High density disk recording medium and apparatus using the same
    94.
    发明授权
    High density disk recording medium and apparatus using the same 失效
    高密度盘记录介质及使用其的装置

    公开(公告)号:US07515524B2

    公开(公告)日:2009-04-07

    申请号:US10892879

    申请日:2004-07-16

    IPC分类号: G11B3/70

    摘要: The present invention relates to a high-density disk that is structured to prevent a collision of an optical pickup's objective lens with the high-density disk if the disk is placed upside down in a disk device that is able to record and reproduce signals to/from the high-density disk. A high-density disk recording medium according to the present invention is structured such that, wherein a recording layer having high-density pit patterns is offset from a center plane of disk thickness, both sides of a clamping zone bisected by the center plane have differing thicknesses. One or both sides may protrude from surface of the disk recording medium, or one side of the clamping zone may protrude from the surface while the other side is indented below the surface.

    摘要翻译: 本发明涉及一种高密度盘,其被构造为防止光学拾取器的物镜与高密度盘的碰撞,如果盘被倒置放置在能够记录和再现信号到/ 从高密度磁盘。 根据本发明的高密度盘记录介质被构造成使得其中具有高密度凹坑图案的记录层偏离圆盘厚度的中心平面,由中心平面划分的夹紧区域的两侧具有不同的 厚度 一个或两个侧面可以从盘记录介质的表面突出,或者夹持区域的一侧可以从表面突出,而另一侧在表面下方凹入。

    Technologies for measuring thickness of an optical disc
    100.
    发明授权
    Technologies for measuring thickness of an optical disc 有权
    用于测量光盘厚度的技术

    公开(公告)号:US07248372B2

    公开(公告)日:2007-07-24

    申请号:US11519084

    申请日:2006-09-12

    IPC分类号: G01B11/02 G01B11/28

    摘要: The disclosure includes a system, device, apparatus and programmed medium of measuring thickness of an optical disc by using an interference effect of the optical disc layer. Such a system can include: a spectroscope to separate light, reflected from a surface of an optical disc, into constituent frequencies thereof; an optical intensity measuring unit to measure intensities of the constituent frequencies, respectively, as a first spectrum of data; and a processor to do at least the following, convert the first spectrum data into a second spectrum of values that exhibits variation as a function wavelength and refractive index, transform the second spectrum using a Fast Fourier Transform, and detect a thickness of one or more of the spacer layer and the cover layer, respectively, based upon the transformed spectrum. The disclosed technologies have advantages for high precisely measuring thickness of an optical disc.

    摘要翻译: 本公开包括通过使用光盘层的干涉效应测量光盘的厚度的系统,设备,设备和编程介质。 这样的系统可以包括:将从光盘的表面反射的光分离成其组成频率的分光器; 光强度测量单元,分别测量组成频率的强度作为第一数据频谱; 以及处理器至少进行以下操作,将第一光谱数据转换为呈现作为功能波长和折射率的变化的第二频谱,使用快速傅立叶变换来变换第二光谱,并且检测一个或多个 分别基于变换的光谱分离间隔层和覆盖层。 所公开的技术具有用于高精度测量光盘厚度的优点。