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    PHOTONIC CIRCUIT WITH INTEGRATED LIGHT COUPLER
    101.
    发明公开
    PHOTONIC CIRCUIT WITH INTEGRATED LIGHT COUPLER 审中-公开
    带集成光耦合器的光电电路

    公开(公告)号：EP3285052A1

    公开(公告)日：2018-02-21

    申请号：EP16184949.2

    申请日：2016-08-19

    Applicant: IMEC VZW ,  Samsung Electronics Co., Ltd.

    Inventor： CLAES, Tom

    IPC: G01J3/02 ,  G01J3/18

    CPC classification number: G01J3/021 ,  G01J3/0259 ,  G01J3/1895 ,  G02B6/0035 ,  G02B6/0083 ,  G02B6/122 ,  G02B6/1228

    Abstract: The present invention relates to an integrated photonic device (1) comprising an image detector (2) that comprises an array of pixels. The device further comprises an integrated waveguide (5) and a light coupler (3) comprising a light receiving part (7) optically coupled to the integrated waveguide (5) for receiving a light signal. The light coupler (3) is adapted for coupling a same predetermined spectral band of the light signal to each of a plurality of pixels of the image detector (2).

    Abstract translation: 本发明涉及包括图像检测器（2）的集成光子器件（1），该图像检测器包括像素阵列。 该设备还包括集成波导（5）和光耦合器（3），光耦合器（3）包括光耦合到集成波导（5）以接收光信号的光接收部分（7）。 光耦合器（3）适于将光信号的相同预定光谱带耦合到图像检测器（2）的多个像素中的每一个。

    OPTICAL SENSING DEVICE AND METHOD FOR MANUFACTURING AN OPTICAL SENSING DEVICE
    103.
    发明公开
    OPTICAL SENSING DEVICE AND METHOD FOR MANUFACTURING AN OPTICAL SENSING DEVICE 审中-公开
    设备生产用于光学测量的装置光学测量及方法

    公开(公告)号：EP3182079A1

    公开(公告)日：2017-06-21

    申请号：EP15199891.1

    申请日：2015-12-14

    Applicant: ams AG

    Inventor： Enichlmair, Hubert ,  Eilmsteiner, Gerhard

    IPC: G01J3/26 ,  G01J3/28 ,  G01J3/12 ,  G02B5/28 ,  H01L31/00 ,  H01L27/146 ,  G01J3/02

    CPC classification number: G01J3/26 ,  G01J3/0259 ,  G01J3/2803 ,  G01J2003/1226 ,  G02B5/285 ,  H01L27/1446 ,  H01L31/00

    Abstract: An optical sensing device comprises a substrate (S1) carrying a first and a second photodetector (S1, S2) and a filter stack arranged on the substrate and covering the photodetector array. The filter stack comprises a band-pass filter (BP), a decoupling layer (DL) arranged on the band-pass filter (BP) and a lower dielectric mirror (LM) arranged on the decoupling layer (DL). The filter stack comprises a spacer stack with a primary spacer layer(SP) arranged on the lower dielectric mirror (LM), comprising a first dielectric material and covering the photodetector array. The spacer stack comprises a first spacer layer (S1) comprising the first dielectric material, wherein a first segment of the first spacer layer (S1) is arranged on the primary spacer layer (SP) and covers the second photodetector (P2) but not the first photodetector (P1). The filter stack comprises an upper dielectric mirror (UM) arranged on the spacer stack.

    Abstract translation: 一种光感测设备包括一个基板（S1）承载第一和第二光电检测器（S1，S2）和配设在基板的过滤器栈和覆盖所述光电检测器阵列。 过滤组包括布置在去耦层（DL）上布置在所述带通滤波器（BP）和下电介质镜（LM）的带通滤波器（BP），去耦层（DL）。 该过滤器叠层包括与设置在下部介电镜（LM）的主隔离层（SP），包括第一介电材料以及覆盖所述光电检测器阵列的隔离物堆叠。 间隔件堆叠包括第一间隔层（S1）包括：第一介电材料，worin第一间隔层的第一段（S1）布置在所述主间隔层（SP）上，并覆盖所述第二光电检测器（P2），但不是 第一光检测器（P1）。 （UM）上电介质反射镜的过滤器堆栈包括布置在间隔件堆栈上。

    APPARATUS, METHOD AND SYSTEM FOR SPECTROMETRY WITH A DISPLACEABLE WAVEGUIDE STRUCTURE
    104.
    发明公开
    APPARATUS, METHOD AND SYSTEM FOR SPECTROMETRY WITH A DISPLACEABLE WAVEGUIDE STRUCTURE 审中-公开
    具有可摆放的波导结构的用于谱分析的装置，方法和系统

    公开(公告)号：EP3161435A1

    公开(公告)日：2017-05-03

    申请号：EP15812427.1

    申请日：2015-05-26

    Applicant: Intel Corporation

    Inventor： HUTCHISON, David, N. ,  KIM, Kyu Hyun ,  RONG, Haisheng ,  HECK, John ,  XU, Shengbo

    IPC: G01J3/18 ,  G02B6/122 ,  G01N21/27

    CPC classification number: G02B6/4295 ,  G01J3/0218 ,  G01J3/0237 ,  G01J3/0259 ,  G01J3/0297 ,  G01J3/1809 ,  G01J3/1895 ,  G01J3/20 ,  G01J3/32 ,  G02B6/00 ,  G02B6/12033

    Abstract: Techniques and mechanisms for a monolithic photonic integrated circuit (PIC) to provide spectrometry functionality. In an embodiment, the PIC comprises a photonic device, a first waveguide and a second waveguide, wherein one of the first waveguide and the second waveguide includes a released portion which is free to move relative to a substrate of the PIC. During a metering cycle to evaluate a material under test, control logic operates an actuator to successively configure a plurality of positions of the released portion relative to the photonic device. In another embodiment, light from the first waveguide is variously diffracted by a grating of the photonic device during the metering cycle, where portions of the light are directed into the second waveguide. Different wavelengths of light diffracted into the second waveguide may be successively detected, for different positions of the released portion, to determine spectrometric measurements over a range of wavelength.

    Abstract translation: 单片光子集成电路（PIC）提供光谱测量功能的技术和机制。 在一个实施例中，PIC包括光子器件，第一波导和第二波导，其中第一波导和第二波导中的一个包括相对于PIC的衬底自由移动的释放部分。 在计量循环期间，为了评估待测材料，控制逻辑操作致动器以相继配置释放部分相对于光子器件的多个位置。 在另一个实施例中，来自第一波导的光在计量周期期间被光子器件的光栅不同地衍射，其中部分光被引导到第二波导中。 衍射到第二波导中的不同波长的光可被连续检测，用于释放部分的不同位置，以确定波长范围内的光谱测量。

    HETEROGENEOUS SPECTROSCOPIC TRANSCEIVING PHOTONIC INTEGRATED CIRCUIT SENSOR
    108.
    发明公开
    HETEROGENEOUS SPECTROSCOPIC TRANSCEIVING PHOTONIC INTEGRATED CIRCUIT SENSOR 审中-公开
    SPEKTROSKOPISCHER传感器麻省光电子激光器SCHALTUNG UND HETEROGENEM LASER

    公开(公告)号：EP3002568A1

    公开(公告)日：2016-04-06

    申请号：EP15002775.3

    申请日：2015-09-28

    Applicant: Aurrion, Inc.

    Inventor： Fish, Gregory Alan ,  Roth, Jonathan Edgar ,  Buckley, Brandon

    IPC: G01J3/02 ,  G01J3/10 ,  G02B6/12 ,  H01S5/40

    CPC classification number: G01J3/1895 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/0259 ,  G01J3/108 ,  G01J2003/102 ,  G01J2003/104 ,  G02B6/12004 ,  G02B6/34 ,  G02B6/4214 ,  G02F1/025 ,  H01S5/021 ,  H01S5/026 ,  H01S5/4075 ,  H01S5/4087

    Abstract: Described herein are optical sensing devices for photonic integrated circuits (PICs). A PIC may comprise a plurality of waveguides formed in a silicon on insulator (SOI) substrate, and a plurality of heterogeneous lasers, each laser formed from a silicon material of the SOI substrate and to emit an output wavelength comprising an infrared wavelength. Each of these lasers may comprise a resonant cavity included in one of the plurality of waveguides, and a gain material comprising a non-silicon material and adiabatically coupled to the respective waveguide. A light directing element may direct outputs of the plurality of heterogeneous lasers from the PIC towards an object, and one or more detectors may detect light from the plurality of heterogeneous lasers reflected from or transmitted through the object.

    Abstract translation: 这里描述了用于光子集成电路（PIC）的光学感测装置。 PIC可以包括形成在绝缘体上硅（SOI）衬底中的多个波导和多个异质激光器，每个激光器由SOI衬底的硅材料形成并且发射包括红外波长的输出波长。 这些激光器中的每一个可以包括包括在多个波导之一中的谐振腔，以及包括非硅材料并且绝缘地耦合到相应波导的增益材料。 光引导元件可以将多个异质激光器的输出从PIC指向物体，并且一个或多个检测器可以检测来自从物体反射或透过物体的多个异质激光器的光。

    PHOTONIC CRYSTAL SPECTROMETER
    109.
    发明公开
    PHOTONIC CRYSTAL SPECTROMETER 审中-公开
    光电子仪表

    公开(公告)号：EP2488912A4

    公开(公告)日：2016-03-30

    申请号：EP10823905

    申请日：2010-10-11

    Applicant: UNIV COLUMBIA

    Inventor： PERVEZ NADIA ,  KYMISSIS IOANNIS ,  ZHANG JLA ,  COX MARSHALL

    IPC: G02B27/42

    CPC classification number: G01J3/0205 ,  G01J3/02 ,  G01J3/0259 ,  G01J3/12 ,  G02B1/005

    Abstract: Apparatus and methods can include an optical waveguide coupled to a photonic crystal comprising a dielectric material, the photonic crystal located on an exterior surface of the optical waveguide and comprising a first surface including a first array of periodic features on or within the dielectric material, the array extending in at least two dimensions and including an effective dielectric permittivity different from the surrounding dielectric material. In an example, the periodic features include a specified lattice constant, the periodic features configured to extract a portion of propagating optical energy from the waveguide through the photonic crystal, the portion determined at least in part by the specified lattice constant.

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