公开(公告)号：US11585854B1

公开(公告)日：2023-02-21

申请号：US16108596

申请日：2018-08-22

Applicant: Xilinx, Inc.

Inventor： Da Cheng ,  Nui Chong ,  Amitava Majumdar ,  Ping-Chin Yeh ,  Cheang-Whang Chang

IPC: G01R31/319 ,  G01R31/3185 ,  G01R31/317 ,  G01R31/28 ,  H03K3/03 ,  G06F13/42 ,  H03L7/099 ,  H03K19/00 ,  G06F1/324 ,  G06F1/3206 ,  H03K19/17784 ,  G01R19/165 ,  G06F1/26 ,  G06F1/32 ,  G06F1/3203 ,  G06F1/3296

Abstract: Circuits and methods involve an integrated circuit (IC) device, a plurality of application-specific sub-circuits, and a plurality of instances of a measuring circuit. The application-specific sub-circuits are disposed within respective areas of the IC device. Each instance of the measuring circuit is associated with one of the application-specific sub-circuits and is disposed within a respective one of the areas of the device. Each instance of the measuring circuit further includes a ring oscillator and a register for storage of a value indicative of an interval of time. Each instance of the measuring circuit is configured to measure passage of the interval of time based on a first clock signal, count oscillations of an output signal of the ring oscillator during the interval of time, and output a value indicating a number of oscillations counted during the interval of time.