Abstract:
A sputtering installation and method are described for coating substrates, the substrate being transportable in said installation in a transport direction, the substrate having a substrate width perpendicular to said transport direction, the installation comprising at least one pair of sputtering targets, each rotatable about a longitudinal axis of the target, the targets having magnet bars arranged lengthwise in pole lines for generating elongated race tracks on the surface of the targets during use. The pole lines are substantially parallel to the substrate transport direction. All targets are arranged side by side with their longitudinal axes parallel. The targets are closer to the substrate than the substrate width, i.e. the distance between the target surfaces and the substrate is lower than the width of the substrate. According to an advantageous embodiment of the invention and especially for coating uniformity the race track angle should be larger than 45°, i.e. the angle between adjacent pole lines is larger than 45° as measured from the target axis.
Abstract:
A continuous thin film deposition apparatus that includes a remote plasma source. The source forms a plasma from a precursor and delivers a modified form of the plasma as a charge-depleted deposition medium to a deposition apparatus for formation of a thin film material. The thin film may be formed on a continuous web or other moving substrate. The charge-depleted deposition medium may be formed within the remote plasma source and delivered to an operatively coupled deposition apparatus or the charge-depleted deposition medium may form as the plasma exits the remote plasma source. The initial plasma is formed within the remote plasma source and includes a distribution of charged species (electrons and ions). The charge-depleted deposition medium contains a reduced concentration of the charged species and permits deposition of thin film materials having lower defect concentration. The thin film material may be a solar material.
Abstract:
This invention relates to a coating apparatus for coating a substrate comprising: a chamber; a cathodic arc source for generating and projecting a plasma beam along a plasma beam path within the chamber, the projected plasma crossing a horizontal plane within the chamber; a moveable holder having a planar mounting surface that is generally parallel to said horizontal plane, the moveable holder being configured to move the planar mounting surface relative to the horizontal plane within the chamber and into the path of the plasma beam to form a plasma coating on the substrate.
Abstract:
A backside coating prevention device adapted for a coating chamber for coating plate-shaped substrates is provided, said coating chamber being adapted for coating continuously or discontinuously transported plate-shaped substrates, comprising a front wall having a substrate feeding opening and a rear wall having a substrate discharge opening, a coating material source adapted for dispensing coating material into the coating chamber, and a transport system, a front side of the transport system facing the coating material source, the transport system being adapted for continuously or discontinuously transporting a plurality of plate-shaped substrates along a transport path on the front side of the transport system, wherein said backside coating prevention device is adapted for providing a gas barrier at the front side of the transport system and adjacent to the backsides of the plurality of plate- shapes substrates for preventing backside coating of the plate-shaped substrates.
Abstract:
A reactive sputtering system includes a vacuum chamber and a reactive ion source that is positioned inside the vacuum chamber. The reactive ion source generates a reactive ion beam from a reactant gas. A sputtering chamber is positioned in the vacuum chamber. The sputtering chamber includes a sputter source having a sputtering target that generates sputtering flux, walls that contain an inert gas, and a seal that impedes the reactant gas from entering into the sputtering chamber and that impedes inert gas and sputtered material from escaping into the vacuum chamber. A transport mechanism transports a substrate under the reactive ion source and through the sputtering chamber. The substrate is exposed to the reactive ion beam while passing under the reactive ion source and then is exposed to sputtering flux while passing through the sputtering chamber.
Abstract:
Procédé pour le traitement en continu d'un substrat verrier dont la dimension perpendiculaire au sens de déplacement le long de ladite installation est 20 supérieure à 1,5 m, ledit procédé étant caractérisé en ce qu'il comprend entre autres : - une étape mettant en oeuvre une ligne magnétron pour effectuer le dépôt de couches minces successives, ladite ligne comprenant une succession de sections, chaque section comprenant au moins une cathode faite d'un matériau 25 ou d'un précurseur du matériau à déposer et fonctionnant suivant le principe de la pulvérisation cathodique sous l'action d'un plasma généré par décharge électrique dans un gaz plasmagène, - au moins une étape mettant en oeuvre un dispositif à plasma atmosphérique, c'est à dire générant et permettant un traitement par un plasma 30 dans un gaz sensiblement à la pression atmosphérique. - Installation permettant la mise en oeuvre du procédé 35 .