Nonvolatile semiconductor memory and manufacturing method for the same
    2.
    发明授权
    Nonvolatile semiconductor memory and manufacturing method for the same 有权
    非易失性半导体存储器及其制造方法相同

    公开(公告)号:US07387934B2

    公开(公告)日:2008-06-17

    申请号:US11267331

    申请日:2005-11-07

    IPC分类号: H01L21/336

    摘要: The memory cell matrix encompasses (a) a plurality device isolation films running along column direction, (b) first conductive layers arranged along row and column-directions, adjacent groups of the first conductive layers are isolated from each other by the device isolation film disposed between the adjacent groups, (c) lower inter-electrode dielectrics arranged respectively on crests of the corresponding first conductive layers, (d) an upper inter-electrode dielectric arranged on the lower inter-electrode dielectric made of insulating material different from the lower inter-electrode dielectrics, and (e) second conductive layers running along the row-direction, arranged on the upper inter-electrode dielectric.

    摘要翻译: 存储单元矩阵包括(a)沿着列方向延伸的多个器件隔离膜,(b)沿着行和列方向布置的第一导电层,相邻的第一导电层组通过设置隔离膜彼此隔离 (c)分别布置在相应的第一导电层的顶部上的下部电极间电介质,(d)布置在由绝缘材料制成的下部电极间电介质上的上部电极间电介质, - 电极介质,和(e)布置在上部电极间电介质上的沿着行方向延伸的第二导电层。

    Nonvolatile semiconductor memory and manufacturing method for the same
    3.
    发明授权
    Nonvolatile semiconductor memory and manufacturing method for the same 有权
    非易失性半导体存储器及其制造方法相同

    公开(公告)号:US07247916B2

    公开(公告)日:2007-07-24

    申请号:US11267334

    申请日:2005-11-07

    IPC分类号: H01L29/76

    摘要: The memory cell matrix encompasses (a) a plurality device isolation films running along column direction, (b) first conductive layers arranged along row and column-directions, adjacent groups of the first conductive layers are isolated from each other by the device isolation film disposed between the adjacent groups, (c) lower inter-electrode dielectrics arranged respectively on crests of the corresponding first conductive layers, (d) an upper inter-electrode dielectric arranged on the lower inter-electrode dielectric made of insulating material different from the lower inter-electrode dielectrics, and (e) second conductive layers running along the row-direction, arranged on the upper inter-electrode dielectric.

    摘要翻译: 存储单元矩阵包括(a)沿着列方向延伸的多个器件隔离膜,(b)沿着行和列方向布置的第一导电层,相邻的第一导电层组通过设置的隔离膜相互隔离 (c)分别布置在相应的第一导电层的顶部上的下部电极间电介质,(d)布置在由绝缘材料制成的下部电极间电介质上的上部电极间电介质, - 电极介质,和(e)布置在上部电极间电介质上的沿着行方向延伸的第二导电层。

    Nonvolatile semiconductor memory and manufacturing method for the same
    5.
    发明申请
    Nonvolatile semiconductor memory and manufacturing method for the same 有权
    非易失性半导体存储器及其制造方法相同

    公开(公告)号:US20050002231A1

    公开(公告)日:2005-01-06

    申请号:US10724103

    申请日:2003-12-01

    摘要: The memory cell matrix encompasses (a) a plurality device isolation films running along column direction, (b) first conductive layers arranged along row and column-directions, adjacent groups of the first conductive layers are isolated from each other by the device isolation film disposed between the adjacent groups, (c) lower inter-electrode dielectrics arranged respectively on crests of the corresponding first conductive layers, (d) an upper inter-electrode dielectric arranged on the lower inter-electrode dielectric made of insulating material different from the lower inter-electrode dielectrics, and (e) second conductive layers running along the row-direction, arranged on the upper inter-electrode dielectric.

    摘要翻译: 存储单元矩阵包括(a)沿着列方向延伸的多个器件隔离膜,(b)沿着行和列方向布置的第一导电层,相邻的第一导电层组通过设置的隔离膜相互隔离 (c)分别布置在相应的第一导电层的顶部上的下部电极间电介质,(d)布置在由绝缘材料制成的下部电极间电介质上的上部电极间电介质, - 电极介质,和(e)布置在上部电极间电介质上的沿着行方向延伸的第二导电层。

    Nonvolatile semiconductor memory and manufacturing method for the same
    6.
    发明申请
    Nonvolatile semiconductor memory and manufacturing method for the same 有权
    非易失性半导体存储器及其制造方法相同

    公开(公告)号:US20060054957A1

    公开(公告)日:2006-03-16

    申请号:US11267334

    申请日:2005-11-07

    摘要: The memory cell matrix encompasses (a) a plurality device isolation films running along column direction, (b) first conductive layers arranged along row and column-directions, adjacent groups of the first conductive layers are isolated from each other by the device isolation film disposed between the adjacent groups, (c) lower inter-electrode dielectrics arranged respectively on crests of the corresponding first conductive layers, (d) an upper inter-electrode dielectric arranged on the lower inter-electrode dielectric made of insulating material different from the lower inter-electrode dielectrics, and (e) second conductive layers running along the row-direction, arranged on the upper inter-electrode dielectric.

    摘要翻译: 存储单元矩阵包括(a)沿着列方向延伸的多个器件隔离膜,(b)沿着行和列方向布置的第一导电层,相邻的第一导电层组通过设置的隔离膜相互隔离 (c)分别布置在相应的第一导电层的顶部上的下部电极间电介质,(d)布置在由绝缘材料制成的下部电极间电介质上的上部电极间电介质, - 电极介质,和(e)布置在上部电极间电介质上的沿着行方向延伸的第二导电层。

    SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
    9.
    发明申请
    SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME 审中-公开
    半导体存储器件及其制造方法

    公开(公告)号:US20110143530A1

    公开(公告)日:2011-06-16

    申请号:US13033017

    申请日:2011-02-23

    IPC分类号: H01L21/3205

    摘要: A semiconductor memory device according to the present invention includes: a first transistor formed on a semiconductor substrate 11, the first transistor including a first gate-insulating film 14a that is oxynitrided; and a second transistor including a second gate-insulating film 14b formed on the semiconductor substrate 11 and a barrier film 20 formed at least partially on the second gate-insulating film 14b, the second gate-insulating film having a lower nitrogen atom concentration than the first gate-insulating film.

    摘要翻译: 根据本发明的半导体存储器件包括:形成在半导体衬底11上的第一晶体管,所述第一晶体管包括被氮氧化的第一栅极绝缘膜14a; 以及第二晶体管,包括形成在半导体衬底11上的第二栅极绝缘膜14b和至少部分地形成在第二栅极绝缘膜14b上的阻挡膜20,第二栅极绝缘膜具有比 第一栅极绝缘膜。