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1.Pnpn semiconductor translating device and method of construction 失效
Title translation: Pnpn半导体平移装置及其施工方法公开(公告)号:US3211971A
公开(公告)日:1965-10-12
申请号:US2538560
申请日:1960-04-28
Applicant: IBM
Inventor: FRED BARSON , GOW D JOHN
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公开(公告)号:US3343049A
公开(公告)日:1967-09-19
申请号:US37606664
申请日:1964-06-18
Applicant: IBM
Inventor: MILLER WILLIAM H , FRED BARSON
IPC: H01L29/73 , H01L21/18 , H01L21/316 , H01L21/331 , H01L21/56 , H01L23/29 , H01L23/31 , H01L29/00 , H01L29/78 , H01L29/94
CPC classification number: H01L23/3157 , H01L21/02129 , H01L21/02164 , H01L21/022 , H01L21/02321 , H01L21/18 , H01L21/31612 , H01L21/56 , H01L23/291 , H01L29/00 , H01L2924/0002 , H01L2924/19041 , Y10S148/043 , Y10S148/053 , Y10S148/062 , Y10S148/118 , H01L2924/00
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3.Combined transistor and testing structures and fabrication thereof 失效
Title translation: 组合晶体管和测试结构及其制造公开(公告)号:US3335340A
公开(公告)日:1967-08-08
申请号:US34683464
申请日:1964-02-24
Applicant: IBM
Inventor: FRED BARSON , MUTTER WALTER E
IPC: G01R31/28 , H01L21/8222 , H01L23/544
CPC classification number: H01L22/34 , G01R31/2884 , H01L21/8222 , H01L2924/3011
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4.Method and apparatus for reverse sputtering selected electrically exposed areas of a cathodically biased workpiece 失效
Title translation: 用于反向溅射阴极偏压工件的选择的电暴露区域的方法和装置公开(公告)号:US3410774A
公开(公告)日:1968-11-12
申请号:US50298665
申请日:1965-10-23
Applicant: IBM
Inventor: FRED BARSON , JOHANN STURM
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公开(公告)号:US3010855A
公开(公告)日:1961-11-28
申请号:US75755258
申请日:1958-08-27
Applicant: IBM
Inventor: FRED BARSON , MILTON GENSER
CPC classification number: H01L29/00 , C30B31/04 , C30B31/06 , H01L21/00 , H01L21/223 , H01L21/24 , H01L29/86 , Y10S438/936 , Y10T428/12528
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