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公开(公告)号：US11041884B2
公开(公告)日：2021-06-22
申请号：US16450921
申请日：2019-06-24
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman
Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
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公开(公告)号：US20200256893A1
公开(公告)日：2020-08-13
申请号：US16788176
申请日：2020-02-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.
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公开(公告)号：US09194888B2
公开(公告)日：2015-11-24
申请号：US13649303
申请日：2012-10-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
CPC classification number: G01R1/06788 , G01R1/06766 , G01R1/06794 , G01R31/024 , G01R31/026
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
Abstract translation: 测试系统可以包括适于耦合在测试测量设备和被测设备（DUT）之间的探头。 探头可以包括用于从DUT接收有效信号的信号输入和用于向测试测量装置提供有源信号的信号输出。 探头还可以包括一个连接到DUT地的输入接地和一个连接到测试测量设备地的输出地。 探头接地连接检查装置可以自动确定探头接地与DUT接地和测试测量设备接地是否牢固。
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公开(公告)号：US20210263076A1
公开(公告)日：2021-08-26
申请号：US17317841
申请日：2021-05-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.
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公开(公告)号：US20210063488A1
公开(公告)日：2021-03-04
申请号：US17000491
申请日：2020-08-24
Applicant: Tektronix, Inc.
Inventor： Barton T. Hickman
IPC: G01R31/3183 , G01K3/00 , G01K1/02 , G01K3/08
Abstract: A test and measurement instrument including a user interface configured to receive instructions to perform a signal path calibration for a user-specific setting from a user; a memory configured to store signal path calibration data; and one or more processors that can determine an actual signal path hardware setting for the user-specific setting, determine an adjustment to adjust the actual signal path hardware setting to the user-specific setting, adjust the actual signal path hardware setting by the adjustment to accurately represent the user-specific setting, and store the user-specific setting and the adjusted signal path hardware setting in the signal path calibration data.
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Patent Agency Ranking
6.发明授权Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing 有权用于测试和测量仪器的校准，包括使用谐波混合的异步时间交错数字化仪公开(公告)号：US09568503B2
公开(公告)日：2017-02-14
申请号：US14971727
申请日：2015-12-16
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman
CPC classification number: G01R13/0272 , H03M1/06 , H03M1/1009 , H03M1/121
Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
Abstract translation: 测试和测量仪器包括耦合到可编程滤波器的系数存储设备。 系数存储设施被配置为存储至少两个预定的滤波器系数组，并且被配置为基于使用补偿振荡器导出的测量将所选择的至少两个预定滤波器系数组中的一个传送到滤波器。 测量可能包括时钟延迟和时钟偏移。 在一些示例中，除了选择适当的滤波器系数之外，测试和测量仪器还可以另外调节时钟延迟和/或时钟偏移。
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7.发明申请CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRONOUS TIME-INTERLEAVED DIGITIZER USING HARMONIC MIXING 有权用于测试和测量仪器的校准，包括使用谐波混合的异步时间互换数字化仪公开(公告)号：US20160216295A1
公开(公告)日：2016-07-28
申请号：US14971727
申请日：2015-12-16
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman
CPC classification number: G01R13/0272 , H03M1/06 , H03M1/1009 , H03M1/121
Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
Abstract translation: 测试和测量仪器包括耦合到可编程滤波器的系数存储设备。 系数存储设施被配置为存储至少两个预定的滤波器系数组，并且被配置为基于使用补偿振荡器导出的测量将所选择的至少两个预定滤波器系数组中的一个传送到滤波器。 测量可能包括时钟延迟和时钟偏移。 在一些示例中，除了选择适当的滤波器系数之外，测试和测量仪器还可以另外调节时钟延迟和/或时钟偏移。
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公开(公告)号：US11619657B2
公开(公告)日：2023-04-04
申请号：US17099701
申请日：2020-11-16
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Josiah A. Bartlett , Amr Haj-Omar , Donald J. Dalebroux , Barton T. Hickman , Alexander Krauska
Abstract: An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.
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公开(公告)号：US11454651B2
公开(公告)日：2022-09-27
申请号：US17114468
申请日：2020-12-07
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
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公开(公告)号：US11002764B2
公开(公告)日：2021-05-11
申请号：US16788176
申请日：2020-02-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.
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