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公开(公告)号:US20240194243A1
公开(公告)日:2024-06-13
申请号:US18581018
申请日:2024-02-19
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hee-Woong KANG , Dong-Hun KWAK , Jun-Ho SEO , Hee-Won LEE
IPC: G11C11/4074 , G11C7/10 , G11C7/12 , G11C8/12 , G11C11/408 , G11C11/4097 , G11C11/56 , G11C16/04 , G11C16/06 , G11C16/08 , G11C16/10 , G11C16/30 , G11C16/34
CPC classification number: G11C11/4074 , G11C7/109 , G11C7/12 , G11C8/12 , G11C11/4082 , G11C11/4085 , G11C11/4097 , G11C11/5628 , G11C16/0483 , G11C16/06 , G11C16/08 , G11C16/10 , G11C16/30 , G11C16/3436 , G11C2207/2209
Abstract: A nonvolatile memory device includes a memory cell array and a row decoder. The memory cell array includes a plurality of mats. A first cell string of first mat is connected to a plurality of first word-lines, a first bit-line and a first string selection line. A second cell string of second mat is connected to a plurality of second word-lines, a second bit-line and a second string selection line. Each of the first and second cell strings includes a ground selection transistor, memory cells, and a string selection transistor coupled in series. The row decoder applies a first voltage to a third word-line among the plurality of first and second word-lines for a first period of time in a single mat mode and to apply a second voltage to the third word-line for a second period of time longer than the first period of time in a multi-mat mode.
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公开(公告)号:US20230036205A1
公开(公告)日:2023-02-02
申请号:US17958386
申请日:2022-10-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hee-Woong KANG , Dong-Hun KWAK , Jun-Ho SEO , Hee-Won LEE
IPC: G11C11/4074 , G11C7/10 , G11C8/12 , G11C16/08 , G11C11/408 , G11C11/4097 , G11C11/56 , G11C16/04 , G11C16/06 , G11C16/10 , G11C16/30 , G11C16/34 , G11C7/12
Abstract: A nonvolatile memory device includes a memory cell array and a row decoder. The memory cell array includes a plurality of mats. A first cell string of first mat is connected to a plurality of first word-lines, a first bit-line and a first string selection line. A second cell string of second mat is connected to a plurality of second word-lines, a second bit-line and a second string selection line. Each of the first and second cell strings includes a ground selection transistor, memory cells, and a string selection transistor coupled in series. The row decoder applies a first voltage to a third word-line among the plurality of first and second word-lines for a first period of time in a single mat mode and to apply a second voltage to the third word-line for a second period of time longer than the first period of time in a multi-mat mode.
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公开(公告)号:US20200372945A1
公开(公告)日:2020-11-26
申请号:US16991693
申请日:2020-08-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hee-Woong KANG , Dong-Hun KWAK , Jun-Ho SEO , Hee-Won LEE
IPC: G11C11/4074 , G11C7/12 , G11C7/10 , G11C8/12 , G11C16/08 , G11C11/408 , G11C11/4097 , G11C11/56 , G11C16/04 , G11C16/06 , G11C16/10 , G11C16/30 , G11C16/34
Abstract: A nonvolatile memory device includes a memory cell array and a row decoder. The memory cell array includes a plurality of mats. A first cell string of first mat is connected to a plurality of first word-lines, a first bit-line and a first string selection line. A second cell string of second mat is connected to a plurality of second word-lines, a second bit-line and a second string selection line. Each of the first and second cell strings includes a ground selection transistor, memory cells, and a string selection transistor coupled in series. The row decoder applies a first voltage to a third word-line among the plurality of first and second word-lines for a first period of time in a single mat mode and to apply a second voltage to the third word-line for a second period of time longer than the first period of time in a multi-mat mode.
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公开(公告)号:US20200075078A1
公开(公告)日:2020-03-05
申请号:US16675331
申请日:2019-11-06
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dong-Hun KWAK , Hee-Woong KANG , Jun-Ho SEO , Hee-Won LEE
IPC: G11C11/4074 , G11C7/12 , G11C7/10 , G11C8/12 , G11C16/08 , G11C11/408 , G11C11/4097 , G11C11/56 , G11C16/04 , G11C16/06 , G11C16/10 , G11C16/30 , G11C16/34
Abstract: A nonvolatile memory device includes a memory cell array, a voltage generator, a page buffer circuit, a row decoder and a control circuit. The memory cell array includes a plurality of mats corresponding to different bit-lines. The voltage generator generates word-line voltages applied to the memory cell array. The page buffer circuit is coupled to the memory cell array through bit-lines. The row decoder is coupled to the memory cell array through word-lines, and the row decoder transfers the word-line voltages to the memory cell array. The control circuit controls the voltage generator, the row decoder and the page buffer circuit based on a command and an address. The control circuit selects a voltage between different voltages to apply the selected different voltages to at least one of the word-lines or at least one of the bit-lines according to a number of mats of the plurality mats, which operate simultaneously.
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公开(公告)号:US20210272617A1
公开(公告)日:2021-09-02
申请号:US17321393
申请日:2021-05-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hee-Woong KANG , Dong-Hun KWAK , Jun-Ho SEO , Hee-Won LEE
IPC: G11C11/4074 , G11C7/10 , G11C8/12 , G11C16/08 , G11C11/408 , G11C11/4097 , G11C11/56 , G11C16/04 , G11C16/06 , G11C16/10 , G11C16/30 , G11C16/34 , G11C7/12
Abstract: A nonvolatile memory device includes a memory cell array and a row decoder. The memory cell array includes a plurality of mats. A first cell string of first mat is connected to a plurality of first word-lines, a first bit-line and a first string selection line. A second cell string of second mat is connected to a plurality of second word-lines, a second bit-line and a second string selection line. Each of the first and second cell strings includes a ground selection transistor, memory cells, and a string selection transistor coupled in series. The row decoder applies a first voltage to a third word-line among the plurality of first and second word-lines for a first period of time in a single mat mode and to apply a second voltage to the third word-line for a second period of time longer than the first period of time in a multi-mat mode.
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公开(公告)号:US20200219552A1
公开(公告)日:2020-07-09
申请号:US16817951
申请日:2020-03-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dong-Hun KWAK , Hee-Woong KANG , Jun-Ho SEO , Hee-Won LEE
IPC: G11C11/4074 , G11C16/34 , G11C16/30 , G11C16/10 , G11C16/06 , G11C16/04 , G11C11/56 , G11C11/4097 , G11C11/408 , G11C16/08 , G11C8/12 , G11C7/10 , G11C7/12
Abstract: A nonvolatile memory device includes a memory cell array, a voltage generator, a page buffer circuit, a row decoder and a control circuit. The memory cell array includes a plurality of mats corresponding to different bit-lines. The voltage generator generates word-line voltages applied to the memory cell array. The page buffer circuit is coupled to the memory cell array through bit-lines. The row decoder is coupled to the memory cell array through word-lines, and the row decoder transfers the word-line voltages to the memory cell array. The control circuit controls the voltage generator, the row decoder and the page buffer circuit based on a command and an address. The control circuit selects a voltage between different voltages to apply the selected different voltages to at least one of the word-lines or at least one of the bit-lines according to a number of mats of the plurality mats, which operate simultaneously.
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公开(公告)号:US20190074048A1
公开(公告)日:2019-03-07
申请号:US16183315
申请日:2018-11-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dong-Hun KWAK , Hee-Woong KANG , Jun-Ho SEO , Hee-Won LEE
IPC: G11C11/4074 , G11C7/12 , G11C8/12 , G11C7/10 , G11C16/04 , G11C11/56 , G11C16/34 , G11C16/10 , G11C16/30 , G11C11/408 , G11C11/4097 , G11C16/06 , G11C16/08
Abstract: A nonvolatile memory device includes a memory cell array, a voltage generator, a page buffer circuit, a row decoder and a control circuit. The memory cell array includes a plurality of mats corresponding to different bit-lines. The voltage generator generates word-line voltages applied to the memory cell array. The page buffer circuit is coupled to the memory cell array through bit-lines. The row decoder is coupled to the memory cell array through word-lines, and the row decoder transfers the word-line voltages to the memory cell array. The control circuit controls the voltage generator, the row decoder and the page buffer circuit based on a command and an address. The control circuit selects a voltage between different voltages to apply the selected different voltages to at least one of the word-lines or at least one of the bit-lines according to a number of mats of the plurality mats, which operate simultaneously.
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