MEASURING SPECULAR REFLECTANCE OF A SAMPLE
    1.
    发明公开
    MEASURING SPECULAR REFLECTANCE OF A SAMPLE 审中-公开
    测量样品的缓解

    公开(公告)号:EP1373866A4

    公开(公告)日:2009-08-12

    申请号:EP02712621

    申请日:2002-03-28

    申请人: VARIAN AUSTRALIA

    IPC分类号: G01N21/55

    CPC分类号: G01N21/55

    摘要: Apparatus ( 10 ) for measuring absolute specular reflectance of a surface of a sample ( 22 ) includes a sample holder ( 12 ), a light source ( 18 ) for transmitting an incident light beam ( 16 ) onto a surface of the sample ( 22 ) and a detector ( 26 ) for detecting a specularly reflected component of the incident light. The light source ( 18 ), sample holder ( 12 ) and detector ( 26 ) are mounted and operatively associate ( 14, 24, 28 ) to be relatively moveable to vary the angle of incidence of light ( 16 ) onto sample ( 22 ) and to correspondingly automatically vary the relative position of the detector ( 26 ) such that the angle of reflection equals the angle of incidence. In the absence of the sample ( 22 ) or upon removal of the sample holder ( 12 ), light ( 16 ) impinges directly onto detector ( 26 ) to directly allow measurement of the absolute intensity of the light beam ( 16 ) as a reference measurement. This avoids the need to use intervening optical components such as mirrors which may degrade over time. It also allows provision of a relatively simplified apparatus.

    PLASMA TORCH
    2.
    发明公开
    PLASMA TORCH 有权
    等离子体炬

    公开(公告)号:EP1402762A4

    公开(公告)日:2009-07-01

    申请号:EP02712622

    申请日:2002-03-28

    申请人: VARIAN AUSTRALIA

    CPC分类号: H01J49/105 G01N21/73 H05H1/30

    摘要: A torch for producing an inductively coupled or microwave induced plasma for use in spectrochemical analysis. The torch includes a central tube (25) for conveying a flow of a gas carrying sample aerosol to a plasma (17) produced in the torch. The tube (25) has an inlet (31) and an outlet (39) of smaller size than the inlet and is shaped to deliver a substantially laminar flow of the gas at the outlet (39). The tube (25) is tapered along at least a substantial portion of its length such that its cross-sectional area gradually and smoothly reduces towards its outlet (39) along at least a substantial portion of its length. It has been found that such a tapered tube is resistant to obstruction by salts deposited from samples containg high levels of dissolved solids.

    A PLASMA MASS SPECTROMETER
    3.
    发明公开
    A PLASMA MASS SPECTROMETER 有权
    PLASMAMASSENSPEKTROMETER

    公开(公告)号:EP1483775A4

    公开(公告)日:2007-10-17

    申请号:EP03702209

    申请日:2003-02-27

    申请人: VARIAN AUSTRALIA

    CPC分类号: H01J49/067 H01J49/105

    摘要: A plasma source mass spectrometer (20) having an ion beam extraction electrode (45) associated with a skimmer cone (40) to restrict the pumping of gas from a region (60) immediately behind the skimmer cone orifice (42) to provide a higher pressure (e.g. 1-10-2 Torr) in the region (60) compared to the pressure downstream of the electrode (45) (e.g. 10-3-10-4 Torr). This provides a collisional gas volume (60) for plasma (28) for attenuating polyatomic and multicharged interfering ions prior to extraction of an ion beam (49). In one embodiment a substance (e.g. hydrogen) can be supplied into the region (60) to assist attenuation of polyatomic and multicharged interfering ions by reactive or collisional interactions.

    摘要翻译: 一种等离子体源质谱仪(20),其具有与撇渣器锥体(40)相关联的离子束引出电极(45),以限制从紧挨着分离器锥形孔口(42)的后面的区域(60)泵送气体以提供较高的 与电极(45)下游的压力相比,区域(60)中的压力(例如,1-10psi,Torr)(例如10 -3 -3V) > -4乇)。 这提供了用于在提取离子束(49)之前衰减多原子和多电荷干扰离子的等离子体(28)的碰撞气体体积(60)。 在一个实施方案中,物质(例如氢)可被供应到区域(60)中,以通过反应性或碰撞相互作用来辅助多原子和多电荷干扰离子的衰减。

    MASS SPECTROMETRY APPARATUS AND METHOD
    6.
    发明公开
    MASS SPECTROMETRY APPARATUS AND METHOD 有权
    MASSENSPEKTROMETRIEVORRICHTUNG

    公开(公告)号:EP1535306A1

    公开(公告)日:2005-06-01

    申请号:EP03739869.0

    申请日:2003-07-29

    IPC分类号: H01J49/26

    CPC分类号: H01J49/105 H01J49/067

    摘要: A mass spectrometer in which a substance is introduced into a plasma (28) which contains analyte ions as the plasma (28) is passing through an aperture (42), for example in a skimmer cone (40) between two vacuum regions (38) and (44) so that the substance interacts with the plasma (28) thereby reducing the concentration of interfering polyatomic or multicharged ions in the plasma by reactive or collisional interactions. The substance may be supplied via passage (60) having an outlet (63) in skimmer cone (40). The invention gives improved attenuation of interfering ions because the substance is supplied directly into the plasma (28) as it is substantially radially confined by aperture (42) and before an ion beam (58) is extracted. Alternatively or additionally a substance may be supplied directly into the plasma within aperture (36) in sampling cone (34).

    UV-VIS SPECTROPHOTOMETRY
    7.
    发明公开
    UV-VIS SPECTROPHOTOMETRY 审中-公开
    UV-UND SICHTBARE SPEKTROPHOTOMETRIE

    公开(公告)号:EP1137917A4

    公开(公告)日:2005-04-13

    申请号:EP99959145

    申请日:1999-12-02

    申请人: VARIAN AUSTRALIA

    CPC分类号: G01J3/28 G01J3/04 G01J3/10

    摘要: An ultraviolet/visible/infrared spectrophotometer, with a pulsed light source (10), has a monochromator with variable slit width to provide variable spectral resolution. The dynamic range at the detectors (24, 28) is reduced by varying the pulse energy emitted by the light source (10) in accordance with the wavelength and slit width settings (34, 36), and/or by varying the slit height in accordance with the slit width. The ligth source (10) may be a xenon flash lamp.

    摘要翻译: 具有脉冲光源(10)的紫外/可见/红外分光光度计具有可变狭缝宽度的单色仪,以提供可变的光谱分辨率。 通过根据波长和狭缝宽度设置(34,36)改变由光源(10)发射的脉冲能量和/或通过改变光源(10)中的狭缝高度来减小检测器(24,28)处的动态范围 根据狭缝宽度。 光源(10)可以是氙闪光灯。

    MASS SPECTROMETER INCLUDING A QUADRUPOLE MASS ANALYSER ARRANGEMENT
    8.
    发明公开
    MASS SPECTROMETER INCLUDING A QUADRUPOLE MASS ANALYSER ARRANGEMENT 有权
    质谱仪,四极杆质谱

    公开(公告)号:EP1247289A4

    公开(公告)日:2003-01-29

    申请号:EP01962455

    申请日:2001-08-17

    申请人: VARIAN AUSTRALIA

    摘要: A mass spectrometer (10) having an ion optics system (32, 34, 36, 40, 42) in a first vacuum chamber (28) which diverts ions travelling in a first direction from a source (12, 16, 24) through an angle such that neutral particles and photons from the source continue in the first direction and are removed. The diverted ion beam (38) is then directed into a quadrupole mass analyser arrangement (52) in a second vacuum chamber (48) which comprises a configured, for example curved, set of fringe electrodes (56) followed by a linear mass analyser (54) and then an ion detector (46). The configured fringe electrodes (56) again divert the ions prior to their passage into the linear quadrupole mass analyser (54) whereby additional neutral particles possibly created by passage of the ion beam through residual gas in the vacuum chambers (28, 48) are shielded from entering the linear mass analyser (54). The use of the configured set of fringe electrodes (56) in front of the linear mass analyser (54) has been found to substantially reduce background count rates, particularly for detection of isotypes of low atomic masses.

    MASS SPECTROMETER INCLUDING A QUADRUPOLE MASS ANALYSER ARRANGEMENT
    9.
    发明公开
    MASS SPECTROMETER INCLUDING A QUADRUPOLE MASS ANALYSER ARRANGEMENT 有权
    质谱仪四极杆质谱

    公开(公告)号:EP1247289A1

    公开(公告)日:2002-10-09

    申请号:EP01962455.0

    申请日:2001-08-17

    IPC分类号: H01J49/42

    摘要: A mass spectrometer (10) having an ion optics system (32, 34, 36, 40, 42) in a first vacuum chamber (28) which diverts ions travelling in a first direction from a source (12, 16, 24) through an angle such that neutral particles and photons from the source continue in the first direction and are removed. The diverted ion beam (38) is then directed into a quadrupole mass analyser arrangement (52) in a second vacuum chamber (48) which comprises a configured, for example curved, set of fringe electrodes (56) followed by a linear mass analyser (54) and then an ion detector (46). The configured fringe electrodes (56) again divert the ions prior to their passage into the linear quadrupole mass analyser (54) whereby additional neutral particles possibly created by passage of the ion beam through residual gas in the vacuum chambers (28, 48) are shielded from entering the linear mass analyser (54). The use of the configured set of fringe electrodes (56) in front of the linear mass analyser (54) has been found to substantially reduce background count rates, particularly for detection of isotypes of low atomic masses.

    IMPROVED SPECTROPHOTOMETER
    10.
    发明公开
    IMPROVED SPECTROPHOTOMETER 失效
    改进分光光度计

    公开(公告)号:EP0866961A4

    公开(公告)日:2001-08-01

    申请号:EP97938690

    申请日:1997-09-16

    申请人: VARIAN AUSTRALIA

    CPC分类号: G01J3/42

    摘要: A spectrophotometer including a light source (1) operative to emit a beam of light (15), an optical system for directing the light beam (15) to a sample (8) to be analysed, and a detector (9) which detects the intensity of the light beam after that beam interacrs with the sample (8). The light source (1) is operative to emit bursts of light separated by an interval during which no light is emitted. By way of example, a xenon tube may be used for that purpose. The spectrophotometer measures the intensity of the light beam generated by each burst of light after that beam interacts with the sample. Each such light beam may be divided into first and second parts (5 and 4) prior to interaction with the sample (8), and the optical system is arranged to direct the first part (5) to the sample (8) and to direct the second part (4) to a second detector (7) for conducting a reference measurement. A dark signal measurement may be conducted immediately before or after each burst of light.