PHOTORESIST PROCESS
    1.
    发明申请
    PHOTORESIST PROCESS 审中-公开

    公开(公告)号:WO2023275316A1

    公开(公告)日:2023-01-05

    申请号:PCT/EP2022/068183

    申请日:2022-06-30

    Abstract: The present invention relates to a process for producing a patterned film comprising particles comprising an AMX compound, which process comprises: (a) providing a photoresist layer disposed on a substrate, which photoresist layer comprises a mixture of a photoresist and particles comprising an AMX compound; (b) defining a pattern on the photoresist layer by exposing regions of the photoresist layer to light and thereby producing a patterned photoresist layer; and (c) treating the patterned photoresist layer with a developer to produce the patterned film comprising particles comprising an AMX compound. The developer may comprise a solvent which has a dielectric constant of at least 6.0. The invention also relates to a process for producing a patterned colour conversion layer and a process for producing a device (such as a display). Further related to the invention is a device intermediate.

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