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公开(公告)号：US20210359684A1
公开(公告)日：2021-11-18
申请号：US17389148
申请日：2021-07-29
Applicant: Samsung Electronics Co., Ltd.
Inventor： Tongsung KIM , Youngmin JO , Jungjune PARK , Jindo BYUN , Dongho SHIN , Jeongdon IHM
IPC: H03K19/00 , H03K19/0185 , G11C7/10 , G11C8/10 , H03K19/08
Abstract: An impedance calibration circuit includes a first code generation circuit connected to a first reference resistor, and configured to generate a first code for forming a resistance based on the first reference resistor, by using the first reference resistor; a second code generation circuit configured to form a resistance of a second reference resistor less than the resistance of the first reference resistor, based on the first code, and generate a second code by using the second reference resistor; and a target impedance code generation circuit configured to generate a target impedance code based on the first code, the second code, and a target impedance value, and form an impedance having the target impedance value in a termination driver connected to the impedance calibration circuit, based on the target impedance code.
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Patent Agency Ranking
公开(公告)号：US20220103072A1
公开(公告)日：2022-03-31
申请号：US17332436
申请日：2021-05-27
Applicant: Samsung Electronics Co., Ltd.
Inventor： Kwang Chan LEE , Dongho SHIN , Chang Seok CHAE
Abstract: Disclosed is an electronic device, which includes a direct voltage to direct voltage converter, and a controller that receives first current information, second current information, an input voltage, and a feedback voltage from the direct voltage to direct voltage converter, controls the direct voltage to direct voltage converter based on the input voltage in one of a first mode, a second mode, or a third mode, controls the direct voltage to direct voltage converter based on the first current information and an output voltage such that buck conversion is performed in the first mode and the second mode, and controls the direct voltage to direct voltage converter based on the second current information and the output voltage such that boost conversion is performed in the second mode and the third mode.
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公开(公告)号：US20210226613A1
公开(公告)日：2021-07-22
申请号：US17222033
申请日：2021-04-05
Applicant: Samsung Electronics Co., Ltd.
Inventor： Dongho SHIN , Kyungtae KANG , Junha LEE , Tongsung KIM , Jangwoo LEE , Jeongdon IHM , Byunghoon JEONG
Abstract: A method of operating a system including a parameter monitoring circuit and a host, includes generating a first parameter applying a first code to a current parameter, wherein a first offset is applied to the first code; generating a first comparison result by comparing the first parameter with a reference parameter value; generating a second parameter applying a second code to the current parameter, wherein a second offset is applied to the second code; generating a second comparison result by comparing the second parameter with the reference parameter value; detecting an error in the current parameter, based on the first comparison result and the second comparison result; and providing a signal based on the error to the host.
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公开(公告)号：US20210075405A1
公开(公告)日：2021-03-11
申请号：US16861903
申请日：2020-04-29
Applicant: Samsung Electronics Co., Ltd.
Inventor： Dongho SHIN , Kyungtae KANG , Junha LEE , Tongsung KIM , Jangwoo LEE , Jeongdon IHM , Byunghoon JEONG
Abstract: A parameter monitoring circuit includes a code generation circuit configured to generate a first code, to which a first offset is applied, and a second code, to which a second offset is applied; a parameter adjustment circuit configured to generate a first parameter and a second parameter by respectively applying the first code and the second code to a current parameter; a comparator circuit configured to generate a first comparison result and a second comparison result, the first comparison result indicating a comparison result between the first parameter and a reference parameter value, and the second comparison result indicating a comparison result between the second parameter and the reference parameter value; and a parameter error detection circuit configured to detect an error in the current parameter, based on the first comparison result and the second comparison result.
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公开(公告)号：US20230138561A1
公开(公告)日：2023-05-04
申请号：US17938214
申请日：2022-10-05
Applicant: Samsung Electronics Co., Ltd.
Inventor： Dongho SHIN , Jungjune PARK , Kyoungtae KANG , Chiweon YOON , Junha LEE , Byunghoon JEONG
Abstract: An apparatus and method for ZQ calibration, including determining a strong driver circuit and a weak driver circuit, which are related to an input/output (I/O) circuit connected to a signal pin, at power-up of the I/O circuit; providing a ZQ calibration code related to a sweep code to one from among the strong driver circuit and the weak driver circuit according to ZQ calibration conditions; and providing a ZQ calibration code related to a fixed code to an unselected circuit, thereby adjusting a termination resistance of the signal pin.
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公开(公告)号：US20210242870A1
公开(公告)日：2021-08-05
申请号：US17021728
申请日：2020-09-15
Applicant: Samsung Electronics Co., Ltd.
Inventor： Tongsung KIM , Youngmin JO , Jungjune PARK , Jindo BYUN , Dongho SHIN , Jeongdon IHM
IPC: H03K19/00 , H03K19/0185 , H03K19/08 , G11C7/10 , G11C8/10
Abstract: An impedance calibration circuit includes a first code generation circuit connected to a first reference resistor, and configured to generate a first code for forming a resistance based on the first reference resistor, by using the first reference resistor; a second code generation circuit configured to form a resistance of a second reference resistor less than the resistance of the first reference resistor, based on the first code, and generate a second code by using the second reference resistor; and a target impedance code generation circuit configured to generate a target impedance code based on the first code, the second code, and a target impedance value, and form an impedance having the target impedance value in a termination driver connected to the impedance calibration circuit, based on the target impedance code.
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