中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

163 records (took 0.028 seconds)

    Spectral module
    14.
    发明专利
    Spectral module 有权
    光谱模块

    公开(公告)号：JP2011215075A

    公开(公告)日：2011-10-27

    申请号：JP2010085206

    申请日：2010-04-01

    Applicant: Hamamatsu Photonics Kk ,  浜松ホトニクス株式会社

    Inventor： YOSHINO TAKAFUMI ,  SHIBAYAMA KATSUMI

    IPC: G01J3/36 ,  G01J3/18 ,  G02B5/10 ,  G02B5/18

    CPC classification number: G01J3/28 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/18

    Abstract: PROBLEM TO BE SOLVED: To provide a spectral module which accurately detects lights of a wide wavelength range or lights of a different wavelength range by preventing an enlargement.SOLUTION: Since a spectral part 8 and a light detecting element 9 are provided as well as a spectral part 4 and a light detecting element 5 in the spectral module 1, a detecting sensitivity is improved to the lights of the wide wavelength range or the lights of the different wavelength range. Further, between a light detecting part 5a and a light detecting part 9a, a light passing hole 5b and a light absorbing layer 12 are provided and a reflecting part 7 is provided so as to be opposed to the light absorbing layer 12 (namely, a range R), so that the enlargement can be prevented. A disturbance light Lis absorbed by the light absorbing layer 12. Even when a part of the disturbance lights Lpasses through the range R of the light absorbing layer 12, since a part of the lights is reflected to the range R side by the reflecting part 7 provided so as to be opposed to the range R, the generation of stray lights caused by an incidence of the disturbance lights Lis suppressed.

    Abstract translation: 要解决的问题：提供一种通过防止放大来精确地检测宽波长范围的光或不同波长范围的光的光谱模块。解决方案：由于提供了光谱部分8和光检测元件9以及 光谱模块1中的光谱部分4和光检测元件5，检测灵敏度提高到宽波长范围的光或不同波长范围的光。 此外，在光检测部5a和光检测部9a之间设置有光通过孔5b和光吸收层12，并且反射部7设置成与光吸收层12相对（即， 范围R），从而可以防止放大。 干扰光Lis被光吸收层12吸收。即使当干扰光的一部分L超过光吸收层12的范围R时，由于一部分光被反射部7反射到范围R侧 被设置成与范围R相对，抑制由扰动光Lis的入射引起的杂散光的产生。

    Spectroscopic device and image forming apparatus with the same
    17.
    发明专利
    Spectroscopic device and image forming apparatus with the same 审中-公开
    光谱设备和图像形成装置

    公开(公告)号：JP2010261767A

    公开(公告)日：2010-11-18

    申请号：JP2009111747

    申请日：2009-05-01

    Applicant: Canon Inc ,  キヤノン株式会社

    Inventor： TERAMURA MASAYASU ,  KIMURA KAZUMI ,  TOCHIGI NOBUYUKI ,  TAKIZAWA TOKUJI

    IPC: G01J3/20 ,  G01J3/02 ,  G01J3/52

    CPC classification number: G01J3/0205 ,  G01J3/02 ,  G01J3/0262 ,  G01J3/18 ,  G01J3/20 ,  G01J3/50

    Abstract: PROBLEM TO BE SOLVED: To acquire a spectroscopic device which effectively reduces incidence upon a light detection unit of stray light reflected by surfaces other than a diffraction surface, and is capable of detecting light dispersed by the diffraction surface with high accuracy. SOLUTION: In the spectroscopic device with a concave reflection-type diffraction element, non-diffraction surfaces being on the same side as the diffraction surface of the diffraction element and located outside the diffraction surface are glossy, among surfaces other than the diffraction surface, and the device includes a light detection unit at a position corresponding to an imaging position of first-order diffracted light diffracted by the diffraction element to receive the first-order diffracted light. The light detection unit is disposed inside optical paths of light beams reflected regularly by the non-diffraction surfaces outside the diffraction surface. COPYRIGHT: (C)2011,JPO&INPIT

    Abstract translation: 要解决的问题：获得有效地减少由衍射面以外的表面反射的杂散光的光检测单元的入射的分光装置，能够高精度地检测由衍射面散射的光。 解决方案：在具有凹面反射型衍射元件的分光装置中，与衍射元件的衍射面位于同一侧的位于衍射面外侧的非衍射面在光学衍射 表面，并且该装置包括在与由衍射元件衍射的一级衍射光的成像位置对应的位置处的光检测单元，以接收一级衍射光。 光检测单元设置在由衍射面外的非衍射面规则地反射的光束的光路内。 版权所有（C）2011，JPO＆INPIT

    Spectrometer, spectrometry, and spectrometric program
    18.
    发明专利
    Spectrometer, spectrometry, and spectrometric program 有权
    光谱仪，光谱仪和光谱计划

    公开(公告)号：JP2010151632A

    公开(公告)日：2010-07-08

    申请号：JP2008330349

    申请日：2008-12-25

    Applicant: Hamamatsu Photonics Kk ,  浜松ホトニクス株式会社

    Inventor： WATANABE MOTOYUKI ,  IGUCHI KAZUYA ,  SUZUKI KENGO

    IPC: G01N21/63 ,  G01J3/443 ,  G01N21/64

    CPC classification number: G01N21/645 ,  G01J3/02 ,  G01J3/0262 ,  G01J3/0267 ,  G01J3/0291 ,  G01J3/4406 ,  G01J3/443 ,  G01N2201/0632 ,  G01N2201/065

    Abstract: PROBLEM TO BE SOLVED: To provide a spectrometer, a spectrometry, and a spectrometric program capable of reducing an effect of a stray light occurring in the spectrometer. SOLUTION: The spectrometer 1A includes an integrating sphere 20 internally containing a sample S, a spectroscopic analyzer 30 dispersing a measurement object light from the sample S to acquire a wavelength spectrum, and a data analyzer 50. The analyzer 50, comprising an object domain setting section for setting a first object domain corresponding to an excitation light in the wavelength spectrum and a second object domain corresponding to luminescence from the sample S; and a sample information analyzing section for calculating a luminescent quantum yield of the sample S; calculates a measurement value Φ 0 of the luminescent quantum yield from results of reference and sample measurements, and using coefficients β and γ associated with the stray light in the reference measurement, calculates an analysis value Φ of the luminescent quantum yield less affected by the stray light, by a formula of Φ=βΦ 0 +γ. COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 要解决的问题：提供能够降低在光谱仪中发生的杂散光的影响的光谱仪，光谱测定和光谱测定程序。 解决方案：光谱仪1A包括内部包含样品S的积分球20，分散来自样品S的测量对象光以获取波长谱的光谱分析器30和数据分析器50.分析器50包括： 对象域设置部分，用于设置与波长谱中的激发光相对应的第一对象域，以及对应于来自样本S的发光的第二对象域; 以及用于计算样品S的发光量子产率的样本信息分析部分; 根据参考和样品测量结果计算发光量子产率的测量值Φ 0 ，并使用参考测量中与杂散光相关联的系数β和γ，计算发光 量子产率较少受杂散光的影响，通过Φ=βΦ 0 +γ的公式。 版权所有（C）2010，JPO＆INPIT

    Spectroscopic module and its manufacturing method
    20.
    发明专利
    Spectroscopic module and its manufacturing method 有权
    光谱模块及其制造方法

    公开(公告)号：JP2009300423A

    公开(公告)日：2009-12-24

    申请号：JP2008311086

    申请日：2008-12-05

    Applicant: Hamamatsu Photonics Kk ,  浜松ホトニクス株式会社

    Inventor： SHIBAYAMA KATSUMI

    IPC: G01J3/18

    CPC classification number: G01J3/02 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/0256 ,  G01J3/0262 ,  G01J3/18 ,  Y10T156/10

    Abstract: PROBLEM TO BE SOLVED: To provide a spectroscopic module capable of improving reliability. SOLUTION: A light passage hole 5b for passing light L1 traveling to a spectroscopic part 4 is formed in a photo-detection element 5 in the spectroscopic module 1. It is therefore possible to prevent the occurrence of deviations in the relative positional relation between the light passage hole 5b and a photo-detection part 5a of the photo-detection element 5. The light to be measured L1 traveling to the spectroscopic part 4 via the light passage hole 5b and diffracted light L2 traveling from the spectroscopic part 4 to the photo-detection part 5a passes through an air gap formed between the photo-detection element 5 and a substrate 2 by an opening part 10a of a wiring board 10. Since events such as the scattering of the light to be measured L1 and the diffracted light L2 due to a resin agent 16 etc. interposed between the photo-detection element 5 and the substrate 2 are thereby prevented, it is possible to reduce the occurrence of stray light. It is therefore possible to improve reliability by the spectroscopic module 1. COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 要解决的问题：提供能够提高可靠性的光谱模块。 解决方案：在光谱模块1中的光检测元件5中形成有用于使在光谱部件4上行进的光L1通过的光通过孔5b。因此，可以防止相对位置关系的偏差的发生 在光通过孔5b和光检测元件5的光检测部5a之间。经由光通过孔5b行进到分光部4的被测光L1和从分光部4行进的衍射光L2到 光检测部分5a通过布线板10的开口部分10a通过形成在光检测元件5和基板2之间的气隙。由于诸如待测光L1的散射和衍射的事件 由此防止了由于光敏元件5和基板2之间的树脂剂16等引起的光L2，从而可以减少杂散光的发生。 因此，可以通过光谱模块1提高可靠性。版权所有（C）2010，JPO＆INPIT

Patent Agency Ranking