Sense amplifier for semiconductor memory device
    1.
    发明申请
    Sense amplifier for semiconductor memory device 有权
    用于半导体存储器件的检测放大器

    公开(公告)号:US20090059702A1

    公开(公告)日:2009-03-05

    申请号:US12285527

    申请日:2008-10-08

    IPC分类号: G11C7/06

    摘要: A direct sense amplifier of the present invention incorporates and isolates: an MOS transistor serving as a differential pair and having a gate connected to a bit line; and an MOS transistor controlled by a column select line wired between RLIO lines in a bit-line direction, and further connects a source of the MOS transistor serving as the differential pair to a common source line wired in the word-line direction. Since the direct sense amplifier only in a select map is activated by the column select line and the common source line during an read operation, power consumption is significantly reduced during the read operation. Also, since a parasitic capacitance of the MOS transistor serving as the differential pair is separated from the local IO line, a load capacity of the local IO line is reduced and the read operation is speeded up. In addition, during the read operation, a data pattern dependency of the load capacity of the local IO line is reduced and a post-manufacture test is easily made.

    摘要翻译: 本发明的直接感测放大器结合并隔离:用作差分对并具有连接到位线的栅极的MOS晶体管; 以及通过在位线方向上的RLIO线之间布线的列选择线控制的MOS晶体管,并且还将用作差分对的MOS晶体管的源极连接到在字线方向上布线的公共源极线。 由于在读取操作期间,仅在选择映射中的直接读出放大器被列选择线和公共源极线激活,所以在读取操作期间功耗显着降低。 此外,由于用作差分对的MOS晶体管的寄生电容与本地IO线分离,所以本地IO线的负载容量减小,读取操作加快。 此外,在读取操作期间,本地IO线的负载能力的数据模式相关性降低,并且容易进行后期制造测试。