摘要:
The invention relates to an lighting device comprising a beam multiplication device (1) which divides a coherent beam (18) into a plurality of partial beams (20, 21) and combines said partial beams to form a bundle of rays (26) once they have followed paths having different optical lengths, the partial beams (27, 28, 29, 30) diverging in said bundle of rays. Said lighting device also comprises a micro-optical system (3) which is arranged downstream from the beam multiplication device (1) and comprises a plurality of optical elements (19) arranged in a grid-type manner. Said bundle of rays (26) hits the micro-optical system (3), and the partial beams (27, 28, 29, 30) of the bundle of rays (26) thus hit each optical element (19) at different angles, in such a way that a plurality of illumination partial beams (M1, M2, M3, M4) irradiate from each optical element (19) in different diffusion directions and can be used to illuminate an object field (31).
摘要:
A microscope lens arrangement consisting of a microscope lens (1) which can be placed in a working position in such a way that a sample (7) arranged in the field of view of said microscope lens (1) can be detected . A video camera (12; 22; 25; 32) which is coupled to the microscope lens (1) is provided. Said video camera can detect at least one part of the field of view without the aid of the lens when the microscope lens (1) is in a working position.
摘要:
The invention relates to a microscope lens (1) comprising a housing (2) that can be connected to a lens holder of a microscope and that has a light admission opening (6) and comprising an optics system (8) that is located in the housing (2). Said lens is provided with an image recording element (19). According to the invention, incident light is guided via the light admission opening (6) onto the image recording element (9) by means of the optics system (8) and is not coupled into the optical path of the microscope, located below the microscope lens.
摘要:
Es wird eine Beleuchtungsvorrichtung mit einem einen Stufenspiegel (2, 3, 20) aufweisenden Kohärenzminderer (1), der mittels des Stufenspiegels (2, 3, 20) einem zugeführten Strahlenbündel (11) unterschiedliche Phasenverschiebungen in Abhängigkeit von der Position im Strahlquerschnitt einprägt und als Beleuchtungsstrahlenbündel abgibt, und mit einer dem Kohärenzminderer (1) nachgeordneten Beleuchtungsoptik (4), die das Beleuehtungsstrahlenbündel zur Beleuchtung eines Objektfeldes (O) abbildet, bereitgestellt, wobei die einzelnen reflektiven Flächen (5, 6, 7, 8, 9; 21, 22, 23, 24, 25, 26, 27) des Stufenspiegels (2, 3, 20) gekrümmt ausgebildet sind.
摘要:
Es wird beschrieben ein Kohärenzminderer, der mindestens ein doppelbrechendes Element (2) aufweist, welches ein zugeführtes, kohärentes Strahlbündel (10) in mehrere in senkrecht zueinander liegenden Polarisationsrichtungen polarisierte Teilstrahlbündel so aufteilt, daß die Teilstrahlbündel zueinander in Strahlrichtung und/oder quer zur Strahlrichtung versetzt sind und/oder in unterschiedliche Richtungen propagieren, wobei, daß das doppelbrechende Element (2) einen Stapel (6, 7) aus doppelbrechenden Platten (6a-e, 7a-e) aufweist, wobei die Platten (6, 7) optisch unterschiedlich lang sind und jeweils nur von einem der Teilstrahlbündel durchsetzt sind.
摘要:
There is provided an imaging device comprising an autofocus device (1) and an imaging lens system (9) with a first focal plane (20), an object stage (11) for holding an object (3), a first movement module (30) for the relative movement of object stage (11) and imaging lens system (9), wherein the autofocus device (1) comprises an image-recording module (9) with a second focal plane the position of which relative to the first focal plane is known, a second movement module (30) for the relative movement of object stage (11) and image-recording module (9), a focus module for producing a two-dimensional, intensity-modulated focussing image (19) in a focus module plane which intersects the second focal plane (20) and a control module (24) which controls the image-recording module (9), which then records a first two-dimensional image of the object (3) together with the focussing image (19) during a predetermined first exposure time, and wherein the control module (24), using the first two-dimensional image recorded by means of the image-recording module (9) and taking into account the relative position of the first and second focal plane (20), evaluates the required change in distance between the object stage (11) and the imaging lens system (9) and controls the first movement module (30) such that the evaluated change in distance is carried out for focussing the imaging device, wherein, the control module controls the second movement module such that, during the first exposure time for recording the first two-dimensional image, the object stage is moved relative to the image-recording module in a plane parallel to the second focal plane, and the imaging device, after carrying out the evaluated change in distance, records a second two-dimensional image of the object (3) by means of the imaging lens system (9), wherein the object stage (11) and/or the object (3) is not moved relative to the imaging lens system (9) in a plane parallel to the first focal plane during a second exposure time for recording the second two-dimensional image.
摘要:
The present invention relates to a method for processing an object with miniaturized structures, having the steps of : feeding a reaction gas onto a surface of the object; processing the object by directing an energetic beam onto a processing site in a region, which is to be processed, on the surface of the object, in order to deposit material on the object or to remove material from the object, detecting interaction products of the beam with the object, and deciding whether the processing of the object must be continued or can be terminated with the aid of information which is obtained from the detected interaction products of the beam with the object, the region to be processed being subdivided into a number of surface segments, and the interaction products detected upon the beam striking regions of the same surface segment being integrated to form a total signal in order to determine whether processing of the object must be continued or can be terminated.
摘要:
The invention relates to a method for electron beam induced etching of a material (100, 200). Said method consists of the following steps: at least one etching gas is provided on one area of the material (100, 200) on which an electron beam strikes said material (100, 200) and at least one passivation gas that is used to slow down or prevent spontaneous etching by the at least one etching gas is provided.