摘要:
Nano válvulas de retenção constituídas por películas de zinco perfuradas, apoiadas em sequências de grades de tungstênio, de reticulados crescentes em progressão de razão 10, com os furos obstruídos por moléculas de benzeno, complementada por um filtro para retenção do benzeno, também de película de zinco perfurada. Esta concepção permite a passagem de xenônio pelos furos da película num sentido, mas não no sentido contrário, quaisquer que sejam as pressões do xenônio nos dois lados da película. Com esta capacidade e complementada pelos componentes convencionais motor ou turbina de gás comprimido, trocador de calor Xe/Ar ou Xe/Água, tanque estabilizador da pressão, válvula de controle de vazão, gerador, bateria e alimentação elétrica com termostatos para as resistências das grades dos filtros de benzeno e eventualmente das nano válvulas de retenção, constituem um sistema termodinâmico capaz de captar energia da água ou do ar do ambiente. Para a construção das mesmas é prevista a montagem de "furos" sólidos de gálio, através de AFMs multi sondas, eletrodeposição das películas e posterior remoção dos átomos de gálio para liberação dos furos.
摘要:
There is provided a microscope (100) comprising a micromanipulator, comprising a first electromagnet (110) comprising a first magnetic core (115); a second electromagnet (120) comprising a second magnetic core (125), wherein the first magnetic core (115) and the second magnetic core (125) are configured to generate a magnetic force on magnetic probes (130) arranged within a biological matrix (140) arranged in between the first magnetic core (115) and the second magnetic core (125); and wherein the microscope (100) comprises imaging means (150) configured to capture images of the biological matrix (140) comprising the magnetic probes (130) for detection of displacements of the magnetic probes (130) caused by the magnetic force.
摘要:
Provided is a composite metal-wide-bandgap semiconductor tip for scanning tunneling microscopy and/or scanning, tunneling lithography, a method of forming, and a method for using the composite metal-wide-bandgap semiconductor tip.
摘要:
A prolifer (60) or a scanning probe microscope may be scanned across a sample surface (40) with a distance between them controlled to allow the sensing tip (20) to contact the surface intermittently in order to find and measure features of interest. The distance is controlled so that when the sensing tip (20) is raised or lowered to touch the sample surface (40), there is no lateral relative motion between the tip and the sample. Prior knowledge of the height distribution of the sample surface may be provided or measured and used for positioning the sensing tip initially or in controlling the separation to avoid lateral contact between the tip and the sample. The process may also be performed in two parts: a fast find mode to find the features and a subsequent measurement mode to measure the features.
摘要:
Probes with novel material properties and geometric confined curved tip shapes have been developed as part of cantilevered probes for scanning apertureless near-field microscopy. They produce enhanced resolution for various modalities of combined operation with optical phenomena both linear phenomena such as Raman spectroscopy, absorption, fluorescence etc and non-linear microscopies. This novel probe operates as a sensitive AFM probe with combined capabilities for enhancement of the various modalities noted above. The probes are configured to be optimized for their combined optical properties and their material properties to permit both enhanced fields and quantum state formation with the close approach of the tip to the sample. The local enhancement increases the lateral (X, Y) and axial (Z) resolution of these optical processes without the need for an apertured probe for near-field-field effects thus providing apertureless near-field optical imaging of various modalities.
摘要翻译:具有新颖材料特性和几何限制弯曲尖端形状的探针已经被开发作为用于扫描无孔近场显微镜的悬臂式探针的一部分。 它们针对各种线性现象(如拉曼光谱,吸收,荧光等)和非线性显微镜光学现象的各种组合操作模式产生增强的分辨率。 这种新型探针作为敏感的AFM探针运行,具有综合的能力,可用于增强上述各种模态。 探针被配置为针对它们的组合光学性质和它们的材料特性进行优化,从而允许增强场和量子态形成,其中尖端靠近样品。 局部增强增加了这些光学过程的横向(X,Y)和轴向(Z)分辨率,而不需要用于近场场效应的有孔探针,从而提供各种形式的无光圈近场光学成像。 p >
摘要:
Provided is a composite metal-wide-bandgap semiconductor tip for scanning tunneling microscopy and/or scanning, tunneling lithography, a method of forming, and a method for using the composite metal-wide-bandgap semiconductor tip.
摘要:
본 발명에 의한 3차원 초음파 이미징을 위한 2차원 가상 배열형 탐촉자는, 초음파 트랜스듀서; 복수 개의 도파관이 2차원 배열된 초음파 방사면과, 상기 초음파 트랜스듀서로부터 방사되는 초음파를 그 내부에서 불규칙(chaotic)하게 반사 시키기 위한 1/8 구(sphere)형상의 홈부를 가지는 금속재질의 탐촉자 몸체; 피검사체와 접촉하도록 상기 초음파 방사면 상측에 배치되어, 상기 탐촉자로부터 방사된 초음파는 상기 피검사체 측으로 통과시키고, 상기 피검사체로부터 반사된 초음파를 감지하여 신호를 출력하는 압전 시트부재(piezoelectric sheet); 및 상기 복수 개의 도파관이 순차적으로 초음파를 발진하도록 상기 초음파 트랜스듀서를 제어하는 제어부;를 포함하는 것을 특징으로 한다.
摘要:
A metrology probe capable of measurements of a broad range of physical properties of individual samples of nano- or sub-nanometer dimensions is provided. The probe comprises a probe body, a substrate connected to the probe body, and a tip proximate the substrate. The probe further comprises a coarse piezoelectric actuator having an electrical input. The coarse piezo is configured to cause the tip and/or the substrate to move relative to each other when a first electrical signal is provided to the electrical input. The probe further comprises a low- pass filter in electrical communication with the electrical input of the coarse piezo. The probe further comprises a fine piezoelectric actuator having an electrical input configured to cause the tip and/or the substrate to move relative to each other when a second electrical signal is provided to the electrical input.
摘要:
A Raman imaging and sensing apparatus is described. The apparatus employs a nanoantenna structure, which includes a metal tip spaced from a metal surface or particle. A light beam impinges upon the nanoantenna and causes plasmon resonance. The plasmon resonance excites a sample resulting in dramatically enhanced Raman scattering of the sample. The Raman scatter is collected by a spectrophotometer which provides an output signal indicative of the composition of the sample.