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公开(公告)号:JPWO2007013604A1
公开(公告)日:2009-02-12
申请号:JP2007526919
申请日:2006-07-28
CPC classification number: H01G4/1227 , C23C18/1216 , C23C18/1279 , H01G4/33 , H01L21/02197 , H01L21/02282 , H01L21/31691 , H01L27/016 , H01L28/55
Abstract: 本発明では、チタン酸バリウムストロンチウム薄膜の容量密度の向上及びリーク電流密度の低減を同時に実現することが可能な薄膜コンデンサの製造方法を提供することを目的とする。有機誘電体原料を焼成してチタン酸バリウムストロンチウム薄膜を形成する金属酸化物薄膜形成工程を有する薄膜コンデンサの製造方法において、焼成雰囲気を酸素含有不活性ガス雰囲気として、酸素雰囲気中で焼成したチタン酸バリウムストロンチウム薄膜の容量密度よりも大きい容量密度を有するチタン酸バリウムストロンチウム薄膜を形成する製造方法が提供される。
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公开(公告)号:JP5218113B2
公开(公告)日:2013-06-26
申请号:JP2009022872
申请日:2009-02-03
Applicant: Tdk株式会社
IPC: H01G4/12
CPC classification number: H01L21/31691 , H01G4/1227 , H01G4/33 , H01L27/016 , H01L28/55
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公开(公告)号:JP5005599B2
公开(公告)日:2012-08-22
申请号:JP2008090335
申请日:2008-03-31
Applicant: Tdk株式会社
IPC: H01G2/06
CPC classification number: H05K1/162 , H05K2201/0355 , H05K2201/09509 , H05K2201/09763 , H05K2201/098
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公开(公告)号:JP4983134B2
公开(公告)日:2012-07-25
申请号:JP2006204910
申请日:2006-07-27
Applicant: Tdk株式会社
Abstract: PROBLEM TO BE SOLVED: To provide a capacitor provided with a dielectric film capable of exhibiting a sufficiently high dielectric constant and to provide a method of fabricating a dielectric film capable of producing a dielectric film while sufficiently suppressing oxidization of a metal layer to cause a sufficiently high dielectric constant to come out. SOLUTION: The capacitor 100 has a dielectric film 1 and a first electrode 2 and a second electrode 3 provided oppositely while sandwiching the dielectric film 1, wherein the dielectric film 1 has a density in excess of 72% of a theoretical density calculated on the basis of a lattice constant, and at least one of the first electrode 2 and the second electrode 3 contains at least one metal selected from the group consisting of Cu, Ni, Al, stainless steel and Inconel (trade mark). COPYRIGHT: (C)2007,JPO&INPIT
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公开(公告)号:JP4956939B2
公开(公告)日:2012-06-20
申请号:JP2005252435
申请日:2005-08-31
Applicant: Tdk株式会社
CPC classification number: H01L21/31691 , C23C18/1216 , C23C18/1241 , C23C18/125 , C23C18/1283
Abstract: A dielectric film production process comprising a baking step in which a dielectric film is formed by heating a precursor layer formed on a metal layer, wherein the metal layer contains at least one type of metal selected from the group consisting of Cu, Ni, Al, stainless steel and inconel, and during at least part of the baking step the precursor layer is heated in a reduced pressure atmosphere.
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公开(公告)号:JP4525786B2
公开(公告)日:2010-08-18
申请号:JP2008090076
申请日:2008-03-31
Applicant: Tdk株式会社
CPC classification number: H05K1/162 , H05K3/382 , H05K2201/0175 , H05K2201/0187 , H05K2201/0355 , H05K2201/09509 , H05K2201/09718 , H05K2201/09763 , H05K2203/033
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公开(公告)号:JP4935674B2
公开(公告)日:2012-05-23
申请号:JP2007526919
申请日:2006-07-28
Applicant: Tdk株式会社
CPC classification number: H01G4/1227 , C23C18/1216 , C23C18/1279 , H01G4/33 , H01L21/02197 , H01L21/02282 , H01L21/31691 , H01L27/016 , H01L28/55
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9.
公开(公告)号:JP4923756B2
公开(公告)日:2012-04-25
申请号:JP2006157558
申请日:2006-06-06
Applicant: Tdk株式会社
IPC: H01G4/33 , H01L21/316 , H01L21/8246 , H01L27/105
Abstract: PROBLEM TO BE SOLVED: To provide a method of forming a smooth dielectric thin film by an MOD method while preventing oxidation of an electrode even if inexpensive Cu, Ni or Al is used as the electrode, and to provide a thin-film dielectric element employing the smooth dielectric thin film. SOLUTION: This forming method of a laminate for a thin-film dielectric element includes an electrode forming process of forming a lower electrode layer 2 containing at least one or more kinds of Cu, Ni and Al as a main component on a substrate 1, a material liquid applying process of applying a material liquid containing an organic dielectric material onto the surface of the electrode layer 2, and a thermal decomposition process of thermally decomposing the organic dielectric material in the material liquid applied on the surface of the electrode 2 to form a metal oxide thin film. The thermal decomposition process includes a step of heating the material liquid applied on the surface of the electrode 2 at a temperature-rise speed of not more than 3°C/min in a reductive atmosphere, and the conditions of the reductive atmosphere is pO 2 COPYRIGHT: (C)2008,JPO&INPIT
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10.
公开(公告)号:JP4604939B2
公开(公告)日:2011-01-05
申请号:JP2005278530
申请日:2005-09-26
Applicant: Tdk株式会社
IPC: H01B3/12 , C01G23/00 , C23C14/08 , H01G4/12 , H01G4/30 , H01G4/33 , H01L21/316 , H01L21/822 , H01L21/8242 , H01L27/04 , H01L27/108
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