Abstract:
This specification discloses a scheme for regenerating the data in stored-charge storage cells of monolithic memories. The scheme involves the periodic reading out of the data in the storedcharge storage cells and temporarily storing the data in a regeneration cell. Thereafter the data is read out of the regeneration cell and back into the storage cell to complete the regeneration cycle.
Abstract:
A nondestructive read integrated circuit memory having a twodimensional array of insulated-gate field-effect transistor cells. Each cell consists of three transistors, an input isolation transistor, an output isolation transistor and a storage transistor. The cells in the array are interconnected along one dimension by bit sense lines and along a second dimension by Phi 1 and Phi 2 control lines. Only the cells which are selected by the control lines are operative during a read or write cycle, and the remaining cells are isolated from the active cells by means of the unactivated input and output isolation transistors. The input isolation transistor, when activated during a write cycle controls the placement of a charge which represents storage information across the gate to substrate capacitance of the storage transistor. The output isolation transistor, when activated during a read cycle controls the sensing of information stored at the storage transistor.
Abstract:
A planar integrated semiconductor circuit having common emitter transistor elements isolated from each other and from other transistors by the emitter regions which form a PN or rectifying junction with the body of the semiconductor member in which the integrated circuit is formed. In a semiconductor member or body of one type conductivity, a plurality of emitter regions of opposite type conductivity extend from one planar surface of the body. One or more of the emitter regions each have a plurality of discrete base regions of the one type conductivity extending from said planar surface fully enclosed within the emitter region. Each of the base regions in turn has at least one collector region enclosed within it at the planar surface. The emitter region has a higher majority carrier concentration than the majority carrier concentration within its enclosed base regions. The rectifying junction formed by the opposite conductivity emitter region with the one type conductivity semiconductor body serves to isolate the emitter regions from each other.
Abstract:
A planar integrated semiconductor circuit having common emitter transistor elements isolated from each other and from other transistors by the emitter regions which form a PN- or rectifying junction with the body of the semiconductor member in which the integrated circuit is formed. In a semiconductor member or body of one type conductivity, a plurality of emitter regions of opposite type conductivity extend from one planar surface of the body. One or more of the emitter regions each have a plurality of discrete base regions of the one type conductivity extending from said planar surface fully enclosed within the emitter region. Each of the base regions in turn has at least one collector region enclosed within it at the planar surface. The emitter region has a higher majority carrier concentration than the majority carrier concentration within its enclosed base regions. The rectifying junction formed by the opposite conductivity emitter region with the one type conductivity semiconductor body serves to isolate the emitter regions from each other.
Abstract:
Method and means for constructing memory cell circuits, comprising the addition of a single diffusion to an IGFET wafer to form diodes in the drain or source regions of at least one of the FETS in the wafer, thus reducing the number of FETS in the cell and substantially reducing the area occupied by each cell. Three embodiments are disclosed, all using diodes as the input/output components of the cells and, in addition, one uses two diodes as the load, giving an exponential load characteristic, while another combines a diode and FET in the load to give a semiexponential load characteristic.