摘要:
A high speed serial link structure and method are provided, comprising a data driver and a replica driver structure, the replica driver structure comprising a replica driver, a calibration engine and a peak level detector. The calibration engine compares a peak level detector output to a reference value and responsively performs a data driver adjustment, wherein the data driver adjustment comprises at least one of a driver biasing adjustment, a driver intermediate stage bandwidth adjustment and a driver equalization setting adjustment. In some embodiments, the calibration engine incorporates a comparator and a digital state machine; in other embodiments, it incorporates an analog operational amplifier.
摘要:
A method for manufacturing a calibration device for an active circuit on a chip, comprises: providing an active circuit that is capable of exhibiting a desired electrical characteristic; and providing a calibration mechanism on-chip with the active circuit. The calibration mechanism generates a control output and comprises a device under test (DUT) configured as a replica of at least one segment of the active circuit, and which generates a test output that causes finite adjustments to the control output, based on a comparison of the electrical characteristics exhibited by the DUT with a known electrical characteristic. The method further comprises: attaching to each control input terminal of the active circuit a corresponding control output from the calibration mechanism. The control output of the calibration mechanism dynamically adjusts control input applied to devices of the active circuit to force the active circuit to exhibit the desired electrical characteristic.
摘要:
A high speed serial data communication system includes provisions for the correction of equalization errors, particularly those errors introduced by equalizer non-idealities. The equalization is achieved at the data transmitter, and is based on dynamic current subtraction at the output of a differential pair. When bit time>0, the error current is removed or subtracted from the total driver current, thereby maintaining a constant total current from bit time 0 to bit time>0. The same result can also be achieved by subtracting current when bit time>0 using field effect transistors of the opposite gender. The error current can be determined empirically from simulation or through feedback using a replica of the driver. The circuits for achieving equalization error correction and the resulting electrical network analysis are shown and described.
摘要:
A high speed serial link method is provided, using a data driver and a replica driver structure, the replica driver structure comprising a replica driver, a calibration engine and a peak level detector. The calibration engine compares a peak level detector output to a reference value and responsively performs a data driver adjustment, wherein the data driver adjustment comprises at least one of a driver biasing adjustment, a driver intermediate stage bandwidth adjustment and a driver equalization setting adjustment. In some embodiments, the calibration engine incorporates a comparator and a digital state machine; in other embodiments, it incorporates an analog operational amplifier.
摘要:
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are turned on. The impedance value is added to a series-connected resistor to provide the output impedance. The DUT consists of one branch of parallel transistors in series with a resistor. Output impedance of the DUT is compared to the resistance of a reference resistor, and the comparator provides a control signal based on whether the output impedance falls within the pre-set percentage variance of the reference resistance. The control signal is processed by a FSM (finite state machine) that individually turns on or off the transistors within the parallel branch until the DUT impedance value falls within the desired range.
摘要:
A circuit design method and transmitter that enables flexible control of amplitude, pre-emphasis, and slew rate utilizing a design of a segmented self-series terminated (SSST) transmitter having a parallel configuration of multiple, individually controllable segments of dual pull-up and pull-down transistors. Amplitude control, slew rate control and pre-emphasis control are enabled by manipulation/selection of normal or inverted inputs for the various segments. Also provided is a mechanism for providing/maintaining accurate output across a self-series terminated (SST) transmitter by regulating the supply voltage. Regulation of the supply voltage allows compatibility with conventional serial link receiver termination voltages and protects the transmitter output devices when those voltages are larger than the normal supply for the devices.
摘要:
Aspects of saving power in a serial link transmitter are described. The aspects include providing a parallel arrangement of segments, each segment comprising prebuffer and output stage circuitry of the serial link transmitter and each segment enabled independently to achieve multiple power levels and multiple levels of pre-emphasis while maintaining a substantially constant propagation delay in a signal path of the serial link transmitter. Further aspects include providing a bypass path in the prebuffer stage circuitry to implement a controllable idle state in the segments and tail current and resistive load elements in the prebuffer circuitry as sectioned portions for slew rate control capability. Also included is provision of a control element with pre-emphasis delay circuitry in the transmitter signal path to allow inversion of a last delayed bit of the pre-emphasis delay circuitry to achieve a polarity change of a pre-emphasis weight.
摘要:
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are turned on. The impedance value is added to a series-connected resistor to provide the output impedance. The DUT consists of one branch of parallel transistors in series with a resistor. Output impedance of the DUT is compared to the resistance of a reference resistor, and the comparator provides a control signal based on whether the output impedance falls within the pre-set percentage variance of the reference resistance. The control signal is processed by a FSM (finite state machine) that individually turns on or off the transistors within the parallel branch until the DUT impedance value falls within the desired range.
摘要:
A high speed serial link structure and method are provided, comprising a data driver and a replica driver structure, the replica driver structure comprising a replica driver, a calibration engine and a peak level detector. The calibration engine compares a peak level detector output to a reference value and responsively performs a data driver adjustment, wherein the data driver adjustment comprises at least one of a driver biasing adjustment, a driver intermediate stage bandwidth adjustment and a driver equalization setting adjustment. In some embodiments, the calibration engine incorporates a comparator and a digital state machine; in other embodiments, it incorporates an analog operational amplifier.
摘要:
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST) serial link transmitter, in which two branches of parallel transistors each provide an impedance value when particular transistors of the parallel branch are turned on. The impedance value is added to a series-connected resistor to provide the output impedance. The DUT consists of one branch of parallel transistors in series with a resistor. Output impedance of the DUT is compared to the resistance of a reference resistor, and the comparator provides a control signal based on whether the output impedance falls within the pre-set percentage variance of the reference resistance. The control signal is processed by a FSM (finite state machine) that individually turns on or off the transistors within the parallel branch until the DUT impedance value falls within the desired range.