公开(公告)号：EP2795294A1

公开(公告)日：2014-10-29

申请号：EP12857516.4

申请日：2012-12-14

Applicant: Siemens Healthcare Diagnostics Inc.

Inventor： MILESKY, Lawrence ,  ZANTOS, George

IPC: G01N21/01

CPC classification number: G01N21/8483 ,  G01B11/14 ,  G01N21/253 ,  G01N21/27 ,  G01N35/00069 ,  G01N35/04 ,  G01N2035/00148 ,  G01N2035/0491 ,  G01N2035/0494 ,  G01N2201/025 ,  G01N2201/0438 ,  G01N2201/06113

Abstract: A reagent card analyzer comprises an optical signal source configured to transmit an optical signal and an optical signal detector spaced a distance from the optical signal source to define an optical signal path into which the optical signal is transmitted, the optical signal detector configured to detect the optical signal and to output an electrical signal indicative of the optical signal. A reader is configured to read a reagent pad of a reagent card. A reagent card moving mechanism is configured to move the reagent card having the reagent pad including a leading and trailing end through the optical signal path. An optical detector interface is electrically coupled with the optical signal detector and configured to receive electrical signals and to output a pad detect signal indicative of at least one of the leading and the trailing end as the reagent card is moved through the optical signal path.

Abstract translation: 试剂卡分析仪包括光信号源和光信号检测器，所述光信号源被配置为发送光信号，所述光信号检测器与所述光信号源隔开一段距离，以限定光信号被发送到的光信号路径，所述光信号检测器被配置为检测 光信号并输出​​表示光信号的电信号。 读取器被配置为读取试剂卡的试剂垫。 试剂卡移动机构被配置为通过光信号路径移动具有包括前端和后端的试剂垫的试剂卡。 光学检测器接口与光学信号检测器电耦合，并被配置为接收电信号并且当试剂卡移动通过光学信号路径时输出指示前端和后端中的至少一个的焊盘检测信号。

公开(公告)号：EP1750129A2

公开(公告)日：2007-02-07

申请号：EP06022907.7

申请日：2002-02-06

Applicant: Massachusetts Institute of Technology

Inventor： Harper, James Douglas ,  Mathews, Richard Hart ,  Johnson, Bernadette ,  Petrovick, Martha Susan ,  Rundell, Ann ,  Nargi, Frances Ellen ,  Stephens, Timothy ,  Mendenhall, Linda Marie ,  Hollis, Mark Alexander ,  Young, Albert M. ,  Rider, Todd Holman ,  Schwoebel, Eric David ,  Vian, Trina Rae

IPC: G01N33/50

CPC classification number: G01N33/554 ,  G01N15/0205 ,  G01N21/07 ,  G01N21/64 ,  G01N21/6428 ,  G01N21/75 ,  G01N21/76 ,  G01N33/54373 ,  G01N33/54393 ,  G01N33/56983 ,  G01N33/582 ,  G01N2021/6439 ,  G01N2201/025 ,  G01N2201/061 ,  Y10S435/808 ,  Y10S436/805

Abstract: The invention relates to optoelectronic systems for detecting one or more target particles. The system includes a reaction chamber, a specimen collector, an optical detector, and a reservoir containing cells, each of the cells having receptors which are present on the surface of each cell and are specific for the target particle to be detected, where binding of the target particle to the receptors directly or indirectly activates a reporter molecule, thereby producing a measurable optical signal.

Abstract translation: 本发明涉及用于检测一种或多种目标颗粒（例如细菌和抗原）的光电子系统。 该系统包括反应室，样品收集器，光学检测器和含有电池的储存器，每个电池具有存在于每个电池表面上并且对待检测的靶颗粒是特异性的受体，其中结合 受体的目标颗粒直接或间接激活报告分子，例如水母发光蛋白或indo-1，从而产生可测量的光学信号。

公开(公告)号：EP1364070B1

公开(公告)日：2006-11-15

申请号：EP02726568.5

申请日：2002-02-06

Applicant: MASSACHUSETTS INSTITUTE OF TECHNOLOGY

Inventor： HARPER, James, Douglas ,  MATHEWS, Richard, Hart ,  JOHNSON, Bernadette ,  PETROVICK, Martha, Susan ,  RUNDELL, Ann ,  NARGI, Frances, Ellen ,  STEPHENS, Timothy ,  MENDENHALL, Linda, Marie ,  HOLLIS, Mark, Alexander ,  YOUNG, Albert, M. ,  RIDER, Todd, Harrison ,  SCHWOEBEL, Eric, David ,  VIAN, Trina, Rae

IPC: G01N33/50 ,  G01N33/53 ,  G01N33/543 ,  C12Q1/02 ,  C12Q1/24 ,  C12M1/34 ,  C12M1/28

CPC classification number: G01N33/554 ,  G01N15/0205 ,  G01N21/07 ,  G01N21/64 ,  G01N21/6428 ,  G01N21/75 ,  G01N21/76 ,  G01N33/54373 ,  G01N33/54393 ,  G01N33/56983 ,  G01N33/582 ,  G01N2021/6439 ,  G01N2201/025 ,  G01N2201/061 ,  Y10S435/808 ,  Y10S436/805

Abstract: The invention relates to optoelectronic systems for detecting one or more target particles (Figure 4). The system includes a reaction chamber, a specimen collector, an optical detector, and a reservoir containing cells, each of the cells having receptors which are present on the surface of each cell and are specific for the target particle to be detected, where binding of the target particle to the receptors directly or indirectly activates a reporter molecule, thereby producing a measurable optical signal.

公开(公告)号：EP2909597B1

公开(公告)日：2018-08-08

申请号：EP13846762.6

申请日：2013-10-18

Applicant: Picarro, Inc.

Inventor： RELLA, Chris, W. ,  CROSSON, Eric, R. ,  WOELK, Michael, R. ,  TAN, Sze, Meng

IPC: G01N21/31 ,  G01N21/3504 ,  G01M3/20 ,  G01M3/38 ,  G01N21/01 ,  G01N21/39 ,  G01N21/03

CPC classification number: G01M3/20 ,  G01M3/38 ,  G01N21/01 ,  G01N21/31 ,  G01N21/3504 ,  G01N21/39 ,  G01N2021/0314 ,  G01N2201/025

Abstract: Improved gas leak detection from moving platforms is provided. Automatic horizontal spatial scale analysis can be performed in order to distinguish a leak from background levels of the measured gas. Source identification can be provided by using isotopic ratios and/or chemical tracers to distinguish gas leaks from other sources of the measured gas. Multi-point measurements combined with spatial analysis of the multi-point measurement results can provide leak source distance estimates. These methods can be practiced individually or in any combination.

公开(公告)号：EP2909598B1

公开(公告)日：2018-07-04

申请号：EP13847836.7

申请日：2013-10-18

Applicant: Picarro, Inc.

Inventor： RELLA, Chris, W. ,  CROSSON, Eric, R. ,  WOELK, Michael, R. ,  TAN, Sze, Meng

IPC: G01M3/04 ,  F17D5/02 ,  G06F17/18 ,  G01N21/3504 ,  G01M3/20 ,  G01N33/00

CPC classification number: G01M3/20 ,  G01N21/3504 ,  G01N33/0004 ,  G01N2201/025

Abstract: Improved gas leak detection from moving platforms is provided. Automatic horizontal spatial scale analysis can be performed in order to distinguish a leak from background levels of the measured gas. Source identification can be provided by using isotopic ratios and/or chemical tracers to distinguish gas leaks from other sources of the measured gas. Multi-point measurements combined with spatial analysis of the multi-point measurement results can provide leak source distance estimates. These methods can be practiced individually or in any combination.

公开(公告)号：EP2913654B1

公开(公告)日：2017-12-06

申请号：EP13849192.3

申请日：2013-10-04

Applicant: Olympus Corporation

Inventor： MORIMOTO, Nobuhiko

IPC: G01N1/04 ,  B32B43/00

CPC classification number: G01N1/04 ,  B32B41/00 ,  B32B43/006 ,  B32B2310/0831 ,  G01N1/08 ,  G01N1/312 ,  G01N21/6456 ,  G01N2201/025 ,  G02B21/365 ,  Y10T156/1158 ,  Y10T156/1179 ,  Y10T156/19 ,  Y10T156/1917 ,  Y10T156/1983

Abstract: The present invention provides a substrate collecting device (1) that includes a stage (3) on which a sheet (11) is placed with a plurality of substrates (2) facing downward, an acquiring section (4) which carries out a predetermined operation on some of the substrates (2), which are disposed at predetermined positions, from above the stage (3) thereby to cause the substrates (2) to come off from the sheet (11) and fall, an observation section (5) and a collecting section (7) disposed below the stage (3), and a moving mechanism (8), which integrally moves the observation section (5) and the collecting section (7) in a horizontal direction. The moving mechanism (8) is capable of positioning the observation section (5) and the collecting section (7) at two positions at which the observation section (5) or the collecting section (7) is positioned substantially vertically below a predetermined position.

公开(公告)号：EP2891175A1

公开(公告)日：2015-07-08

申请号：EP13833045.1

申请日：2013-09-02

Applicant: Semiconductor Technologies & Instruments Pte Ltd.

Inventor： JIN Jian Ping ,  LEE Leng Kheam

IPC: H01L21/683

CPC classification number: H01L21/681 ,  B25J11/0095 ,  B25J15/0616 ,  B25J15/0658 ,  B25J15/0666 ,  G01B11/27 ,  G01N21/9501 ,  G01N2201/025 ,  H01L21/67144 ,  H01L21/67706 ,  H01L21/6838 ,  H01L21/68757 ,  Y10T29/49826

Abstract: A wafer table structure providing a single wafer table surface suitable for handling both wafers and film frames includes a base tray having a set of compartments formed therein by way of a set of ridges formed in or on an interior base tray surface; a hardenable fluid permeable compartment material disposed within the set of base tray compartments; and a set of openings formed in the base tray interior surface by which the hardened compartment material is exposable to negative or positive pressures. The base tray includes a first ceramic material (e.g., porcelain), and the hardenable compartment material includes a second ceramic material. The base tray and the compartment material are simultaneously machinable by way of a standard machining process to thereby planarize exposed outer surfaces of the base tray and the hardened compartment material at an essentially identical rate for forming a highly or ultra-planar wafer table surface.

公开(公告)号：EP2909596A4

公开(公告)日：2016-06-22

申请号：EP13846577

申请日：2013-10-18

Applicant: PICARRO INC

Inventor： RELLA CHRIS W ,  CROSSON ERIC R ,  TAN SZE MENG

IPC: G01M3/04 ,  F17D5/02 ,  G01M3/20 ,  G01M3/38 ,  G01N21/03 ,  G01N21/3504 ,  G01N21/39

CPC classification number: G01M3/20 ,  G01M3/38 ,  G01N21/3504 ,  G01N21/39 ,  G01N2021/0314 ,  G01N2201/025

公开(公告)号：EP2891174A4

公开(公告)日：2016-03-02

申请号：EP13833578

申请日：2013-09-02

Applicant: SEMICONDUCTOR TECH & INSTR INC

Inventor： LIN JING

IPC: H01L21/683 ,  H01L21/67 ,  H01L21/687

CPC classification number: H01L21/681 ,  B25J11/0095 ,  B25J15/0616 ,  B25J15/0658 ,  B25J15/0666 ,  G01B11/27 ,  G01N21/9501 ,  G01N2201/025 ,  H01L21/67144 ,  H01L21/67706 ,  H01L21/6838 ,  H01L21/68757 ,  Y10T29/49826

Abstract: A wafer table structure providing a single wafer table surface suitable for handling both wafers and film frames includes a base tray having a set of compartments formed therein by way of a set of ridges formed in or on an interior base tray surface; a hardenable fluid permeable compartment material disposed within the set of base tray compartments; and a set of openings formed in the base tray interior surface by which the hardened compartment material is exposable to negative or positive pressures. The base tray includes a first ceramic material (e.g., porcelain), and the hardenable compartment material includes a second ceramic material. The base tray and the compartment material are simultaneously machinable by way of a standard machining process to thereby planarize exposed outer surfaces of the base tray and the hardened compartment material at an essentially identical rate for forming a highly or ultra-planar wafer table surface.

公开(公告)号：EP2820399A4

公开(公告)日：2015-12-30

申请号：EP13754914

申请日：2013-02-28

Applicant: SMART APPLIC LTD

Inventor： ZINN MICHAEL TREVOR ,  WOODS QUINTON ENCOMBE ,  BUYS PETRUS HENDRIK

IPC: G01N21/954 ,  E04G23/00 ,  F23J13/00 ,  F23J99/00 ,  G03B37/00

CPC classification number: G01N21/954 ,  E04G23/008 ,  F23J13/00 ,  F23J99/00 ,  F23J2213/60 ,  G01C19/00 ,  G01N2201/023 ,  G01N2201/025 ,  G01N2201/062 ,  G03B37/005

Abstract: The invention relates to an inspection and repair module for an internal side wall of a vertically erected structure, with the module including a carrier for supporting at least one data recording mechanism and being securable to a hoist, and for an inspection and repair module for an internal wall of a conduit with the module including propulsion means comprising a set of driven tracked wheels controllable by a controller carried by the carrier and configured to provide, within a conduit, longitudinal forward and reverse motion.