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公开(公告)号:US20240314920A1
公开(公告)日:2024-09-19
申请号:US18595907
申请日:2024-03-05
Applicant: MEDIATEK INC.
Inventor: Tso-Ju YI , Chung-Fa LEE
CPC classification number: H05K1/0206 , H05K1/0222 , H05K1/114 , H05K2201/0939 , H05K2201/09509 , H05K2201/10734
Abstract: An electronic system is provided. The electronic system includes a base and a semiconductor device. The base having a device-attach region includes a build-up layer structure, a vertical interconnect structure and a first through via. The vertical interconnect structure and the first through via are formed passing through the build-up layer structure and located in the device-attach region. The vertical interconnect structure includes a buried via and a blind via electrically coupled to the buried via. The first through via is a straight through via. The semiconductor device is mounted on the device-attach region of the base.
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公开(公告)号:US20150115429A1
公开(公告)日:2015-04-30
申请号:US14585575
申请日:2014-12-30
Applicant: MediaTek Inc.
Inventor: Tai-Yu CHEN , Chung-Fa LEE , Wen-Sung HSU , Shih-Chin LIN
IPC: H01L23/373 , H01L23/00 , H01L23/367 , H01L23/498 , H01L23/29 , H01L23/31
CPC classification number: H01L23/3736 , H01L23/293 , H01L23/3107 , H01L23/36 , H01L23/3675 , H01L23/4334 , H01L23/49816 , H01L24/33 , H01L24/73 , H01L2224/32225 , H01L2224/33181 , H01L2224/48095 , H01L2224/48227 , H01L2224/73265 , H01L2924/14 , H01L2924/15311 , H01L2924/181 , H01L2924/351 , H01L2924/00014 , H01L2924/00012 , H01L2924/00
Abstract: A semiconductor package with reduced warpage problem is provided, including: a circuit board, having opposing first and second surfaces; a semiconductor chip, formed over a center portion of the first surface of the circuit board, having a first cross sectional dimension; a spacer, formed over a center portion of the semiconductor chip, having a second cross sectional dimension less than that of the first cross sectional dimension; an encapsulant layer, formed over the circuit board, covering the semiconductor chip and surrounding the spacer; a heat spreading layer, formed over the encapsulant layer and the spacer; and a plurality of solder balls, formed over the second surface of the circuit board, wherein a ratio between the first cross sectional dimension and the second cross sectional dimension is about 1:2-1:6.
Abstract translation: 提供一种具有降低翘曲问题的半导体封装,包括:具有相对的第一和第二表面的电路板; 半导体芯片,形成在电路板的第一表面的中心部分上,具有第一横截面尺寸; 形成在所述半导体芯片的中心部分上的间隔物,具有小于所述第一横截面尺寸的第二截面尺寸; 形成在电路板上的密封剂层,覆盖半导体芯片并围绕间隔物; 形成在密封剂层和间隔物上的散热层; 以及形成在电路板的第二表面上的多个焊球,其中第一横截面尺寸和第二横截面尺寸之间的比率为约1:2-1:6。
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公开(公告)号:US20240304534A1
公开(公告)日:2024-09-12
申请号:US18594573
申请日:2024-03-04
Applicant: MEDIATEK INC.
Inventor: Shu-Wei HSIAO , Chung-Fa LEE
IPC: H01L23/498 , H01L23/00 , H05K1/11 , H05K3/46
CPC classification number: H01L23/49822 , H01L24/32 , H05K1/112 , H05K3/4644 , H01L2224/32225 , H01L2924/1207 , H05K2201/095
Abstract: A substrate structure and a package assembly with the substrate structure are provided. The substrate structure includes a first trace, a second trace, a first through-hole via (THV), a second THV formed in a build-up layer and a bridge trace. The first trace includes a first pad portion and a second pad portion separated from the first pad portion and arranged near a corner of the first pad portion. The first THV passes through the first pad portion and the second THV passes through the second pad portion. The first bridge trace formed in the substrate structure and thermally connected to the second THV and the first THV.
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公开(公告)号:US20130313698A1
公开(公告)日:2013-11-28
申请号:US13896616
申请日:2013-05-17
Applicant: MediaTek Inc.
Inventor: Tai-Yu CHEN , Chung-Fa LEE , Wen-Sung HSU , Shih-Chin LIN
IPC: H01L23/36
CPC classification number: H01L23/3736 , H01L23/293 , H01L23/3107 , H01L23/36 , H01L23/3675 , H01L23/4334 , H01L23/49816 , H01L24/33 , H01L24/73 , H01L2224/32225 , H01L2224/33181 , H01L2224/48095 , H01L2224/48227 , H01L2224/73265 , H01L2924/14 , H01L2924/15311 , H01L2924/181 , H01L2924/351 , H01L2924/00014 , H01L2924/00012 , H01L2924/00
Abstract: A semiconductor package with reduced warpage problem is provided, including: a circuit board, having opposing first and second surfaces; a semiconductor chip, formed over a center portion of the first surface of the circuit board, having a first cross sectional dimension; a spacer, formed over a center portion of the semiconductor chip, having a second cross sectional dimension less than that of the first cross sectional dimension; an encapsulant layer, formed over the circuit board, covering the semiconductor chip and surrounding the spacer; a heat spreading layer, formed over the encapsulant layer and the spacer; and a plurality of solder balls, formed over the second surface of the circuit board.
Abstract translation: 提供一种具有降低翘曲问题的半导体封装,包括:具有相对的第一和第二表面的电路板; 半导体芯片,形成在电路板的第一表面的中心部分上,具有第一横截面尺寸; 形成在所述半导体芯片的中心部分上的间隔物,具有小于所述第一横截面尺寸的第二截面尺寸; 形成在电路板上的密封剂层,覆盖半导体芯片并围绕间隔物; 形成在密封剂层和间隔物上的散热层; 以及形成在电路板的第二表面上的多个焊球。
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