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公开(公告)号:US11996289B2
公开(公告)日:2024-05-28
申请号:US17141360
申请日:2021-01-05
Applicant: ASM IP Holding B.V.
Inventor: Amir Kajbafvala , Joe Margetis , Xin Sun , David Kohen , Dieter Pierreux
IPC: C23C16/24 , C23C16/08 , C23C16/42 , C23C16/455 , C23C16/52 , C30B25/16 , C30B25/18 , C30B29/06 , C30B29/52 , H01L21/02 , H01L29/06 , H01L29/423 , H01L29/786
CPC classification number: H01L21/0262 , C23C16/08 , C23C16/24 , C23C16/42 , C23C16/45523 , C23C16/52 , C30B25/165 , C30B25/18 , C30B29/06 , C30B29/52 , H01L21/02507 , H01L21/02532 , H01L21/02576 , H01L21/02579 , H01L21/02603 , H01L29/0673 , H01L29/42392 , H01L29/78696
Abstract: Methods and systems for forming structures including one or more layers comprising silicon germanium and one or more layers comprising silicon are disclosed. Exemplary methods can include using a surfactant, using particular precursors, and/or using a transition step to improve an interface between adjacent layers comprising silicon germanium and comprising silicon.
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公开(公告)号:US12057314B2
公开(公告)日:2024-08-06
申请号:US17317965
申请日:2021-05-12
Applicant: ASM IP Holding B.V.
Inventor: Amir Kajbafvala , Peter Westrom , Joe Margetis , Xin Sun , Caleb Miskin , Yen Lin Leow , Yanfu Lu
CPC classification number: H01L21/0262 , C23C16/08 , C23C16/45512 , C23C16/52 , C30B25/165 , C30B25/186 , C30B29/52 , H01L21/02532
Abstract: A method of forming a silicon germanium layer on a surface of a substrate and a system for forming a silicon germanium layer are disclosed. Examples of the disclosure provide a method that includes providing a plurality of growth precursors to control and/or promote parasitic gas-phase and surface reactions, such that greater control of the film (e.g., thickness and/or composition) uniformity can be realized.
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公开(公告)号:US20210327704A1
公开(公告)日:2021-10-21
申请号:US17141360
申请日:2021-01-05
Applicant: ASM IP Holding B.V.
Inventor: Amir Kajbafvala , Joe Margetis , Xin Sun , David Kohen , Dieter Pierreux
Abstract: Methods and systems for forming structures including one or more layers comprising silicon germanium and one or more layers comprising silicon are disclosed. Exemplary methods can include using a surfactant, using particular precursors, and/or using a transition step to improve an interface between adjacent layers comprising silicon germanium and comprising silicon.
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公开(公告)号:US20240332016A1
公开(公告)日:2024-10-03
申请号:US18742250
申请日:2024-06-13
Applicant: ASM IP Holding B.V.
Inventor: Amir Kajbafvala , Peter Westrom , Joe Margetis , Xin Sun , Caleb Miskin , Yen Lin Leow , Yanfu Lu
CPC classification number: H01L21/0262 , C23C16/08 , C23C16/45512 , C23C16/52 , C30B25/165 , C30B25/186 , C30B29/52 , H01L21/02532
Abstract: A method of forming a silicon germanium layer on a surface of a substrate and a system for forming a silicon germanium layer are disclosed. Examples of the disclosure provide a method that includes providing a plurality of growth precursors to control and/or promote parasitic gas-phase and surface reactions, such that greater control of the film (e.g., thickness and/or composition) uniformity can be realized.
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公开(公告)号:US20240274437A1
公开(公告)日:2024-08-15
申请号:US18644475
申请日:2024-04-24
Applicant: ASM IP Holding B.V.
Inventor: Amir Kajbafvala , Joe Margetis , Xin Sun , David Kohen , Dieter Pierreux
IPC: H01L21/02 , C23C16/08 , C23C16/24 , C23C16/42 , C23C16/455 , C23C16/52 , C30B25/16 , C30B25/18 , C30B29/06 , C30B29/52 , H01L29/06 , H01L29/423 , H01L29/786
CPC classification number: H01L21/0262 , C23C16/08 , C23C16/24 , C23C16/42 , C23C16/45523 , C23C16/52 , C30B25/165 , C30B25/18 , C30B29/06 , C30B29/52 , H01L21/02507 , H01L21/02532 , H01L21/02576 , H01L21/02579 , H01L21/02603 , H01L29/0673 , H01L29/42392 , H01L29/78696
Abstract: Methods and systems for forming structures including one or more layers comprising silicon germanium and one or more layers comprising silicon are disclosed. Exemplary methods can include using a surfactant, using particular precursors, and/or using a transition step to improve an interface between adjacent layers comprising silicon germanium and comprising silicon.
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公开(公告)号:US20210358741A1
公开(公告)日:2021-11-18
申请号:US17317965
申请日:2021-05-12
Applicant: ASM IP Holding B.V.
Inventor: Amir Kajbafvala , Peter Westrom , Joe Margetis , Xin Sun , Caleb Miskin , Yen Lin Leow , Yanfu Lu
Abstract: A method of forming a silicon germanium layer on a surface of a substrate and a system for forming a silicon germanium layer are disclosed. Examples of the disclosure provide a method that includes providing a plurality of growth precursors to control and/or promote parasitic gas-phase and surface reactions, such that greater control of the film (e.g., thickness and/or composition) uniformity can be realized.
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