Electron microscope apparatus using the sample stage and the stage

    公开(公告)号:JP5281024B2

    公开(公告)日:2013-09-04

    申请号:JP2010019114

    申请日:2010-01-29

    Abstract: PROBLEM TO BE SOLVED: To solve such a problem that a plurality of braking mechanisms employed for positioning a sample stage each have different gaps, and if the same drive command is issued to respective braking mechanisms, braking forces produced by the respective braking mechanisms differ, resulting in a positional deviation of the sample stage. SOLUTION: An actuator 301 of each of the plurality of braking mechanisms is driven by a predetermined drive command. While the actuator is being driven, a state difference Vba in the predetermined drive command among the braking mechanisms, when a brake pad 307 of each braking mechanism 125a contacts a braked surface 124u, is obtained based on a contact sensing output from a sensing mechanism for each braking mechanism 125a. Based on the obtained state difference Vba in the predetermined drive command, a final drive command Vat, ... corresponding to the drive state of the actuator 301 while a brake is in operation is decided for each braking mechanism. The actuator 301 of each braking mechanism 125a is driven by the decided final drive command of the corresponding braking mechanism. COPYRIGHT: (C)2011,JPO&INPIT

Patent Agency Ranking