Semiconductor test device
    2.
    发明申请
    Semiconductor test device 有权
    半导体测试装置

    公开(公告)号:US20050156622A1

    公开(公告)日:2005-07-21

    申请号:US10512296

    申请日:2003-04-21

    CPC分类号: G01R31/31922

    摘要: A semiconductor test device for acquiring a multiplexed clock signal from LSI output data and using the clock to test the LSI. The device includes a time interpolator 30 and registers 41a to 41n connected in series. The time interpolator has flip-flops 31a to 31n connected in parallel for inputting output data from an LSI 1 to be measured, a delay circuit 32 for successively inputting strobes delayed at a constant timing interval to the flip-flops 31 and outputting time-series level data, and an encoder 34 for inputting the time-series level data output from the flip-flops 31 and encoding it into position data indicating an edge timing. The registers 41a to 41n successively store position data from the encoder 34 and output them at a predetermined timing. The device further includes a digital filter for outputting the position data output from the registers 41 as a recovery clock.

    摘要翻译: 一种用于从LSI输出数据获取多路复用时钟信号并使用时钟测试LSI的半导体测试装置。 该装置包括串联连接的时间插入器30和寄存器41a至41n。 时间插值器具有并联连接的触发器31a至31n,用于输入来自要测量的LSI1的输出数据;延迟电路32,用于将以恒定定时间隔延迟的选通脉冲输入到触发器31,并输出时间 - 系列电平数据,以及编码器34,用于输入从触发器31输出的时间序列电平数据,并将其编码为指示边沿定时的位置数据。 寄存器41a至41n依次存储来自编码器34的位置数据,并以预定的定时输出。 该装置还包括数字滤波器,用于将从寄存器41输出的位置数据作为恢复时钟输出。