVERFAHREN UND THERMOAKUSTISCHER TOMOGRAPH 审中-公开
    热力学声学成像过程和热力学声学断层扫描

    公开(公告)号:WO2006007611A1

    公开(公告)日:2006-01-26

    申请号:PCT/AT2005/000244

    申请日:2005-06-30

    Abstract: Die Erfindung betrifft ein thermoakustisches Tomographieverfahren und einen thermoakustischen Tomograph (1) zur Abbildung eines Objekts (2) mit zumindest einer Quelle (3) zur thermischen Anregung des Objekts (2) und zumindest einem Detektor (5) zur Erfassung der vom Objekt (2) durch die Anregung hervorgerufenen akustischen Wellen (4), mit einer Einrichtung (7) zur Bewegung des Objekts (2) und bzw. oder des zumindest einen Detektors (5) relativ zueinander und mit einer Einrichtung (8) zur Rekonstruktion des Objekts (2) aus den erfassten akustischen Wellen (4) in Abhängigkeit der jeweiligen Lage des Objekts (2). Zur Schaffung eines derartigen Verfahrens bzw. einer derartigen Einrichtung durch die das Objekt (2) mit möglichst niedrigem algorithmischen Aufwand, aber mit möglichst hoher Auflösung rekonstruiert werden kann ist vorgesehen, dass der zumindest eine Detektor (5) zumindest in einer Dimension eine Ausdehnung aufweist, welche mindestens √8.d beträgt, wobei d den maximalen Abstand eines Punktes des abzubildenden Objekts (2) vom Detektor (5) bezeichnet.

    Abstract translation: 本发明涉及一种热声断层摄影方法和热声断层摄影(1),用于对对象成像的(2)具有至少一个光源(3),用于所述对象的热激发(2)和至少一个检测器(5),用于检测所述对象(2) 通过声波(4)的激励引起的,与装置(7),用于(2)和分别或所述至少一个检测器(5)相对于彼此并用的装置(8),用于所述对象的重建移动所述对象(2) 从在所述对象(2)的各自的位置而检测出的声波(4)。 为了创建这样的,通过该对象(2)可以以高的分辨率可能具有最低可能的算法的复杂性被重建的方法或这样的装置,但它提供了具有至少一个检测器(5)至少在一个维度上,尺寸, 这是其中d从检测器(5)表示的至少v8.d.成像对象(2)的点的最大距离

    PROGRAMMABLE DIFFRACTION GRATING SENSOR
    4.
    发明申请
    PROGRAMMABLE DIFFRACTION GRATING SENSOR 审中-公开
    可编程衍射光栅传感器

    公开(公告)号:WO2004070782A3

    公开(公告)日:2004-11-11

    申请号:PCT/US2004002297

    申请日:2004-01-27

    Abstract: A programmable substance detector includes a light source, a sample cell, a programmable diffraction grating positioned to receive light from the light source and to direct diffracted light to the sample cell, and a detector associated with the cell to detect a match between a characteristic of the diffracted light and a corresponding characteristic of a substance within the cell.

    Abstract translation: 可编程物质检测器包括光源,样品池,定位成接收来自光源的光并将衍射光引导到样品池的可编程衍射光栅,以及与该电池相关联的检测器,用于检测 衍射光和细胞内物质的相应特征。

    SENSING TARGETS USING PHOTOTHERMAL SPECKLE DETECTION
    6.
    发明申请
    SENSING TARGETS USING PHOTOTHERMAL SPECKLE DETECTION 审中-公开
    感光目标使用光热射线检测

    公开(公告)号:WO2017030652A8

    公开(公告)日:2017-04-06

    申请号:PCT/US2016038310

    申请日:2016-06-20

    Abstract: A device (100), and corresponding method, includes a pump light source (102) configured to be modulated at a pump modulation and to irradiate a target specimen (112). The device also includes a probe light source (106) arranged to generate a speckle pattern (114) from the target specimen, as well as a sensor (110) configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method are used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.

    Abstract translation: 一种装置(100)和相应的方法包括:泵浦光源(102),被配置为在泵浦调制下调制并照射目标样本(112)。 所述装置还包括布置成从所述目标样本产生散斑图案(114)的探针光源(106)以及被配置为检测一个或多个斑点的位置和强度中的至少一个的变化的传感器(110) 斑点图案的波瓣与泵浦调制相关。 通过分析作为泵浦光照射的函数的斑点图案变化,该装置和方法用于非接触式监测和远程感测表面,气体,液体,颗粒和其它目标材料。 优点可以包括比现有方法更高的灵敏度; 将可见探测波长用于具有高空间分辨率的非冷却,低成本可见光探测器的能力; 以及在不检测红外光的情况下获得目标材料性能的能力。

    OPTICAL SENSOR FOR DETERMINING THE CONCENTRATION OF AN ANALYTE
    7.
    发明申请
    OPTICAL SENSOR FOR DETERMINING THE CONCENTRATION OF AN ANALYTE 审中-公开
    用于确定分析仪浓度的光学传感器

    公开(公告)号:WO2009061367A2

    公开(公告)日:2009-05-14

    申请号:PCT/US2008/012349

    申请日:2008-10-31

    Abstract: A method and apparatus for non-invasively determining a concentration of glucose in a subject using optical excitation and detection is provided. The method includes emitting an exciter beam to irradiate a portion of tissue of the subject, causing physical and chemical changes in the surface, and causing an initial back scattering of light. The method further includes periodically emitting a probe beam which irradiates the portion of tissue and causes periodic back scatterings of light. The initial and periodic back scatterings are detected and converted into electrical signals of at least the amplitude, frequency or decay time of the physical and chemical changes, the back scatterings being modulated by the physical and chemical changes. By differentiating over time at least one of the amplitude, frequency or decay time of the physical and chemical changes, the concentration of glucose may be determined.

    Abstract translation: 提供了使用光学激发和检测非侵入性地确定受试者中葡萄糖浓度的方法和装置。 该方法包括发射激光束以照射被摄体的一部分组织,引起表面的物理和化学变化,并引起光的初始反向散射。 该方法还包括周期性地发射照射组织部分并引起光的周期性后向散射的探针束。 初始和周期性后向散射被检测并转换成至少物理和化学变化的振幅,频率或衰减时间的电信号,后向散射由物理和化学变化调制。 通过随时间推移物理和化学变化的幅度,频率或衰减时间中的至少一个,可以确定葡萄糖的浓度。

    POLARIZATION MODULATION PHOTOREFLECTANCE CHARACTERIZATION OF SEMICONDUCTOR QUANTUM CONFINED STRUCTURES
    8.
    发明申请
    POLARIZATION MODULATION PHOTOREFLECTANCE CHARACTERIZATION OF SEMICONDUCTOR QUANTUM CONFINED STRUCTURES 审中-公开
    半导体量子限制结构的极化调制光电特性

    公开(公告)号:WO2004107026A3

    公开(公告)日:2005-04-14

    申请号:PCT/US2004015622

    申请日:2004-05-19

    Abstract: A polarization modulation photoreflectance technique has been developed for optical characterization of semiconductor quantum confined structures. By using a tunable laser source in conjunction with polarization state modulation, a single beam modulation spectroscopy technique may be used to characterize the optical response of semiconductor materials and structures. Disclosed methods and instruments are suitable for characterization of optical signatures of quantum electronic confinement, including resolution of excitonic states at the band edge or other direct or indirect critical points in the band structure. This allows for characterization of semiconductor quantum well structures, for characterization of strain in semiconductor films, and for characterization of electric fields at semiconductor interfaces.

    Abstract translation: 已经开发了用于半导体量子限制结构的光学表征的偏振调制光反射技术。 通过结合极化状态调制使用可调激光源,可以使用单光束调制光谱技术来表征半导体材料和结构的光学响应。 公开的方法和仪器适用于量子电子约束的光学特征的表征,包括在带边缘处的激发态的分辨率或带结构中的其它直接或间接关键点。 这允许表征半导体量子阱结构,用于表征半导体膜中的应变以及用于表征半导体界面处的电场。

    POLARIZATION MODULATION PHOTOREFLECTANCE CHARACTERIZATION OF SEMICONDUCTOR QUANTUM CONFINED STRUCTURES
    9.
    发明申请
    POLARIZATION MODULATION PHOTOREFLECTANCE CHARACTERIZATION OF SEMICONDUCTOR QUANTUM CONFINED STRUCTURES 审中-公开
    半导体量子限制结构的极化调制光电特性

    公开(公告)号:WO2004107026A2

    公开(公告)日:2004-12-09

    申请号:PCT/US2004/015622

    申请日:2004-05-19

    IPC: G02F

    Abstract: A polarization modulation photoreflectance technique has been developed for optical characterization of semiconductor quantum confined structures. By using a tunable laser source in conjunction with polarization state modulation, a single beam modulation spectroscopy technique may be used to characterize the optical response of semiconductor materials and structures. Disclosed methods and instruments are suitable for characterization of optical signatures of quantum electronic confinement, including resolution of excitonic states at the band edge or other direct or indirect critical points in the band structure. This allows for characterization of semiconductor quantum well structures, for characterization of strain in semiconductor films, and for characterization of electric fields at semiconductor interfaces.

    Abstract translation: 已经开发了用于半导体量子限制结构的光学表征的偏振调制光反射技术。 通过使用可调激光源与偏振状态调制相结合,可以使用单光束调制光谱技术来表征半导体材料和结构的光学响应。 公开的方法和仪器适用于量子电子约束的光学特征的表征,包括在带边缘处的激发态的分辨率或带结构中的其它直接或间接关键点。 这允许表征半导体量子阱结构,用于表征半导体膜中的应变以及用于表征半导体界面处的电场。

    PROGRAMMABLE DIFFRACTION GRATING SENSOR
    10.
    发明申请
    PROGRAMMABLE DIFFRACTION GRATING SENSOR 审中-公开
    可编程衍射光栅传感器

    公开(公告)号:WO2004070782A2

    公开(公告)日:2004-08-19

    申请号:PCT/US2004/002297

    申请日:2004-01-27

    IPC: H01L

    Abstract: A programmable substance detector includes a light source, a sample cell, a programmable diffraction grating positioned to receive light from the light source and to direct diffracted light to the sample cell, and a detector associated with the cell to detect a match between a characteristic of the diffracted light and a corresponding characteristic of a substance within the cell.

    Abstract translation: 可编程物质检测器包括光源,样本单元,被设置为接收来自光源的光并将衍射光导向样本单元的可编程衍射光栅,以及与单元相关联的检测器 以检测衍射光的特征与细胞内物质的相应特征之间的匹配。

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