摘要:
A method for generating a layout for a device having FinFETs from a first layout for a device having planar transistors is disclosed. The planar layout is analyzed and corresponding FinFET structures are generated.
摘要:
A method for generating a layout for a device having FinFETs from a first layout for a device having planar transistors is disclosed. The planar layout is analyzed and corresponding FinFET structures are generated in a matching fashion. The resulting FinFET structures are then optimized. Dummy patterns and a new metal layer may be generated before the FinFET layout is verified and outputted.
摘要:
A semiconductor device is formed as part of an integrated circuit. The semiconductor device, which is formed in an active semiconductor layer, is surrounded by a guardian that provides a diffusion barrier against contaminants and also provides assistance in avoiding dishing above the semiconductor device during chemical mechanical polishing. The dielectric that is above the semiconductor device and inside the guardian is etched to form an opening that receives one of an optical fiber, an electromagnetic signal source, or an electromagnetic signal load. The remaining dielectric is in layers that are of substantially uniform thickness. The guardian is built up in layers that are part of a normal integrated circuit process. These include contact layers, via layers, and interconnect layers.
摘要:
A semiconductor device is formed as part of an integrated circuit. The semiconductor device, which is formed in an active semiconductor layer, is surrounded by a guardian that provides a diffusion barrier against contaminants and also provides assistance in avoiding dishing above the semiconductor device during chemical mechanical polishing. The dielectric that is above the semiconductor device and inside the guardian is etched to form an opening that receives one of an optical fiber, an electromagnetic signal source, or an electromagnetic signal load. The remaining dielectric is in layers that are of substantially uniform thickness. The guardian is built up in layers that are part of a normal integrated circuit process. These include contact layers, via layers, and interconnect layers.
摘要:
A method for revising a patterned conductor layer and a system for revising the patterned conductor layer employ an unoccupied equivalent wiring location. The unoccupied equivalent wiring location is provided in each of a series of wiring layout records. At least one optional wiring pattern may be formed in the unoccupied equivalent wiring location. The method and system provide for extending to all of the series of wiring layout records an optional wiring pattern and an interconnect option formed within a single one of the series of wiring layout records.
摘要:
A photronic device includes a substrate having an opening through the substrate. The photronic device further includes an insulating layer over the substrate including over the opening. The photronic device further includes an active layer over the insulating layer. The photronic device further includes a photoactive device formed in the active layer, wherein the photoactive device is over the opening. The photronic device further includes active electronic circuitry formed in the active layer. The photronic device further includes a reflective layer on the insulating layer in the opening.
摘要:
A static random access memory (SRAM) can include a plurality of columns forming a memory array, wherein each column comprises a plurality of memory cells coupled to bitlines and wordlines, and a write replica circuit generating a signal when data has been written to the write replica circuit. A wordline of the memory array is turned off responsive to the signal. The write replica circuit can include an additional column comprising at least one dual port dummy memory cell, and write detection circuitry coupled to the dual port dummy memory cell detecting when data has been written to the dual port dummy memory cell and responsively generating the signal. The signal generated by the write detection circuitry indicates a successful write operation to the dual port dummy memory cell.
摘要:
Within both a method for revising a patterned conductor layer and a system for revising the patterned conductor layer there is provided within each wiring layout record within a series of wiring layout records within a wiring layout database directed towards a series of microelectronic fabrications an unoccupied equivalent wiring location within which may be formed at least one optional wiring pattern. When there is designed within an unoccupied equivalent wiring location for a single wiring layout record within the series of wiring layout records at least one optional wiring pattern and an interconnect option to the at least one optional wiring pattern.
摘要:
This invention provides a memory array and its peripheral circuit with byte-erase capability. The advantage of this invention is the ability to access bytes for program, erase, and read operations. This invention allows this access with the addition of one word line switch and one source line switch for each byte to be accessed for program, erase, and read operations. Also, this invention utilizes a new bias condition to lessen the voltage stress on the high voltage device. In addition, this invention utilizes separate and dedicated power supplies for the local word line driver circuits and for the local source line driver circuits. This is coupled with the partitioning of the main memory array into sub-arrays of 8 columns. This allows the placing of high voltage only on the selected 8 column (byte) subarray. This also substantially lessens the voltage stress on the memory cells and enhances long-term reliability.
摘要:
A method for generating a layout for a device having FinFETs from a first layout for a device having planar transistors is disclosed. The planar layout is analyzed and corresponding FinFET structures are generated in a matching fashion. The resulting FinFET structures are then optimized. Dummy patterns and a new metal layer may be generated before the FinFET layout is verified and outputted.