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公开(公告)号：US12105119B2
公开(公告)日：2024-10-01
申请号：US17440401
申请日：2019-09-06
发明人： Tomoaki Kuga
CPC分类号： G01R1/07357 , H01R12/55 , H01R13/15 , H01R13/2407
摘要： In order to improve conductivity, the number of components is decreased, and a sliding property of an elastic member can be improved. Elastic force can be controlled in accordance with a characteristic of a contact object, and electrical contact stability with the contact object can be improved.
An electrical contactor of the present disclosure is formed by winding a plate member having conductivity. The electrical contactor includes a first contact part that is formed by winding a first tip part of the plate member, a first elastic part that is formed by winding an upper arm part having a tapered shape, a second contact part that is formed by winding a second tip part, a second elastic part that is formed by winding a lower arm part having a tapered shape, and a cylindrical part that is formed by winding a main body part that is a plate member.-
2.发明授权公开(公告)号：US11971431B2
公开(公告)日：2024-04-30
申请号：US17324740
申请日：2021-05-19
发明人： Michitaka Okuta , Yuki Saito , Jukiya Fukushi , Shou Harako
CPC分类号： G01R1/07342 , G01R31/26 , G02B6/4203 , G02B6/262
摘要： An optical probe includes a first region and a second region connected to have a continuous optical waveguide in which a transmission mode is a single mode. The first region connected to a tip-end surface opposed to an optical device includes a region in which a mode field diameter that is maximum at the tip-end surface is gradually decreased toward a boundary between the first region and the second region. The tip-end surface is a curved surface and has a radius of curvature set so that an advancing direction of an optical signal entering through the tip-end surface approximates in parallel to a central-axis direction of the optical waveguide.
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公开(公告)号：US11899054B2
公开(公告)日：2024-02-13
申请号：US17604319
申请日：2020-04-03
发明人： Minoru Sato
CPC分类号： G01R31/26 , G01R1/07342
摘要： A connecting device for inspection includes a probe head configured to hold electric contacts and optical contacts such that tip ends of the respective contacts are exposed on a lower surface of the probe head while proximal ends of the electric contacts are exposed on an upper surface of the probe head and the optical contacts are fixed to the probe head, and a transformer including connecting wires provided therein such that tip ends on one side of the connecting wires electrically connected to the proximal ends of the electric contacts exposed on the upper surface of the probe head are arranged in a lower surface of the transformer while the optical contacts slidably penetrate the transformer. A positional relationship between the tip end of the respective electric contacts and the tip end of the respective optical contacts on the lower surface of the probe head corresponds to a positional relationship between an electrical signal terminal and an optical signal terminal of a semiconductor device. The optical contacts continuously penetrate the probe head and the transformer.
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4.发明公开公开(公告)号：US20230400481A1
公开(公告)日：2023-12-14
申请号：US18249003
申请日：2021-12-03
发明人： Satoshi NARITA
IPC分类号： G01R1/073
CPC分类号： G01R1/07342
摘要： An electrical connecting device includes a first guide plate having first guide holes through which probes are inserted, a second guide plate having second guide holes through which the probes are inserted, and an introduction film arranged between the first guide plate and the second guide plate and having introduction guide holes through which the probes are inserted. The introduction film is formed from material that is dissolved by a specific solvent that does not dissolve the first guide plate, the second guide plate, and the probes.
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公开(公告)号：US11747365B2
公开(公告)日：2023-09-05
申请号：US17417183
申请日：2019-10-18
发明人： Toshinori Omori , Kazuya Goto , Yasuaki Osanai , Takashi Akiniwa , Takeki Sugisawa , Takeshi Kondo , Shintaro Abe , Maki Watanabe
CPC分类号： G01R1/07342 , G01R3/00 , G01R31/2889 , H01L22/12
摘要： An object is to enhance the durability of substrates of a probe substrate and/or the probe substrate and a member to be joined.
A probe substrate according to the present disclosure includes: a plurality of electrical contactors respectively brought into electrical contact with a plurality of electrode terminals of a member to be inspected, a joint portion for a member to be joined is provided on one or each of a first surface and a second surface of the probe substrate and the member to be joined is joined to the joint portion with a metal layer that includes, in a metal component, at least 70 atomic percent or more of a transition metal and that is formed by sintering, and/or in a joining surface between a plurality of substrates of the probe substrate, the substrates are joined together with the metal layer formed by sintering, in the metal layer formed by sintering, a plurality of organic component parts and/or voids formed by heating an adhesive composition including a thermoplastic resin are left and the organic component parts and/or the voids included in the metal layer formed by sintering have 5 to 80 area percent in a vertical cross section of the metal layer formed by sintering.-
公开(公告)号：US11592402B2
公开(公告)日：2023-02-28
申请号：US17392214
申请日：2021-08-02
发明人： Minoru Sato
摘要： A connecting device for inspection includes optical probes, and a probe head including a plurality of guide plates. The probe head includes a first guide plate, and a second guide plate arranged movably with respect to the first guide plate in a radial direction of the penetration holes in a state in which the optical probes are inserted to the respective penetration holes. The probe head holds the optical probes by inner wall surfaces of the penetration holes of the first guide plate and inner wall surfaces of the penetration holes of the second guide plate in a state in which the positions of the central axes of the penetration holes of the first guide plate are shifted in the radial direction from the positions of the central axes of the penetration holes of the second guide plate.
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公开(公告)号：US20220390489A1
公开(公告)日：2022-12-08
申请号：US17730579
申请日：2022-04-27
发明人： SATOSHI NARITA , SHOU HARAKO , JUKIYA FUKUSHI
摘要： It is possible to make the free length of a contactor uniform even when the contactor is joined to a position that deviates from a joint position in a high-frequency conducting path and make contact with an electrode with stability, which improves measurement quality. A probe unit according to the present disclosure includes: a coaxial connector that is attached to a main body and gives and receives an electrical signal to and from a tester via a coaxial cable; a high-frequency conducting path that is connected to the coaxial connector and transmits an electrical signal; a plurality of contactors, each having a tip portion that makes electrical contact with an electrode of an object to be inspected and giving and receiving an electrical signal to and from the high-frequency conducting path; and a pedestal that is interposed between the contactor and the high-frequency conducting path, and the pedestal is provided in each contactor such that a free length of the contactor is a predetermined length.
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公开(公告)号：US20220221502A1
公开(公告)日：2022-07-14
申请号：US17608118
申请日：2020-04-03
发明人： Minoru SATO
摘要： A connecting device for inspection includes a probe head (30) configured to hold electric contacts (10) and optical contacts (20) such that tip ends of the respective contacts are exposed on a lower surface of the probe head (30), and a transformer (40) including connecting wires (41) arranged therein and optical wires (42) penetrating therethrough. The respective proximal ends of the electric contacts (10) and the optical contacts (20) are exposed on an upper surface of the probe head (30), and tip ends on one side of the connecting wires (41) electrically connected to the proximal ends of the electric contacts (10) and connecting ends of the optical wires (42) optically connected to the proximal ends of the optical contacts (20) are arranged in a lower surface of the transformer (40). A positional relationship between the tip end of the respective electric contacts (10) and the tip end of the respective optical contacts (20) on the lower surface of the probe head (30) corresponds to a positional relationship between an electrical signal terminal and an optical signal terminal of a semiconductor device.
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公开(公告)号：US20220214391A1
公开(公告)日：2022-07-07
申请号：US17604319
申请日：2020-04-03
发明人： Minoru SATO
摘要： A connecting device for inspection includes a probe head (30) configured to hold electric contacts (10) and optical contacts (20) such that tip ends of the respective contacts are exposed on a lower surface of the probe head (30) while proximal ends of the electric contacts (10) are exposed on an upper surface of the probe head and the optical contacts (20) are fixed to the probe head (30), and a transformer (40) including connecting wires (41) provided therein such that tip ends on one side of the connecting wires (41) electrically connected to the proximal ends of the electric contacts (10) exposed on the upper surface of the probe head (30) are arranged in a lower surface of the transformer (40) while the optical contacts (20) slidably penetrate the transformer (40). A positional relationship between the tip end of the respective electric contacts (10) and the tip end of the respective optical contacts (20) on the lower surface of the probe head (30) corresponds to a positional relationship between an electrical signal terminal and an optical signal terminal of a semiconductor device. The optical contacts (20) continuously penetrate the probe head (30) and the transformer (40).
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公开(公告)号：US20220123358A1
公开(公告)日：2022-04-21
申请号：US17422159
申请日：2020-01-30
IPC分类号： H01M10/0562 , H01M4/525 , H01M4/1391 , H01M4/04
摘要： A technique of improving the performance of a secondary battery is provided. A secondary battery according to an embodiment includes a first electrode, a second electrode, a first layer disposed on the first electrode and including a first n-type oxide semiconductor, a second layer disposed on the first layer and including a second n-type oxide semiconductor material and a first insulating material, a third layer which is disposed on the second layer and is a solid electrolyte layer, and a fourth layer disposed on the third layer and including hexagonal Ni(OH)2 microcrystals.
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