公开(公告)号：EP0195339B1

公开(公告)日：1992-07-29

申请号：EP86103160.7

申请日：1986-03-10

Applicant: ABBOTT LABORATORIES

Inventor： Schultz, Steven George

IPC: G01J3/36 ,  G01J3/00 ,  G01J3/42 ,  G01N21/31 ,  H01L27/14

CPC classification number: G01J3/02 ,  G01J3/0229 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/04 ,  G01J3/2803 ,  G01J2003/2806 ,  G01N21/07 ,  G01N2201/0642 ,  G01N2201/0696 ,  H01L31/02164

公开(公告)号：EP0267634B1

公开(公告)日：1992-06-03

申请号：EP87201918.7

申请日：1987-10-07

Applicant: LABORATOIRES D'ELECTRONIQUE PHILIPS ,  Philips Electronics N.V.

Inventor： Erman, Marko Société Civile S.P.I.D. ,  Hily, Claude Société Civile S.P.I.D. ,  Le Bris, Jean Société Civile S.P.I.D.

IPC: G01J3/02 ,  G01N21/21

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/04 ,  G01N21/211

公开(公告)号：EP0469083A1

公开(公告)日：1992-02-05

申请号：EP90907995.0

申请日：1990-04-20

Applicant: LEHIGH UNIVERSITY

Inventor： KIM, Yong, W.

IPC: G01J3 ,  G01N21

CPC classification number: G01J3/1809 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/28 ,  G01J3/2889 ,  G01J2003/1828 ,  G01N21/718 ,  G01N2021/695

Abstract: Procédé et appareil d'analyse spectroscopique transitoire d'un métal en fusion selon lesquels une sonde (10) contenant un laser pulsé de puissance élevée (14) produisant un rayon laser pulsé ayant une forme d'onde d'impulsion sensiblement triangulaire est immergée dans le métal en fusion et irradie une quantité représentative du métal en fusion. Le rayon laser pulsé vaporise une partie du métal en fusion pour produire une colonne de plasma ayant une composition élémentaire représentative de la composition élémentaire du métal en fusion. Avant que la colonne de plasma n'atteigne l'équilibre thermique peu après la fin de l'impulsion laser, un détecteur spectroscopique (241) dans la sonde (10) détecte des inversions de lignes spectrales pendant une première fenêtre de temps court. Ensuite, lorsque le plasma de post-luminance se trouve en équilibre thermique, un second détecteur spectroscopique (242) également dans la sonde (10) effectue une seconde mesure spectroscopique de durée courte. Un télémètre (22) mesure et commande la distance entre la surface du métal en fusion et le laser pulsé (14).

公开(公告)号：EP0396507A1

公开(公告)日：1990-11-07

申请号：EP90810334.4

申请日：1990-05-01

Applicant: CARL ZEISS JENA GmbH

Inventor： Gärtner, Wolfgang, ,  Schiek, Oswald

IPC: G01J3/12 ,  G01J3/28

CPC classification number: G01J3/04 ,  G01J2003/047 ,  G01J2003/323

Abstract: Zur Erzeugung einer Referenzstrahlung ist dem Aus­trittsspalt (4) mindestens an einer Seite in Beugungsrich­tung ein weiterer Spalt (5) mit fester oder veränderlicher Spaltbreite benachbart. Dadurch wird gewährleistet, dass sich die Intensität der Referenzstrahlung bei Intensitäts­schwankungen des von der Strahlungsquelle (1) ausgehenden Lichtstromes weitgehend linear proportional zur Intensität der Messstrahlung ändert, ohne dass Verluste im Mess-­Strahlenbündel auftreten.

Abstract translation: 为了产生参考辐射，出射狭缝（4）具有在衍射方向的至少一侧上具有固定或可变狭缝宽度的另外的狭缝（5）。 结果，确保从辐射源（1）发出的光束的强度波动下的参考辐射强度与测量辐射的强度呈线性比例变化，而在 测量光束。

公开(公告)号：EP0081868A1

公开(公告)日：1983-06-22

申请号：EP82201474.2

申请日：1982-11-19

Applicant: PHILIPS ELECTRONICS UK LIMITED ,  Philips Electronics N.V.

Inventor： Moss, Anthony R. L.

IPC: G01J3/04

CPC classification number: G01J3/04

Abstract: An adjustable slit plate assembly for a monochromator is formed by two identical metal plates (P1, P2) each having a set of slits (EX1 to EX6 and EN1 to EX6 respectively) with all the slits disposed on a common circle. The plates (P1, P2) are located and supported on a disc (SM) on a rotatable shaft (SH) at the axis (A) of the circle. The slits are each of minimum length to pass a radiant beam of given energy through the monochromator and each set of slits occupies an arc of substantially minimum length. The shape of each plate is substantially a sector of a further circle whose radius and arc are the minimum necessary to accommodate the slits and the axis. The complete configuration of the plates is formed by etching in a single operation, and a greater number of slit sets can be formed together from a plate of given area than for the prior art case in which the two sets of slits for a slit assembly are formed in a single plate in the shape of a complete disc. A significant cost reduction in the slit assembly is thus achieved.

公开(公告)号：EP3401656A1

公开(公告)日：2018-11-14

申请号：EP17170616.1

申请日：2017-05-11

Applicant: Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO

Inventor： VISSER, Huibert ,  VAN BRUG, Hedser

IPC: G01J3/02 ,  G02B27/00 ,  G02B17/08

CPC classification number: G02B27/0025 ,  G01J3/0208 ,  G01J3/04 ,  G02B17/086

Abstract: Correction optics (10) are disposed in an optical path directly behind an entry slit (1) of a spectrometer (100) and configured to warp a straight object line shape (A1) of the entry slit (1) into a curved object line shape (B1) from a point of view of the projection optics (2,3,4). The warping of the correction optics (10) is configured such that a curvature (R1) of the curved object line shape (B1) counteracts an otherwise distorting curvature (R5) in a projection (A5) of the straight object line shape (A1) by the projection optics (2,3,4) without the correction optics (10). As a result, the spectrally resolved image (B5) comprises a plurality of parallel straight projected line shapes formed by spectrally resolved projections of the straight object line shape (A1).

公开(公告)号：EP3104146A4

公开(公告)日：2017-10-18

申请号：EP15745980

申请日：2015-02-03

Applicant: HAMAMATSU PHOTONICS KK

Inventor： YOKINO TAKAFUMI ,  SHIBAYAMA KATSUMI

IPC: G01J3/02 ,  G01J3/18 ,  G01J3/36

CPC classification number: G01J3/021 ,  G01J3/0256 ,  G01J3/0262 ,  G01J3/0264 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/18

Abstract: A spectrometer 1A includes a light detection element 20 provided with a light passing part 21 and a light detection part 22, a support 30 fixed to the light detection element 20 such that a space S is formed between the light passing part 21 and the light detection part 22, a first reflection part 11 provided in the support 30 and configured to reflect light L1 passing through the light passing part 21 in the space S, a second reflection part 12 provided in the light detection element 20 and configured to reflect the light L1 reflected by the first reflection part 11 in the space S, and a dispersive part 40 provided in the support 30 and configured to disperse and reflect the light L1 reflected by the second reflection part 12 to the light detection part 22 in the space S.

公开(公告)号：EP3074754A4

公开(公告)日：2017-07-26

申请号：EP14861862

申请日：2014-11-10

Applicant: BECTON DICKINSON CO

Inventor： BORNHEIMER SCOTT ,  GOLDBERG EDWARD

IPC: G01N21/25 ,  G01J3/02 ,  G01J3/04 ,  G01J3/42 ,  G01N21/03 ,  G01N21/31 ,  G01N21/359 ,  G01N21/59 ,  G01N21/64 ,  G01N33/72 ,  G01N35/00

CPC classification number: G01N33/721 ,  G01J3/0208 ,  G01J3/04 ,  G01J3/42 ,  G01N21/31 ,  G01N21/359 ,  G01N21/6408 ,  G01N21/6428 ,  G01N21/6445 ,  G01N2021/0346 ,  G01N2021/6439 ,  G01N2021/6491 ,  G01N2201/062

Abstract: Aspects of the present disclosure include methods and systems for assaying a sample for an analyte. Methods according to certain embodiments include illuminating a sample with a slit-shaped beam of light, detecting light transmitted through the sample, determining absorbance of the transmitted light at one or more wavelengths and calculating concentration of the analyte based on the absorbance to assay the sample for the analyte. Systems for practicing the subject methods are also described.

Abstract translation: 本公开的方面包括用于分析样品以获得分析物的方法和系统。 根据某些实施方案的方法包括用狭缝状光束照射样品，检测透过样品的光，确定透射光在一个或多个波长处的吸光度，并基于吸光度计算分析物的浓度以测定样品 为分析物。 还描述了用于实践主题方法的系统。

公开(公告)号：EP3187844A1

公开(公告)日：2017-07-05

申请号：EP16460001.7

申请日：2016-01-14

Applicant: Instytut Optyki Stosowanej

Inventor： Wiklinski, Piotr ,  Kryszczynski, Tadeusz ,  Kozlowski, Tomasz ,  Ramsza, Andrzej

IPC: G01J3/04 ,  G01J3/18 ,  G01J3/36 ,  G01J3/443 ,  G01J3/02

CPC classification number: G01J3/04 ,  G01J3/0208 ,  G01J3/1804 ,  G01J3/36 ,  G01J3/443

Abstract: The spectrometer comprises an entrance slit (1), a collimator mirror (2), a diffraction grating (3), a focusing mirror (4), an exit slit (5), and two additional exit slits (6, 7) behind which there are separate photodetectors (8, 9). Both additional exit slits (6, 7) are located symmetrically in relation to the first exit slit (5) which constitutes the nominal slit of the monochromator.

Abstract translation: 该光谱仪包括入口狭缝（1），准直镜（2），衍射光栅（3），聚焦镜（4），出口狭缝（5）以及两个附加的出口狭缝（6,7） 有单独的光电探测器（8,9）。 两个附加的出口狭缝（6,7）相对于构成单色器的标称狭缝的第一出口狭缝（5）对称地定位。

公开(公告)号：EP1992936B1

公开(公告)日：2016-04-27

申请号：EP08008946.9

申请日：2008-05-14

Applicant: Hitachi High-Technologies Corporation

Inventor： Adachi, Sakuichiro

IPC: G01N21/25 ,  G01J3/02 ,  G01J3/04 ,  G01J3/36 ,  G01J3/42

CPC classification number: G01N21/253 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0229 ,  G01J3/0262 ,  G01J3/04 ,  G01J3/36 ,  G01J3/42 ,  G01N21/13 ,  G01N21/255 ,  G01N2021/0325 ,  G01N2021/115 ,  G01N2021/3155 ,  G01N2201/0415 ,  G01N2201/0446 ,  G01N2201/0453 ,  G01N2201/0618