RAILROAD TRACK SURVEY SYSTEM
    41.
    发明公开
    RAILROAD TRACK SURVEY SYSTEM 审中-公开
    EISENBAHNSCHIENENVERMESSUNGSSYSTEM

    公开(公告)号:EP3138753A1

    公开(公告)日:2017-03-08

    申请号:EP16183465.0

    申请日:2016-08-09

    Inventor: Singh,, Sameer

    Abstract: This invention concerns a railroad track inspection system having a common support structure to which is attached a plurality of track scanning sensors, a data store for storing track scan data recorded by the track scanning sensors, and a scan data processor for automatic analysis of said track scan data upon receipt thereof to detect one or more track components within the scan data. Components are detected from a predetermined list of component types according to one or more features identified in said scan data. The track scanning sensors, the data store and scan data processor are attached to the common support structure so the system can be mounted as a singular assembly to the exterior of railway vehicle for use. The inspection system may be provided in a single housing for mounting to a conventional passenger/freight rail vehicles and may operate automatically in an unattended mode to record and process the data and report on track status to allow manual inspection, repair and/or maintenance of the track. The location of track components and/or defects may be logged. The system may comprise a lateral actuation system for moving the track scanning sensors according to the relative track position.

    Abstract translation: 本发明涉及一种具有共同的支撑结构的铁路轨道检查系统,附加有多个轨道扫描传感器,用于存储由轨道扫描传感器记录的轨道扫描数据的数据存储器和用于自动分析所述轨道的扫描数据处理器 在接收到扫描数据时扫描数据以检测扫描数据内的一个或多个轨迹分量。 根据在所述扫描数据中标识的一个或多个特征从组件类型的预定列表中检测组件。 轨道扫描传感器,数据存储和扫描数据处理器连接到公共支撑结构,因此系统可以作为单一组件安装到铁路车辆的外部使用。 检查系统可以设置在单个外壳中,用于安装到常规乘客/货运轨道车辆,并且可以以无人值守的方式自动操作以记录和处理数据并报告轨道状态,以允许手动检查,修理和/或维护 轨道。 跟踪组件和/或缺陷的位置可能被记录。 该系统可以包括用于根据相对轨道位置移动轨道扫描传感器的侧向致动系统。

    WELDED STATE MONITORING SYSTEM AND WELDED STATE MONITORING METHOD
    42.
    发明公开
    WELDED STATE MONITORING SYSTEM AND WELDED STATE MONITORING METHOD 审中-公开
    SCHWEISSZUSTANDSÜBERWACHUNGSSYSTEMUNDSCHWEISSZUSTANDSÜBERWACHUNGSVERFAHREN

    公开(公告)号:EP3127646A1

    公开(公告)日:2017-02-08

    申请号:EP15772548.2

    申请日:2015-03-27

    Abstract: A welded state monitoring system according to an aspect of the present invention is a welded state monitoring system used for plasma shielded electric resistance welding in which electric resistance welding is performed while irradiating a weld zone of a steel sheet with plasma, and is provided with a plasma irradiation device which irradiates the weld zone with plasma, a first image capturing device which captures an image of the weld zone from above and has an image sensor capable of detecting light having a wavelength of 850 nm or more, a first wavelength region limiting device which limits light incident on the first image capturing device to a wavelength region of 850 nm or more, and an image processing device which subjects the image captured by the first image capturing device to image processing and analyzes the welded state of the weld zone thereby being able to analyze the welded state without being affected by the plasma.

    Abstract translation: 根据本发明的一个方面的焊接状态监测系统是用于等离子体屏蔽电阻焊接的焊接状态监控系统,其中在等离子体照射钢板的焊接区域的同时进行电阻焊接,并且设置有 等离子体照射焊接区域的等离子体照射装置,从上方捕获焊接区域的图像并具有能够检测波长为850nm以上的光的图像传感器的第一图像捕获装置,第一波长区域限制装置 其将入射在第一图像拍摄装置上的光限制在850nm以上的波长区域;以及图像处理装置,其对由第一图像拍摄装置拍摄的图像进行图像处理,并分析焊接区域的焊接状态, 能够分析焊接状态而不受等离子体的影响。

    HOCHAUFLÖSENDE FLUORESZENZ-MIKROSKOPIE MIT EINEM STRUKTURIERTEN ANREGUNGSSTRAHL
    43.
    发明公开
    HOCHAUFLÖSENDE FLUORESZENZ-MIKROSKOPIE MIT EINEM STRUKTURIERTEN ANREGUNGSSTRAHL 审中-公开
    霍华德·芬奇·米克罗维奇·麻省理工学院埃里克·史密斯顿·安格格斯

    公开(公告)号:EP3087372A1

    公开(公告)日:2016-11-02

    申请号:EP14816202.7

    申请日:2014-12-12

    Inventor: HELL, Stefan W.

    Abstract: In order to determine the location (X
    M ) of individual molecules of a substance in a sample, wherein the individual molecules of the substance are in a fluorescent state in which they are excitable with excitation light for emission of fluorescent light, and wherein distances between the individual molecules of the substance in a region of interest in the sample comply with a minimum value d = λ/(2nsinα √(1 + l/ls)), the individual molecules of the substance are excited with the excitation light for emission of fluorescent light, wherein an intensity distribution of the excitation light has at least one zero. The fluorescent light from the excited individual molecules of the substance is registered for different positions (X
    N ) of the at least one zero of the intensity distribution of the excitation light in the region of interest in the sample. In this case, distances between closest adjacent positions (X
    N ) of the at least one zero of the intensity distribution of the excitation light in which the fluorescent light from the excited individual molecules of the substance is registered are not greater than half the minimum value d. The locations (X
    M ) of the individual molecules of the substance are then derived from the profile of the intensity (I) of the fluorescent light from the respective molecule against the positions (X
    N ) of the at least one zero of the intensity distribution of the excitation light in the region of interest in the sample.

    Abstract translation: 为了确定样品中单个荧光分子的位置,其保持相对于彼此的最小距离,单个分子被激发以通过激发光发射荧光。 荧光被记录在激发光的强度分布的零点的不同位置。 这些位置之间的距离至少是荧光分子最小距离的一半。 荧光分子的位置来源于激发光的零点位置上的荧光强度的过程。

    Inspection apparatus and inspection method
    47.
    发明公开
    Inspection apparatus and inspection method 审中-公开
    PrüfvorrichtungundPrüfverfahren

    公开(公告)号:EP2840382A1

    公开(公告)日:2015-02-25

    申请号:EP14181337.8

    申请日:2014-08-19

    CPC classification number: G01N21/6489 G01N21/6456 G01N2021/6417 G01N2201/10

    Abstract: An inspection apparatus 100 is an apparatus for inspecting a solar cell panel 90. The inspection apparatus 100 includes: an excitation light irradiation part 12 for irradiating the solar cell panel 90 with pulsed light LP11 for causing the solar cell panel 90 to radiate an electromagnetic wave pulse LT1; a detection part 13 for detecting the electromagnetic wave pulse LT1 radiated from the solar cell panel 90 in response to irradiation with the pulsed light LP11; and a temperature changing part 31 for changing a temperature of the solar cell panel 90 at a part irradiated with the pulsed light LP11.

    Abstract translation: 检查装置100是用于检查太阳能电池面板90的装置。检查装置100包括:激发光照射部12,用于对太阳能电池面板90照射脉冲光LP11,使太阳能电池面板90照射电磁波 脉冲LT1; 用于响应于脉冲光LP11的照射而检测从太阳能电池面板90辐射的电磁波脉冲LT1的检测部分13; 以及温度变化部31,用于在照射脉冲光LP11的部分改变太阳能电池面板90的温度。

    OPTICAL UNIT, FLUORESCENCE DETECTION DEVICE, AND FLUORESCENCE DETECTION METHOD
    48.
    发明公开
    OPTICAL UNIT, FLUORESCENCE DETECTION DEVICE, AND FLUORESCENCE DETECTION METHOD 有权
    OPTISCHE EINHEIT,FLUORESZENZDETEKTOR UND FLUORESZENZDETEKTIONSVERFAHREN

    公开(公告)号:EP2829901A1

    公开(公告)日:2015-01-28

    申请号:EP13763578.5

    申请日:2013-02-20

    Inventor: WATANABE, Yukio

    Abstract: Even when the distance from an objective lens to a sample differs, the distribution of light from the sample can be detected accurately.
    A first lens 23 for converting light from the objective lens into parallel light is composed of a concave lens part 32 having a concave curved face 32c in a center portion of a flat face 32a, and a convex lens part 33 having a convex curved face 33c around a flat face 33b. Further, the first lens 23 includes first and second regions for diverging light through the flat face 33b and the concave curved face 32c and a third region for collecting light through the convex curved face 33c and the concave curved face 32c. When the sample is placed on a sample table while being sealed in a two-dimensional electrophoresis substrate, light totally reflected by a side surface of the objective lens is caused to enter the second region. In contrast, when the sample is directly placed on the sample table, the light is caused to enter the third region. As a result, in any of the cases, the rays of light d emitted from the first lens 23 are nearly parallel to one another, and are nearly parallel to the optical axis.

    Abstract translation: 即使从物镜到样本的距离不同,也可以准确地检测来自样品的光的分布。 用于将来自物镜的光转换成平行光的第一透镜23由在平坦面32a的中心部分具有凹曲面32c的凹透镜部32和具有凸曲面33c的凸透镜部33 围绕平面33b。 此外,第一透镜23包括用于使光通过平面33b和凹曲面32c发散的第一和第二区域,以及用于通过凸曲面33c和凹曲面32c收集光的第三区域。 当样品被放置在样品台上同时密封在二维电泳基片中时,由物镜的侧面全反射的光进入第二区域。 相反,当将样品直接放置在样品台上时,使光进入第三区域。 结果,在任何情况下,从第一透镜23发射的光线d几乎彼此平行,并且几乎平行于光轴。

    FORENSIC SPECTRAL MICROSCOPE
    50.
    发明公开
    FORENSIC SPECTRAL MICROSCOPE 审中-公开
    法医光谱显微镜

    公开(公告)号:EP1810006A1

    公开(公告)日:2007-07-25

    申请号:EP05810637.8

    申请日:2005-11-11

    Applicant: SMCS Limited

    Abstract: There is disclosed a colour assessment apparatus comprising a sample carrier, magnifying optics to capture light from defined locations of a sample located on the sample carrier, means for analyzing the light captured by the magnifying optics to measuring colour values of the defined locations of the sample, means for automatically displacing the optical means relative to the sample carrier in order to the apparatus to scan a succession of locations of the sample and to measure colour values of the sample for each location, memory means for storing a table of location information correlated with colour value information, means for inputting a colour value of a reference sample, and means for analyzing the table so as to determine locations of any colour values from the sample that match the colour value of the reference sample.

    Abstract translation: 公开了一种颜色评估设备,其包括样本载体,放大光学器件以从位于样本载体上的样本的限定位置捕获光,用于分析由放大光学器件捕获的光以测量样本的限定位置的颜色值的装置 ,用于使所述光学装置相对于所述样本载体自动移位的装置,以便所述装置扫描所述样本的一系列位置并且为每个位置测量所述样本的颜色值;存储装置,用于存储与所述样本相关的位置信息的表格 颜色值信息,用于输入参考样本的颜色值的装置以及用于分析该表格以便确定来自样本的与参考样本的颜色值匹配的任何颜色值的位置的装置。

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