摘要:
An epitaxial crystal for a field effect transistor which has a nitride-based III-V group semiconductor epitaxial crystal grown on a SiC single crystal base substrate having micropipes by use of an epitaxial growth method, wherein at least a part of the micropipes spreading from the SiC single crystal base substrate into the epitaxial crystal terminate between an active layer of the transistor and the SiC single crystal base substrate.
摘要:
An epitaxial crystal for a field effect transistor which has a nitride-based III-V group semiconductor epitaxial crystal grown on a SiC single crystal base substrate having micropipes by use of an epitaxial growth method, wherein at least a part of the micropipes spreading from the SiC single crystal base substrate into the epitaxial crystal terminate between an active layer of the transistor and the SiC single crystal base substrate.
摘要:
An electronic device includes a substrate; a single-crystalline first buffer layer, disposed on the substrate, containing a semiconductor represented by the formula AlxGa1-xN; a non-single-crystalline second buffer layer, disposed on the first buffer layer, containing a semiconductor represented by the formula AlyGa1-yN; and an undoped base layer, disposed on the second buffer layer, containing GaN, wherein 0
摘要翻译:电子装置包括:基板; 设置在所述衬底上的单晶第一缓冲层,其包含由式Al x Ga 1-x N表示的半导体; 设置在第一缓冲层上的非单晶第二缓冲层,含有由式Al 1 Ga 1-y N表示的半导体; 以及设置在第二缓冲层上的含有GaN的未掺杂的基底层,其中0
摘要:
An electronic device includes a substrate; a single-crystalline first buffer layer, disposed on the substrate, containing a semiconductor represented by the formula AlxGa1−xN; a non-single-crystalline second buffer layer, disposed on the first buffer layer, containing a semiconductor represented by the formula AlyGa1−yN; and an undoped base layer, disposed on the second buffer layer, containing GaN, wherein 0
摘要翻译:电子装置包括:基板; 设置在所述基板上的含有由式Al x Ga 1-x N表示的半导体的单晶第一缓冲层; 设置在第一缓冲层上的含有由式Al y Ga 1-y N表示的半导体的非单晶第二缓冲层; 以及设置在第二缓冲层上的含有GaN的未掺杂的基底层,其中0
摘要:
A field-effect transistor includes a channel layer having a channel and a carrier supply layer, disposed on the channel layer, containing a semiconductor represented by the formula AlxGa1-xN, wherein x is greater than 0.04 and less than 0.45. The channel is formed near the interface between the channel layer and the carrier supply layer or depleted, the carrier supply layer has a band gap energy greater than that of the channel layer, and x in the formula AlxGa1-xN decreases monotonically with an increase in the distance from the interface. The channel layer may be crystalline of gallium nitride. The channel layer may be undoped. X of the formula AlxGa1-xN of the carrier supply layer is greater than or equal to 0.15 and less than or equal to 0.40 at the interface.
摘要翻译:场效应晶体管包括具有通道的沟道层和载流子供应层,该沟道层设置在沟道层上,该沟道层包含由式Al x Ga 1-x SUB > N,其中x大于0.04且小于0.45。 通道形成在沟道层和载流子供应层之间的界面附近,或者耗尽,载流子供应层的带隙能量大于沟道层的带隙能量,并且公式A1 x x 随着与界面的距离的增加,Ga 1-x N单调减小。 沟道层可以是氮化镓的结晶。 通道层可以是未掺杂的。 载体供给层的式Al x Ga 1-x N的X在界面处大于或等于0.15且小于或等于0.40。
摘要:
A field-effect transistor includes a channel layer having a channel and a carrier supply layer, disposed on the channel layer, containing a semiconductor represented by the formula AlxGa1-xN, wherein x is greater than 0.04 and less than 0.45. The channel is formed near the interface between the channel layer and the carrier supply layer or depleted, the carrier supply layer has a band gap energy greater than that of the channel layer, and x in the formula AlxGa1-xN decreases monotonically with an increase in the distance from the interface. The channel layer may be crystalline of gallium nitride. The channel layer may be undoped. X of the formula AlxGa1-xN of the carrier supply layer is greater than or equal to 0.15 and less than or equal to 0.40 at the interface.
摘要翻译:场效应晶体管包括具有通道的沟道层和载流子供应层,该沟道层设置在沟道层上,该沟道层包含由式Al x Ga 1-x SUB > N,其中x大于0.04且小于0.45。 通道形成在沟道层和载流子供应层之间的界面附近,或者耗尽,载流子供应层的带隙能量大于沟道层的带隙能量,并且公式A1 x x 随着与界面的距离的增加,Ga 1-x N单调减小。 沟道层可以是氮化镓的结晶。 通道层可以是未掺杂的。 载体供给层的式Al x Ga 1-x N的X在界面处大于或等于0.15且小于或等于0.40。
摘要:
A field-effect transistor which comprises a buffer layer and a barrier layer each of which is made of a Group III nitride compound semiconductor and has a channel at the interface inside of the buffer layer to the barrier layer, wherein the barrier layer has multiple-layer structure comprising an abruct interface providing layer which composes the lowest semiconductor layer in said barrier layer and whose composition varies rapidly at the interface of said buffer layer, and an electrode connection plane providing layer which constructs the uppermost semiconductor layer and whose upper surface is formed flat.
摘要:
A field-effect transistor which comprises a buffer layer and a barrier layer each of which is made of a Group III nitride compound semiconductor and has a channel at the interface inside of the buffer layer to the barrier layer, wherein the barrier layer has multiple-layer structure comprising an abruct interface providing layer which composes the lowest semiconductor layer in said barrier layer and whose composition varies rapidly at the interface of said buffer layer, and an electrode connection plane providing layer which constructs the uppermost semiconductor layer and whose upper surface is formed flat.
摘要:
A semiconductor device having an AlGaN—GaN heterojunction structure including an AlGaN layer and a GaN layer which device exhibits no changes over time in sheet resistance.As shown in FIG. 1, in a semiconductor device having an AlGaN—GaN heterojunction structure including an AlGaN layer 1 and a GaN layer 2, when the Al molar fraction of AlGaN (x %) and the thickness of the AlGaN layer (y nm) satisfy the relations: x+y
摘要翻译:具有包括AlGaN层和GaN层的AlGaN-GaN异质结结构的半导体器件,该器件在薄层电阻上随时间呈现不变化。 如图所示。 如图1所示,在具有包括AlGaN层1和GaN层2的AlGaN-GaN异质结结构的半导体器件中,当AlGaN的Al摩尔分数(x%)和AlGaN层的厚度(ynm)满足以下关系时: x + y <55,25 <= x <= 40,y> = 10,y小于临界厚度,从而在AlGaN层中不产生裂纹。 因此,本发明提供一种半导体器件,尽管Al摩尔分数高,实际上其表面电阻几乎没有随时间变化。
摘要:
Provided is a projection-type image display device which by means of a projection lens (2) magnifies and projects an optical image formed by a light source and an image display element, wherein an error indicator (5) for indicating anomalies in the device is disposed on the rear surface opposite the front surface of a device housing (1) to which the projection lens (2) is attached. The projection-type image display device further includes an AC voltage monitor unit (12) for monitoring voltage waveforms supplied form an external power source and retaining voltage waveform data during the latest prescribed period in a memory, and reads out the voltage waveform data from the external power source retained in the memory and displays the voltage waveform data on the error indicator (5) as said anomalies.