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公开(公告)号:US20240145541A1
公开(公告)日:2024-05-02
申请号:US18313630
申请日:2023-05-08
Applicant: Samsung Electronics Co., Ltd.
Inventor: Da Hye KIM , Jin Bum KIM , Gyeom KIM , Young Kwang KIM , Kyung Bin CHUN
IPC: H01L29/06 , H01L29/423 , H01L29/775 , H01L29/786
CPC classification number: H01L29/0673 , H01L29/42392 , H01L29/775 , H01L29/78696
Abstract: A semiconductor device includes an active pattern including a lower pattern extending in a first direction, and a plurality of sheet patterns spaced apart from the lower pattern in a second direction. The sheet patterns include an uppermost sheet pattern and a plurality of gate structures on the lower pattern and spaced apart from each other in the first direction. Each of the plurality of gate structures includes a gate electrode and a gate insulating film and a source/drain pattern between adjacent ones of the plurality of gate structures. Each of inner gate structures includes a gate electrode and a gate insulating film. A semiconductor liner film includes silicon-germanium, and contacts the gate insulating film of each of the inner gate structures. A portion of the semiconductor liner film protrudes upwardly in the first direction beyond an upper surface of the uppermost sheet pattern.
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公开(公告)号:US20240153991A1
公开(公告)日:2024-05-09
申请号:US18229218
申请日:2023-08-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Gyeom KIM , Da Hye KIM , Young Kwang KIM , Jin Bum KIM , Kyung Bin CHUN
IPC: H01L29/06 , H01L29/417 , H01L29/423 , H01L29/775 , H01L29/786
CPC classification number: H01L29/0673 , H01L29/41733 , H01L29/42392 , H01L29/775 , H01L29/78696
Abstract: A semiconductor device includes: an active pattern including a lower pattern and a plurality of sheet patterns that are spaced apart from the lower pattern; a gate structure disposed on the lower pattern; and a source/drain pattern disposed on the lower pattern, and connected to each of the plurality of sheet patterns, wherein the plurality of sheet patterns include a first sheet pattern and a second sheet pattern. The second sheet pattern is disposed between the first sheet pattern and the lower pattern. A first upper width of an upper surface of the first sheet pattern is greater than a first lower width of a bottom surface of the first sheet pattern, and a second upper width of an upper surface of the second sheet pattern is smaller than a second lower width of a bottom surface of the second sheet pattern.
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公开(公告)号:US20210057317A1
公开(公告)日:2021-02-25
申请号:US16819318
申请日:2020-03-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jung-Ho PARK , Da Hye KIM , Jin-Woo PARK , Jae Gwon JANG
IPC: H01L23/498 , H01L23/31
Abstract: A semiconductor package having a redistribution structure including a first face and a second face and a first semiconductor chip mounted on the first face. The semiconductor package may further include a first redistribution pad exposed from the second face of the redistribution structure and a second redistribution pad exposed from the second face of the redistribution structure. The semiconductor package may further include a first solder ball being in contact with the first redistribution pad and a second solder ball being in contact with the second redistribution pad. In some embodiments, a first distance of the first redistribution pad is smaller than a second distance of the second redistribution pad, the first and second distances are measured with respect to a reference plane that intersects a lower portion of the first solder ball and a lower portion of the second solder ball.
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公开(公告)号:US20210098626A1
公开(公告)日:2021-04-01
申请号:US16910819
申请日:2020-06-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jin Bum KIM , Gyeom KIM , Da Hye KIM , Jae Mun KIM , Il Gyou SHIN , Seung Hun LEE , Kyung In CHOI
IPC: H01L29/78 , H01L29/06 , H01L29/423 , H01L29/786 , H01L21/02 , H01L29/66
Abstract: Example semiconductor devices and methods for fabricating a semiconductor device are disclosed. An example device may include a substrate, a first semiconductor pattern spaced apart from the substrate, a first antioxidant pattern extending along a bottom surface of the first semiconductor pattern and spaced apart from the substrate, and a field insulating film on the substrate. The insulating film may cover at least a part of a side wall of the first semiconductor pattern. The first antioxidant pattern may include a first semiconductor material film doped with a first impurity.
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公开(公告)号:US20220123145A1
公开(公告)日:2022-04-21
申请号:US17565650
申请日:2021-12-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jin Bum KIM , Gyeom KIM , Da Hye KIM , Jae Mun KIM , Il Gyou SHIN , Seung Hun LEE , Kyung In CHOI
IPC: H01L29/78 , H01L29/06 , H01L29/423 , H01L29/786 , H01L29/66 , H01L21/02
Abstract: Example semiconductor devices and methods for fabricating a semiconductor device are disclosed. An example device may include a substrate, a first semiconductor pattern spaced apart from the substrate, a first antioxidant pattern extending along a bottom surface of the first semiconductor pattern and spaced apart from the substrate, and a field insulating film on the substrate. The insulating film may cover at least a part of a side wall of the first semiconductor pattern. The first antioxidant pattern may include a first semiconductor material film doped with a first impurity.
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公开(公告)号:US20210050298A1
公开(公告)日:2021-02-18
申请号:US16874284
申请日:2020-05-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Da Hye KIM , Dong Kyu KIM , Jung-Ho PARK
IPC: H01L23/538 , H01L23/31 , H01L23/00 , H01L25/16 , H01L25/00 , H01L21/683 , H01L21/48 , H01L21/56
Abstract: A method for fabricating a semiconductor package includes forming a release layer on a first carrier substrate. An etch stop layer is formed on the release layer. A first redistribution layer is formed on the etch stop layer and includes a plurality of first wires and a first insulation layer surrounding the plurality of first wires. A first semiconductor chip is formed on the first redistribution layer. A solder ball is formed between the first redistribution layer and the first semiconductor chip. A second carrier substrate is formed on the first semiconductor chip. The first carrier substrate, the release layer, and the etch stop layer are removed. The second carrier substrate is removed.
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公开(公告)号:US20180026924A1
公开(公告)日:2018-01-25
申请号:US15642695
申请日:2017-07-06
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jong Hyun HAN , Da Hye KIM , Bo Keun KIM
CPC classification number: H04L51/046 , A61B5/00 , A61B5/024 , A61B5/681 , H04L51/02 , H04L51/18 , H04L67/18 , H04W4/02
Abstract: An electronic device and method are disclosed herein. The electronic device includes a display, a memory storing biometric information and function information, and a processor. The processor implements the method, including detecting whether a received textual message includes a keyword, when the received textual message includes a predesignated keyword, retrieve particular bio-information corresponding to the keyword from the stored bio-information, and a particular function information from the stored function information, generating one or more textual responses to the received textual message based on the retrieved particular bio-information and the particular function information, and controlling the display to display an answer list including the generated one or more textual responses.
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