摘要:
A method and apparatus for locally raising the temperature of a material to facilitate chemical reactions or processes related to growth or removal of the material, utilizes an electrode to apply, in the presence of a growth or removal medium, a controlled succession of thermal spikes or shockwaves (6) of varying energy, on the scale of a few nanometers to several hundred micrometers. The duration of the thermal spikes or shockwaves ranges from a few picoseconds to several hundred nanoseconds. The medium may be a cryogenic liquid. Other growth media, including liquids, solids, gases in critical or non-critical state, and mixtures of liquids/solids, solids/gases, and liquids/gases, may also be employed. The electrode may be an electrode emitter tip (1) with an anode (2) above workpiece (4) on platform (3) in the medium. Circuit (5) includes power source (7) with switch (8) controlling voltage pulse duration applied across tip and anode to produce shockwaves.
摘要:
Nanostructure manufacturing methods and methods for assembling nanostructures into functional elements, such as junctions (850), arrays (830), and devices (800) are provided. Systems for practicing the methods are also provided.
摘要:
The present invention includes a method of fabricating organic/inorganic composite nanostructures on a substrate comprising depositing a solution having a block copolymer and an inorganic precursor on the substrate using dip pen nanolithography. The nanostructures comprises arrays of lines and/or dots having widths/diameters less than 1 micron. The present invention also includes a device comprising an organic/inorganic composite nanoscale region, wherein the nanoscale region has a nanometer scale dimension other than height.
摘要:
An atomic force microscope (AFM) having a tip coated with hydrophobic compounds, which is performed as dip pen nanolithography (DPN), for transporting molecules from the atomic force microscope tip (AFM) to a gold substrate (AU) to write patterns on the gold substrate (AU).
摘要:
Disclosed is a method for efficient material application onto substrates or removal therefrom, whereby a scanning probe microscope working under atmospheric pressure is used. According to the inventive method, the substrate is placed in a vessel, which is located on the x-y support of a scanning probe microscope (SXM) and filled with a liquid or gas medium up to a level where the top face of the substrate is covered with a thin layer consisting of at least one monolayer of said medium. In order to cause the medium to produce a structured deposit, or to attack the substrate surface in a structured manner, the microtip of the scanning probe microscope is then dipped into the layer while electric voltage or voltage pulses are applied. The inventive method can be used to apply material onto substrates or remove it therefrom. It can also be used to characterize the geometry of microtips, renew or produce microtips for SXM consoles and to record, read out and erase information.
摘要:
A micro-probe that has little deformation and wear while maintaining a desired conductivity is composed of a cylindrical wear resistant material and a conductive material. The wear resistant material provides mechanical contact with a contact target, while the conductive material provides an electrical contact with the contact target. The invention thus provides an ultra-small micro-probe having a long useful life, and that experiences little deformation or wear while maintaining the desired conductivity.
摘要:
Nanometre scale particles (3) are deposited on a substrate (1,2) that provides receptor sites of a first polarity on its surface. The particles are provided with a surface charge of a second opposite polarity such that they are attracted to the receptor sites on the substrate and adhere to it at locations that are spaced apart as a result of an electrostatic repulsion force between adjacent particles. As a result, a monolayer of particles is formed with even spacing, for use in quantum electronic devices.
摘要:
A novel carbon material is obtained by bending at least one carbon atom layer of graphite in at least one selected region along either, or both, of lines I and II in Fig. 1. The bending can be accomplished by scanningly picking the carbon atom layer(s) with a probe of an atomic force microscope or another scanning microscope. The obtained carbon material has at least one round bend having a width of 0.1-10 nm and at least one flap region having a triangular, rectangular or still differently polygonal shape in plan view. When the carbon atom layer(s) is bent with very small radii of curvature, a finely striped ridge-and-groove structure appears in the round bend. The physical properties of the obtained carbon material are uniquely determined by the direction(s) of bending, width of each bend, shape and size of each flap region and the stripe pitch of the ridge-and-groove structure.