公开(公告)号：US08836117B2

公开(公告)日：2014-09-16

申请号：US13652937

申请日：2012-10-16

Applicant: STMicroelectronics Pte. Ltd

Inventor： Yonggang Jin ,  How Yuan Hwang

IPC: H01L23/498 ,  H01L23/00 ,  H01L21/56

CPC classification number: H01L23/49811 ,  H01L21/56 ,  H01L21/568 ,  H01L23/3128 ,  H01L23/5389 ,  H01L24/19 ,  H01L25/03 ,  H01L25/105 ,  H01L2224/12105 ,  H01L2225/1035 ,  H01L2225/1058 ,  H01L2225/1088 ,  H01L2924/12042 ,  H01L2924/15311 ,  H01L2924/15747 ,  H01L2924/18162 ,  H01L2924/00

Abstract: An electronic device may include a bottom interconnect layer and an integrated circuit (IC) carried by the bottom interconnect layer. The electronic device may further include an encapsulation material on the bottom interconnect layer and laterally surrounding the IC. The electronic device may further include electrically conductive pillars on the bottom interconnect layer extending through the encapsulation material. At least one electrically conductive pillar and adjacent portions of encapsulation material may have a reduced height with respect to adjacent portions of the IC and the encapsulation material and may define at least one contact recess. The at least one contact recess may be spaced inwardly from a periphery of the encapsulation material.

Abstract translation: 电子设备可以包括底部互连层和由底部互连层承载的集成电路（IC）。 电子设备还可以包括底部互连层上的封装材料并横向包围IC。 电子器件还可以包括穿过封装材料的底部互连层上的导电柱。 至少一个导电柱和封装材料的相邻部分可以相对于IC和封装材料的相邻部分具有减小的高度，并且可以限定至少一个接触凹部。 所述至少一个接触凹部可以与所述封装材料的周边向内间隔开。

公开(公告)号：US08822267B2

公开(公告)日：2014-09-02

申请号：US13655036

申请日：2012-10-18

Applicant: STMicroelectronics Pte Ltd.

Inventor： How Yuan Hwang ,  Jay Maghirang ,  Yaohuang Huang ,  Kim-Yong Goh ,  Phone Maw Hla ,  Edmond Soon

IPC: H01L21/00

CPC classification number: H01L21/561 ,  H01L21/568 ,  H01L24/11 ,  H01L24/13 ,  H01L24/17 ,  H01L24/19 ,  H01L24/20 ,  H01L24/81 ,  H01L24/92 ,  H01L24/96 ,  H01L2224/02372 ,  H01L2224/02379 ,  H01L2224/0401 ,  H01L2224/04105 ,  H01L2224/11849 ,  H01L2224/12105 ,  H01L2224/13022 ,  H01L2224/13024 ,  H01L2224/131 ,  H01L2224/16145 ,  H01L2224/16265 ,  H01L2224/17181 ,  H01L2224/81191 ,  H01L2224/81192 ,  H01L2224/8121 ,  H01L2224/8123 ,  H01L2224/81815 ,  H01L2224/9211 ,  H01L2224/96 ,  H01L2924/12042 ,  H01L2924/1461 ,  H01L2924/15788 ,  H01L2924/181 ,  H01L2224/19 ,  H01L2224/81 ,  H01L2924/00014 ,  H01L2224/11 ,  H01L2924/014 ,  H01L2924/00

Abstract: Embodiments of the present disclosure are related to manufacturing system-in-packages at wafer-level. In particular, various embodiments are directed to adhering a first wafer to a second wafer and adhering solder balls to contact pads of the first wafer. In one embodiment, a first wafer having first and second surfaces is provided. The first wafer includes bond pads located on the first surface that are coupled to a respective semiconductor device located in the first wafer. A second wafer having an electrical component located therein is provided. A conductive adhesive is provided on at least one of the first wafer and the second wafer. Conductive balls are provided on the bond pads on the first surface of the first wafer. The conductive balls and the conductive adhesive are heated to cause the conductive balls to adhere to the bond pad and the conductive adhesive to adhere the first wafer to the second wafer.

Abstract translation: 本公开的实施例涉及在晶片级制造系统级封装。 具体地，各种实施例涉及将第一晶片粘附到第二晶片并将焊球粘附到第一晶片的接触焊盘。 在一个实施例中，提供具有第一和第二表面的第一晶片。 第一晶片包括位于第一表面上的接合焊盘，其耦合到位于第一晶片中的相应半导体器件。 提供了具有位于其中的电气部件的第二晶片。 在第一晶片和第二晶片中的至少一个上提供导电粘合剂。 导电球设置在第一晶片的第一表面上的接合焊盘上。 导电球和导电粘合剂被加热以使导电球粘附到接合焊盘和导电粘合剂以将第一晶片粘附到第二晶片。

公开(公告)号：US20150069607A1

公开(公告)日：2015-03-12

申请号：US14548090

申请日：2014-11-19

Applicant: STMicroelectronics Pte Ltd

Inventor： How Yuan Hwang ,  Kah Wee Gan

IPC: H01L23/00 ,  H01L23/31 ,  H01L23/48

CPC classification number: H01L24/14 ,  H01L21/4857 ,  H01L23/3121 ,  H01L23/3128 ,  H01L23/3135 ,  H01L23/3171 ,  H01L23/481 ,  H01L23/49816 ,  H01L23/49827 ,  H01L23/5389 ,  H01L24/18 ,  H01L24/19 ,  H01L24/96 ,  H01L2224/023 ,  H01L2224/04105 ,  H01L2224/12105 ,  H01L2224/13024 ,  H01L2224/13025 ,  H01L2924/14 ,  H01L2924/181 ,  H01L2924/00

Abstract: An integrated circuit package includes an integrated circuit die in a reconstituted substrate. The active side is processed then covered in molding compound while the inactive side is processed. The molding compound on the active side is then partially removed and solder balls are placed on the active side.

Abstract translation: 集成电路封装包括在复原衬底中的集成电路管芯。 然后将活性侧加工成模塑料，同时处理非活性侧。 然后部分地去除活性侧上的模塑料，并且在活性侧上放置焊球。

公开(公告)号：US09318459B2

公开(公告)日：2016-04-19

申请号：US14548090

申请日：2014-11-19

Applicant: STMicroelectronics Pte Ltd

Inventor： How Yuan Hwang ,  Kah Wee Gan

IPC: H01L23/00 ,  H01L23/498 ,  H01L21/48 ,  H01L23/538 ,  H01L23/48 ,  H01L23/31

CPC classification number: H01L24/14 ,  H01L21/4857 ,  H01L23/3121 ,  H01L23/3128 ,  H01L23/3135 ,  H01L23/3171 ,  H01L23/481 ,  H01L23/49816 ,  H01L23/49827 ,  H01L23/5389 ,  H01L24/18 ,  H01L24/19 ,  H01L24/96 ,  H01L2224/023 ,  H01L2224/04105 ,  H01L2224/12105 ,  H01L2224/13024 ,  H01L2224/13025 ,  H01L2924/14 ,  H01L2924/181 ,  H01L2924/00

Abstract: An integrated circuit package includes an integrated circuit die in a reconstituted substrate. The active side is processed then covered in molding compound while the inactive side is processed. The molding compound on the active side is then partially removed and solder balls are placed on the active side.

Abstract translation: 集成电路封装包括在复原衬底中的集成电路管芯。 然后将活性侧加工成模塑料，同时处理非活性侧。 然后部分地去除活性侧上的模塑料，并且在活性侧上放置焊球。

公开(公告)号：US20140113410A1

公开(公告)日：2014-04-24

申请号：US13655036

申请日：2012-10-18

Applicant: STMICROELECTRONICS PTE LTD.

Inventor： How Yuan Hwang ,  Jay Maghirang ,  Yaohuang Huang ,  Kim-Yong Goh ,  Phone Maw Hla ,  Edmond Soon

IPC: H01L21/60

CPC classification number: H01L21/561 ,  H01L21/568 ,  H01L24/11 ,  H01L24/13 ,  H01L24/17 ,  H01L24/19 ,  H01L24/20 ,  H01L24/81 ,  H01L24/92 ,  H01L24/96 ,  H01L2224/02372 ,  H01L2224/02379 ,  H01L2224/0401 ,  H01L2224/04105 ,  H01L2224/11849 ,  H01L2224/12105 ,  H01L2224/13022 ,  H01L2224/13024 ,  H01L2224/131 ,  H01L2224/16145 ,  H01L2224/16265 ,  H01L2224/17181 ,  H01L2224/81191 ,  H01L2224/81192 ,  H01L2224/8121 ,  H01L2224/8123 ,  H01L2224/81815 ,  H01L2224/9211 ,  H01L2224/96 ,  H01L2924/12042 ,  H01L2924/1461 ,  H01L2924/15788 ,  H01L2924/181 ,  H01L2224/19 ,  H01L2224/81 ,  H01L2924/00014 ,  H01L2224/11 ,  H01L2924/014 ,  H01L2924/00

Abstract: Embodiments of the present disclosure are related to manufacturing system-in-packages at wafer-level. In particular, various embodiments are directed to adhering a first wafer to a second wafer and adhering solder balls to contact pads of the first wafer. In one embodiment, a first wafer having first and second surfaces is provided. The first wafer includes bond pads located on the first surface that are coupled to a respective semiconductor device located in the first wafer. A second wafer having an electrical component located therein is provided. A conductive adhesive is provided on at least one of the first wafer and the second wafer. Conductive balls are provided on the bond pads on the first surface of the first wafer. The conductive balls and the conductive adhesive are heated to cause the conductive balls to adhere to the bond pad and the conductive adhesive to adhere the first wafer to the second wafer.

Abstract translation: 本公开的实施例涉及在晶片级制造系统级封装。 具体地，各种实施例涉及将第一晶片粘附到第二晶片并将焊球粘附到第一晶片的接触焊盘。 在一个实施例中，提供具有第一和第二表面的第一晶片。 第一晶片包括位于第一表面上的接合焊盘，其耦合到位于第一晶片中的相应半导体器件。 提供了具有位于其中的电气部件的第二晶片。 在第一晶片和第二晶片中的至少一个上提供导电粘合剂。 导电球设置在第一晶片的第一表面上的接合焊盘上。 导电球和导电粘合剂被加热以使导电球粘附到接合焊盘和导电粘合剂以将第一晶片粘附到第二晶片。