Abstract:
According to example embodiments, a semiconductor material may include zinc, nitrogen, and fluorine. The semiconductor material may further include oxygen. The semiconductor material may include a compound. For example, the semiconductor material may include zinc fluorooxynitride. The semiconductor material may include zinc oxynitride containing fluorine. The semiconductor material may include zinc fluoronitride. The semiconductor material may be applied as a channel material of a thin film transistor (TFT).
Abstract:
According to example embodiments, a thin film transistor (TFT) includes a channel layer including zinc, nitrogen, and oxygen; an etch stop layer on the channel layer; source and drain electrodes respectively contacting both ends of the channel layer; a gate electrode corresponding to the channel layer; and a gate insulating layer between the channel layer and the gate electrode. The etch stop layer includes fluorine. The channel layer may be on the gate electrode.
Abstract:
A display device is disclosed. The display device includes a display including a backlight comprising a plurality of light sources and a display panel and configured to display a background image including a preset object, a sensor disposed at an outer part of the display and configured to sense an external lighting environment and a processor configured to determine a direction of a lighting based on the sensed lighting environment, to display a shadow object for the preset object at a position corresponding to the determined lighting direction, and to adjust a brightness of a light source corresponding to a position of the shadow object from among the plurality of light sources based on the sensed lighting environment.
Abstract:
A transistor includes a channel layer including an oxynitride semiconductor doped with at least one of hafnium (Hf) and zirconium (Zr), a source on one side portion of the channel layer and a drain on another side portion of the channel layer, a gate corresponding to the channel layer, and a gate insulation layer between the channel layer and the gate.
Abstract:
An electronic apparatus and a controlling method thereof. The electronic apparatus includes a display; an outer frame to house the display; an illuminance sensor which detects a sensing value used to determine at least one of illuminance and color temperature of an external light; a memory which stores a background image, which is an image of an area behind the electronic apparatus; and a processor, which generates a content screen comprising an object layer including at least one graphic object and a background image layer including the background image. The display displays the content screen and the processor may correct the background image or provide an image effect based on the sensed values.
Abstract:
According to example embodiments, a semiconductor material may include zinc, nitrogen, and fluorine. The semiconductor material may further include oxygen. The semiconductor material may include a compound. For example, the semiconductor material may include zinc fluorooxynitride. The semiconductor material may include zinc oxynitride containing fluorine. The semiconductor material may include zinc fluoronitride. The semiconductor material may be applied as a channel material of a thin film transistor (TFT).
Abstract:
A display device is disclosed. The display device includes a display including a backlight comprising a plurality of light sources and a display panel and configured to display a background image including a preset object, a sensor disposed at an outer part of the display and configured to sense an external lighting environment and a processor configured to determine a direction of a lighting based on the sensed lighting environment, to display a shadow object for the preset object at a position corresponding to the determined lighting direction, and to adjust a brightness of a light source corresponding to a position of the shadow object from among the plurality of light sources based on the sensed lighting environment.
Abstract:
According to example embodiments, a transistor may include a gate electrode, a gate insulating layer, and a channel layer stacked on each other; and a source electrode and a drain electrode contacting first and second regions of the channel layer, respectively. The channel layer may include metal oxynitride. The first and second regions of the channel layer may be treated with a plasma containing hydrogen, and the first and second regions have a higher carrier concentration than a carrier concentration of a remaining region of the channel layer. The first and second regions of the channel layer may have a lower oxygen concentration and a higher nitrogen concentration than that of the remaining region thereof. The metal oxynitride of the channel layer may include a zinc oxynitride (ZnON)-based semiconductor.
Abstract:
Transistors having sulfur-doped zinc oxynitride channel layers, and methods of manufacturing the same, include a ZnON channel layer with sulfur content ratio with respect to a zinc content of from about 0.1 at % to about 1.2 at %, a source electrode and a drain electrode respectively formed on a first region and a second region of the channel layer, a gate electrode corresponding to the channel layer, and a gate insulation layer between the channel layer and the gate electrode.