ANISOTROPIC CONDUCTIVE CONNECTOR AND CIRCUIT-DEVICE ELECTRICAL-INSPECTION DEVICE
    1.
    发明公开
    ANISOTROPIC CONDUCTIVE CONNECTOR AND CIRCUIT-DEVICE ELECTRICAL-INSPECTION DEVICE 审中-公开
    各向异性导电连接器和电路元件电气研究SETUP

    公开(公告)号:EP1615297A4

    公开(公告)日:2007-11-28

    申请号:EP04725789

    申请日:2004-04-05

    Applicant: JSR CORP

    Abstract: An anisotropic conductive connector that enables a predetermined electrical inspection on a circuit device whose clock frequency is, for example, more than 1 GHz, and a circuit-device electrical-inspection device having the anisotropic conductive connector are provided. The anisotropic conductive connector is equipped with an elastic anisotropic-conductive film. The film includes a plurality of connecting conductive parts disposed in accordance with the pattern corresponding to an electrode to be connected to the pattern and extending toward the direction of the thickness, and insulating parts for insulating the connecting conductive parts from each other. The anisotropic conductive connector is characterized in that within the elastic, anisotropic-conductive film, a conductive part for high-frequency shielding extends toward the direction of thickness. The circuit-device electrical-inspection device is characterized by comprising such an anisotropic conductive connector.

    ANISOTROPIC CONDUCTIVE SHEET, ITS MANUFACTURING METHOD, AND ITS APPLICATION
    2.
    发明公开
    ANISOTROPIC CONDUCTIVE SHEET, ITS MANUFACTURING METHOD, AND ITS APPLICATION 审中-公开
    各向异性导电片,制造方法及其应用

    公开(公告)号:EP1548884A4

    公开(公告)日:2007-05-09

    申请号:EP03791285

    申请日:2003-08-26

    Applicant: JSR CORP

    Abstract: An anisotropic conductive sheet not contaminating an object to be connected, not adhering to the object even if the sheet pressed by the object is left for a long time in a high-temperature environment, and preventing the sheet from being charged or suppressing the charging, and eliminating adverse influence of static electricity, its manufacturing method, and its application are disclosed. The anisotropic conductive sheet (10) comprises an anisotropic conductive sheet body (11) made of an elastic polymer material, having conductive portions (12) extending in the direction of thickness and insulating portions (13) insulating the conductive portions (12) from one another and a DLC film (15) provided on one or both sides of the anisotropic conductive sheet body (11) and so integrally formed as to cover at least the insulating portions.

    SHEET-LIKE PROBE, PROCESS FOR PRODUCING THE SAME AND ITS APPLICATION
    6.
    发明公开
    SHEET-LIKE PROBE, PROCESS FOR PRODUCING THE SAME AND ITS APPLICATION 有权
    伊斯坦布尔的“魔兽世界”,“ZH IHRER HERSTELLUNG”,“IHRER ANWENDUNG”

    公开(公告)号:EP1624309A4

    公开(公告)日:2006-05-31

    申请号:EP04732418

    申请日:2004-05-12

    Applicant: JSR CORP

    CPC classification number: G01R1/0735 G01R3/00

    Abstract: A sheet-like probe in which positional deviation between an electrode structure and an electrode under test due to temperature variation can be prevented surely in burn-in test even when a large area wafer having a diameter of 8 inch or larger or a circuit device where the electrode under test has an extremely small pitch is inspected, and thereby good electrical connection can be sustained stably. Its production process and application are also provided. In the sheet-like probe, a plurality of electrode structures, having surface electrode parts exposed to the surface and rear surface electrode parts exposed to the rear surface while being arranged according to a pattern corresponding to the electrodes being connected, comprise a contact film held by an insulating film of soft resin and a frame plate supporting that contact film.

    Abstract translation: 本文公开了一种片状探针,即使当检查对象是8英寸以上的大面积的晶片时,能够防止在老化试验中的温度变化来检查电极结构和电极之间的位置偏移的片状探针 直径或电路器件,其检查的电极的间距极小,因此能够稳定地保持良好的电连接状态及其制造方法和应用。 本发明的片状探针包括通过保持根据与要连接的各个电极相对应的图案布置的多个电极结构而获得的接触膜,并且具有暴露于前表面和背面的前表面电极部分 通过由柔性树脂构成的绝缘膜暴露于背面的表面电极部分和支撑接触膜的框架板。

    ANISOTROPIC CONDUCTIVITY CONNECTOR, PROBE MEMBER, WAFER INSPECTING DEVICE, AND WAFER INSPECTING METHOD
    9.
    发明公开
    ANISOTROPIC CONDUCTIVITY CONNECTOR, PROBE MEMBER, WAFER INSPECTING DEVICE, AND WAFER INSPECTING METHOD 有权
    各向异性导电连接器,探头件,晶圆检测设备和晶圆INVESTIGATIONS

    公开(公告)号:EP1553623A4

    公开(公告)日:2006-05-24

    申请号:EP03784570

    申请日:2003-08-07

    Applicant: JSR CORP

    Abstract: An anisotropic conductivity connector wherein the favorable conductivity can be maintained for a long term even if the connector is used repetitively many times or even if the connector is used repetitively in a high-temperature environment. The anisotropic conductivity connector comprises elastic anisotropic conductive films having connection conductive sections extending in the direction of thickness. Each elastic anisotropic conductive film has an initial characteristic such that, letting the electric resistance of the connection conductive sections measured when a load Yx1g is exerted on the elastic anisotropic conductive film in the thickness direction where Y is a total number of connection conductive films be R1g, and letting the electric resistance of the connection conductive sections measured when a load Yx6g is exerted on the elastic anisotropic conductive film in the thickness direction be R6g, the number of connection conductive sections having the electric resistance R1g of below 1ohm is 90% or more of the total number of connection conductive sections, the number of connection conductive sections having the electric resistance R6g of below 0.1ohm is 95% or more of the total number of connection conductive sections, and the number of connection conductive sections having the electric resistance R6g of 0.5 ohm or more is 1% or less of the total number of connection conductive sections.

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