Abstract:
An apparatus and method for scrubbing spin transfer torque (STT) memory. For example, one embodiment of a apparatus comprises: a memory subsystem including at least one spin transfer torque (STT) memory, the STT memory arranged into one or more entries; and a scrub engine to ensure that the entries of the STT contain valid data, the scrub engine including analysis and processing logic to determine, for each entry, whether a specified scrubbing interval has expired and, if so, then to invalidate the entry or re-fetch data for the entry from a source and, if the scrubbing interval has not expired, then to perform error detection and/or correction on the entry.
Abstract:
An apparatus is described that includes a semiconductor chip memory array having resistive storage cells. The apparatus also includes a comparator to compare a first word to be written into the array against a second word stored in the array at the location targeted by a write operation that will write the first word into the array. The apparatus also includes circuitry to iteratively write to one or more bit locations where a difference exists between the first word and the second word with increasing write current intensity with each successive iteration.
Abstract:
A data processing device is configured to deploy, in response to an intermittent source of power, opportunistic power management strategies to manage harvested energy based on an expected amount of energy available to the data processing device and on expected energy expenditures defined by data processing and memory content control writing performed by the data processing device.
Abstract:
Apparatus, systems, and methods for write operations in spin transfer torque (STT) memory are described. In one embodiment, a memory comprises at least one spin-transfer torque (STT) memory device, temperature sensor proximate the STT memory device and a controller comprising logic, at least partially including hardware logic, to monitor an output of the temperature sensor, implement a first write operation protocol when the output of the temperature sensor fails to exceed a threshold temperature, and implement a second write operation protocol when the output of the temperature sensor exceeds the threshold temperature. Other embodiments are also disclosed and claimed.