Abstract:
An inspection apparatus may determine precise OV measurements of a target on a substrate using an optical pupil symmetrizer to reduce the inspection apparatus's sensitivity to asymmetry and non-uniformity of the illumination beam in the pupil plane. The inspection apparatus includes an illumination system that forms a symmetrical illumination pupil by (1) splitting an illumination beam into sub-beams, (2) directing the sub-beams along different optical branches, (3) inverting or rotating at least one of the sub-beams in two dimensions, and recombining the sub-beams along the illumination path to symmetrize the intensity distribution. The illumination system is further configured such that the first and second sub-beams have an optical path difference that is greater than a temporal coherence length of the at least one beam and less than a depth of focus in the pupil plane of the objective optical system.
Abstract:
In-line inspection and control system to in-situ monitor an extrudate during extrusion. A light beam illuminates a line on the outside circumference of the extrudate skin recording the curvature. A master profile of the illuminated defect-free skin is recorded and compared to successive monitoring of the illuminated skin. Differences from the comparison indicate skin and/or shape defects. A real-time feedback to automatically adjust process control hardware reduces or eliminates the skin and shape defects based on the monitoring and comparison.
Abstract:
An optical sensor is provided. The optical sensor has an emitting system including at least one light emitting device which emits light onto an object; and a detecting system detecting the light which has been emitted by the emitting system and which has propagated through the object. The light emitting device is capable of emitting a plurality of light beams with different wavelengths onto substantially the same position of the object.
Title translation:分析DER ZUSAMMENSETZUNG EINES气体ODER EINES EINEM CHEMISCHEN REAKTOR EIN VERFAHREN ZUR HERSTELLUNG VON CHRORSILANEN EINEM WIRBELSCHICHTREAKTOR
Abstract:
A system includes a computing device including a memory configured to store instructions. The computing device also includes a processor to execute the instructions to perform operations including initiating transmission of incident light from one or more light sources to a sealed bottle containing liquid. The operations also include receiving scattered light from the liquid contained in the sealed bottle. The operations also include processing one or more signals representative of the scattered light to detect interactions of the incident light with a particular molecule.
Abstract:
Method for determining the characteristics of a system for generating at least one pattern of light, the method comprising: a) providing a desired pattern of light, b) expressing the amplitude and the phase of the output pulse of the system as a function of the input laser pulse and in function of the characteristics of the system to obtain a calculated output pulse, the input laser pulse having a duration below or equal to 1 nanosecond, c) determining at least one characteristic of the system by minimizing a distance between the calculated output pulse and the desired output laser pulse.
Abstract:
The invention relates to a process and an apparatus for sorting reusable pieces of raw material (5), which are continuously moved in a conveying direction (2) by a transporting device (1), wherein an analysis of the chemical composition of the pieces of raw material (5) is performed with the aid of laser-induced plasma spectroscopy (LIBS) and, dependent on the composition determined, an automated sorting of the pieces of raw material (5) is carried out, wherein in a first step the pieces of raw material (5) are subjected to multiple first laser pulses (6), in order to remove surface coatings and/or contaminants from the pieces of raw material (5), and in a second step one or more second laser pulses (7) are directed onto the locations of the pieces of raw material (5) from which the surface coatings and/or contaminants have been removed, wherein exposed material of the pieces of raw material (5) is transformed into a plasma by the second laser pulses (7), wherein the same laser (3) is used for the first and second laser pulses (6, 7) and the area of the pieces of raw material (5) over which the first laser pulses (6) are moved and which are freed of surface coatings and/or contaminants is greater than the area of the pieces of raw material (5) that is exposed to the second laser pulses (7), wherein the focal diameter and the focal point of the laser beam are kept constant between the first and second laser pulses (6, 7). In this way, an unfalsified analysis of the composition of the pieces of raw material (5) can be achieved by using only one laser and, dependent on the analysis, a sorting can be performed.
Title translation:DETEKTIONSVORRICHTUNG,DETEKTIONSVERFAHREN MIT DIESER DETEKTIONSVORRICHTUNG UND IN DIESER DETEKTIONSVORRICHTUNG VERWENDETER DETEKTIONSCHIP
Abstract:
This detection device has a holder and a heating unit. The holder holds a detection chip that has the following: a prism that has an incidence surface and a film-formation surface; a metal film formed on said film-formation surface; trapping bodies laid out on the surface of said metal film; and a substrate that is laid out on the surface of the metal film, and together with the metal film, forms a liquid collection section in which a liquid is collected. The heating unit heats at least one of the substrate, the prism, and the metal film either while in contact therewith or without contacting same. Also, the heating unit is positioned so as to avoid the path that excitation light takes from an excitation-light emission unit to the abovementioned incidence surface.