Abstract:
An electronic device includes an electronic component having terminals including a set of first terminals and a set of second terminals, a protective package embedding the electronic component, leads exposed from the protective package including a set of first leads and a set of second leads, for each first lead a first electrical connection inside the protection package between the first lead and a corresponding one of the first terminals, and for each second lead electrical connections inside the protective package each one between the second lead and a corresponding one of the second terminals. For each second lead the electronic component includes test structures, each being coupled between a corresponding one of the second terminals connected to the second lead and a corresponding test one of the first terminals connected to a test one of the first leads.
Abstract:
A solar light concentration photovoltaic conversion system, uses a solar light collector to focus collected light onto a termination of at least one multi-fiber cable. A wavelength splitter is optically coupled to the other termination of the multi-fiber cable for producing light beams of different wavelengths, each illuminating the optical termination of one or more lambda-dedicated tap fibers or multi-fiber cables. From the wavelength splitter depart a number of lambda-dedicated groups of tap fibers adapted to convey the radiation to remotely arranged lambda-specific photovoltaic cells, configured for efficiently converting light energy of the specific wavelength spectrum carried along respective fiber or group of fibers into electrical energy. The lambda-specific photovoltaic cells are formed onto light spreading structures optically coupled to a respective tap fiber or multi-fiber cable, adapted to trap the injected light and convert it into electricity.
Abstract:
An integrated circuit includes a sub-system and a reference sub-system. The reference sub-system is substantially identical to the sub-system but is non-operating by default. The integrated circuit includes a test circuit that obtains a parameter value of the sub-system and a reference parameter from the reference sub-system. The integrated circuit detects deterioration of the sub-system based on the parameter value and the reference parameter. The integrated circuit deactivates the sub-system and activates the reference sub-system responsive to detecting deterioration of the sub-system.