Abstract:
Disclosed are a high density CIS thin film and a method of manufacturing the same, which includes coating CIS nanopowders, CIGS nanopowders or CZTS nanopowders on a substrate by non-vacuum coating, followed by heat treatment with cavities between the nanopowders filled with filling elements such as copper, indium, gallium, zinc, tin, and the like. The high density CIS thin film is applied to a photo-absorption layer of a thin film solar cell, thereby providing a highly efficient thin film solar cell.
Abstract:
Provided is a memory card device. The memory card device includes a flash memory and a controller. The flash memory includes a boot area storing boot data, and a user area storing user data. The controller accesses the boot area or the user area according to an external command. Boot data can be stored in a memory card integrated in an electronic device. Also, when a host requests an access to boot data/user data stored in the memory card, the boot data/user data can be accessed under control of the controller.
Abstract:
Methods and memory systems are provided that detect bit errors due to read disturbances. A main page of a flash memory in a memory system is read. A bit error in data that is read from the main page is detected and corrected. In parallel with reading the main page, a bit error is detected in data that is read from a dummy page of the flash memory.
Abstract:
A method of performing a write operation in a nonvolatile memory device comprises storing write data in a log block used to update a data block, determining whether a write pattern stored in the log block is a sequential write pattern or a random write pattern, and selecting a new data block for storing merged data in the data block and the log block. The new data block is determined to be a single-level cell block or a multi-level cell block according to the determined write pattern.
Abstract:
A flash memory device and method of programming a flash memory device which include an array of memory cells arranged in rows and columns. A method includes programming memory cells of a selected row with loaded data; determining whether the memory cells of the selected row are successfully programmed; when the judgment result is determined as a unsuccessful program operation, determining a reprogram operation according to flag information indicating an on/off state of the reprogram operation stored in the flash memory device; and when the flag information indicates an on state of the reprogram information, reprogramming the loaded data to memory cells of a different row from the selected row.
Abstract:
Semiconductor memory devices are provided that comprise unit memory cells. The unit memory cells include a first planar transistor in a semiconductor substrate, a vertical transistor disposed on the first planar transistor and a second planar transistor in series with the first planar transistor. The first planar transistor and the second planar transistor may have different threshold voltages. The semiconductor memory device may further include word lines. One of these word lines may form the gate of the second planar transistor a unit memory cell.
Abstract:
Methods and memory systems are provided that can detect bit errors due to read disturbances. A main page of a flash memory in a memory system is read. A bit error in data that is read from the main page is detected and corrected. In parallel with reading the main page, a bit error is detected in data that is read from a dummy page of the flash memory.
Abstract:
A method of performing a write operation in a nonvolatile memory device comprises storing write data in a log block used to update a data block, determining whether a write pattern stored in the log block is a sequential write pattern or a random write pattern, and selecting a new data block for storing merged data in the data block and the log block. The new data block is determined to be a single-level cell block or a multi-level cell block according to the determined write pattern.
Abstract:
Methods and memory systems are provided that can detect bit errors due to read disturbances. A main page of a flash memory in a memory system is read. A bit error in data that is read from the main page is detected and corrected. In parallel with reading the main page, a bit error is detected in data that is read from a dummy page of the flash memory.
Abstract:
A display device for controlling light intensity is provided. The display device has a pair of glass substrates disposed in parallel so as to face each other, and first and second transparent electrodes each arranged as stripes on the inner surfaces of the glass substrates, respectively, and extend orthogonally to each other and to which voltages are applied. A dielectric layer is disposed between the first transparent electrode and the second transparent electrode. The intensity of light transmitting the display device is controlled by controlling the density of electrons charged in part of at least one of the first and second transparent electrodes according to the applied voltage and thus reflecting light incident on the electrodes in which the electrons are charged.