摘要:
A method and an integrated circuit for performing a soft program after erase provides efficient convergence of over-erased floating gate memory cells disposed in bit lines. The soft program is applied to successive subject bit lines. The BLISP method includes selection of a selected bit line and applying the soft program to a subject bit line corresponding to the selected bit line. For integrated circuits having no defective bit lines, the subject bit lines comprise the selected bit lines. The BLISP method is adapted for low current consumption compared to bulk soft programming methods. In some embodiments, the integrated circuit includes defective bit lines. For these integrated circuits, the selection of the selected bit line includes indicating a bit line type corresponding to the selected bit line. The defective bit lines are logically replaced by redundant bit lines so that the soft program is applied to conforming selected bit lines and redundant bit lines corresponding to defective bit lines. The defective bit lines in the first memory array can be disabled during the soft program and replaced by corresponding redundant bit lines disposed in the second memory array, so that the soft program is not applied to the defective bit lines. By preventing application of the soft program to the defective bit lines, the BLISP method avoids consumption of excessive current that would otherwise be consumed by very low threshold voltage memory cells disposed on the defective bit lines. The excessive current would render the soft program method much less efficient.
摘要:
The present invention provides a new memory device for storage of boot code for microprocessors which boot to either the top or bottom of a memory map on power-up. The device includes a memory array, a first block, and decoders. The first block is defined as rows of the memory array designated for storage of data. The decoders decode a memory access requested for the data. The memory access request may be in either one of a top-down or bottom-up address protocol. In another embodiment, an integrated circuit memory includes: a memory array, a decoder, a control, and a logic gate. The decoders decode a memory access request to select a row of memory array. The control has an output for outputting either a bottom-up or a top-down address protocol signal. The logic gate outputs a logical "Exclusive Or" of the control signal and a corresponding bit of the memory access request, whereby a memory request in a bottom-up address protocol is converted to a memory address in a top-down address protocol.
摘要:
A system for programming arrays of floating gate memory cells reduces programming current requirements, and reduces wordline and bitline stress during programming. A word-to-be-programmed into a floating gate memory array is divided into a plurality of smaller subwords. Only one subword is programmed at a time, thereby reducing programming current requirements. Additionally, subwords which are successfully programmed are not reprogrammed even if bits in other subwords do not program properly. This creates less wordline stress than previous systems which program an entire word at once, thereby requiring subwords which program successfully to be reprogrammed along with subwords which fail to program. Finally, within each subword only those bits which failed to program are reprogrammed, thereby reducing bitline stress during reprogramming for those bits which were successfully programmed.
摘要:
A circuit is provided for applying a negative voltage to the control gate of a floating gate memory cell and a positive voltage to the source drain or channel which comprises a positive voltage source to provide a positive voltage to the source of the cell, and a negative voltage source responsive to the supply voltage to provide a negative voltage to the control gate. A voltage regulator is included that is coupled to the negative voltage source and to the positive voltage source to maintain the negative voltage at a level responsive to the source voltage. The regulator maintains the negative voltage in response to the source voltage so that the electric field remains essentially constant over a range of values of source voltage.
摘要:
The negative supply voltage and isolation well bias used by the drivers during sector or chip level erase operations are decoded separately from each other and from the decoding of the inputs of the individual wordline drivers in a compact wordline driver and decoder system. An integrated circuit memory comprising an array of memory cells arranged in a plurality of segments, a set of wordlines is coupled to the memory cells in the array, and wordline driver circuitry using shared isolation well MOS transistors coupled to the set of wordlines is provided. The wordline driver circuitry includes a first supply voltage source, a second supply voltage source, a third supply voltage source for the shared isolation well and a set of wordline drivers. The wordline drivers are coupled to the first, second and third supply voltage sources, and selectively drive wordlines in the set of wordlines with a wordline voltage from either the first supply voltage source or the second supply voltage source in response to address signals which identify the respective drivers. The second supply voltage source includes a set of supply voltage selectors. Each supply voltage selector in the set is coupled with a subset of the set of drivers. The subset of drivers is coupled with a respective segment in the array. The supply voltage selectors select a negative erase supply voltage or an erase inhibit supply voltage during an erase mode in response to address signals identifying the respective segments. The selected negative erase supply voltage or erase inhibit supply voltage is applied to the subsets of the set of drivers which are coupled to the respective segment on a segment by segment basis.
摘要:
The negative supply voltage used by the drivers during sector or chip level erase operations is decoded separately from the decoding of the inputs of the individual wordline drivers in a compact wordline driver and decoder system. An integrated circuit memory comprising an array of memory cells arranged in a plurality of segments, a set of wordlines is coupled to the memory cells in the array, and wordline driver circuitry coupled to the set of wordlines is provided. The wordline driver circuitry includes a first supply voltage source, a second supply voltage source, and a set of wordline drivers. The wordline drivers are coupled to the first and second supply voltage sources, and selectively drive wordlines in the set of wordlines with a wordline voltage from either the first supply voltage source or the second supply voltage source in response to address signals which identify the respective drivers. The second supply voltage source includes a set of supply voltage selectors. Each supply voltage selector in the set is coupled with a subset of the set of drivers. The subset of drivers is coupled with a respective segment in the array. The supply voltage selectors select a negative erase supply voltage or an erase inhibit supply voltage during an erase mode in response to address signals identifying the respective segments. The selected negative erase supply voltage or erase inhibit supply voltage is applied to the subsets of the set of drivers which are coupled to the respective segment on a segment by segment basis.
摘要:
A recovery circuit for recovering the control gate and the channel well of a floating gate memory cell to a first recovery potential and a second recovery potential respectively after a program or erase process has been performed on the cell is provided. The floating gate memory cell may include the control gate coupled to a first node at a first program/erase potential, a floating gate, the channel well coupled to a second node at a second program/erase potential having a first conductivity type, and drain and source regions within the channel well having a second conductivity type different from the first. The recovery circuit includes control circuitry that provides a recovery control signal indicating when the program or erase process has been completed, and a coupling circuit that connects the control gate to the channel well in response to the recovery control signal. The recovery circuit further includes first and second voltage detectors that generate first and second grounding signals when the control gate and channel well voltages reach a first and second switching voltage respectively. The first and second grounding signals are provided to first and second voltage grounding circuits that bias the control gate and the channel well to the first and second recovery potentials respectively in response to the grounding signals. In one embodiment the first and second recovery potentials are connected to a node at ground potential, and in another embodiment the first conductivity type is p-type. In a further embodiment the floating gate memory cell is a triple well transistor, the channel well of which is within an isolation well on the substrate of an integrated circuit.
摘要:
A circuit is provided for supplying a negative erasing voltage onto the wordlines of selected blocks in an array of floating gate memory cells. The circuit includes a voltage circuit, which has a plurality of local outputs, each of which connects to wordlines of an associated block of floating gate memory cells. A block selector circuit is coupled to the local outputs of the voltage circuit and selectively switches each of the local outputs to apply either an erasing voltage or a non-erasing voltage onto the wordlines of the associated block of floating gate memory cells. Negative wordline stress is thus reduced for wordlines of unselected blocks which receive a less negative, non-erasing voltage during block erase operations.
摘要:
A circuit generates a power on reset signal in response to the changing of a supply potential across a supply node and a reference node from a power down level to a power on level. The circuit comprises a capacitor having a first terminal coupled to the supply node and a second terminal. An output driver, such as an inverter, is coupled between the supply node and the reference node. The output driver has an output coupled to the second terminal of the capacitor. An input driver comprises a circuit which drives the input of the output driver to a level which tracks changes in the supply potential. A clamp transistor, such as a n-channel MOS transistor having a lower threshold than normal transistors in the circuit, is coupled between the input of the output driver and the supply potential. The clamp transistor clamps the input of the output driver to a driver ready level which is below the trip point of the output driver when the supply potential is at a power down level. In addition, a feedback transistor is included, which has a gate coupled to the output of the output driver, a drain coupled to the input of the output driver, and a source coupled to the supply node. The feedback transistor pulls the input of the output driver to a driver off level above the trip point of the output driver.
摘要:
Substantial reduction in peak current encountered during an erase process for a flash memory device is achieved by selection of source voltage potential during the erase according to the expected band-to-band tunneling current encountered during the process. During the beginning of the process, a lower source voltage potential is selected, which is high enough to cause significant erasing while suppressing band-to-band tunneling current in a portion of the array, and during a second part of the erasing process, a higher source potential is utilized, which ensures successful erasing of the array, without exceeding the peak current requirements of the power supply used with the device. The first and second parts of the erase sequence will induce band-to-band tunneling current in addition to Fowler-Nordheim tunneling current. The band-to-band tunneling current is characterized by a turn on threshold source potential which is inversely related to the threshold of the cell receiving the voltage sequence. The source voltage used in the first part of the erase sequence is set at level that is near or above the turn on threshold source potential for higher threshold cells that are in the high threshold state, but less than the turn on threshold source potential for lower threshold cells in the high threshold state. The source potential in the second part is set at level which is near or above the turn on threshold source potential for lower threshold cells in the high threshold state.