摘要:
A voltage-controlled oscillator has ring oscillators R1, R2 and R3 which have three amplifier elements A1-A3, A4-A6 and A7-A9 respectively which are connected in the form of a ring. The way of connecting with the respective amplifier elements A10 to A18 is as follows: First, optionally selecting two output terminals from the 3.times.3 amplifier elements which form three ring oscillators, wherein the two output terminals are not selected from the input and output terminals of one amplifier element, and wherein the two output terminals are not selected from the output terminals belonging to the same ring oscillator. Next, connecting the input and output terminals of one of the amplifier elements A10 to A18 to the optionally selected two output terminals. Then repeating the above procedures one or more times to form a network between the ring oscillators R1 to R3. C1 to C9 are nodes for the connections. In the above connections, it is important that none of the two output terminals which are optionally selected from the output terminals of the 3.times.3 amplifier elements which form three ring oscillators have both in-phase and anti-phase paths through between them, on condition that all the signal paths between the two output terminals selected do not pass more than one time through the same output terminal.
摘要:
An image-forming apparatus equipped with an optical means, an electrostatic image-forming means and a control means. The optical means projects a scanned light beam to be controlled according to an image to be formed. The image-forming means receives the scanned light beam projected from the optical means and forms an image corresponding to the scanned light beam. The control means controls the optical means and the image-forming means.
摘要:
Disclosed is a semiconductor device in which a circuit in the semiconductor chip is divided into a plurality of sub-circuits. The semiconductor device includes switches between the respective sub-circuits and a power supply, and a circuit that variably controls on-resistances of the switches 111 to 11N.
摘要:
A semiconductor device includes a semiconductor wafer in which semiconductor chip forming regions and a scribe region located between the semiconductor chip forming regions are formed, a plurality of semiconductor chip circuit portions provided over the semiconductor wafer, a plurality of first conductive layers, provided in each of the semiconductor chip forming regions, which is electrically connected to each of the circuit portions, and a first connecting portion that electrically connects the first conductive layers to each other across a portion of the scribe region. An external power supply or grounding pad is connected to any one of the first conductive layer and the first connecting portion. The semiconductor device includes a communication portion, connected to the circuit portion, which performs communication with the outside by capacitive coupling or inductive coupling.
摘要:
A semiconductor device comprising a signal transmission line of a microstrip structure, capable of increasing the characteristic impedance of the signal transmission line and reducing coupling between a plurality of signal lines. In a signal transmission line of a microstrip structure composed of a signal line and a ground plate, the capacitance between wires is reduced and the characteristic impedance can be increased by forming holes in the signal line or in the ground plate. The coupling between a plurality of signal lines can also be reduced.
摘要:
A heat shield plate for a substrate annealing apparatus is provided with a horizontally supported flat-plate-like substrate 1, a heater 5 positioned above the substrate to heat the upper surface of the substrate with radiation heat, and a heat shield plate 10 horizontally movable between a shielding position where the substrate is shielded from heater and an open position out of the shielding position. The heat shield plate 10 is composed of a structural member 12 made of a low thermal expansion material (carbon composite material) which is hardly deformed due to a temperature difference in the shielding position, and a heat insulating member 14 which covers the upper surface of the structural member and keeps the surface at an allowable temperature or below.
摘要:
An electronic circuit includes: a first power line capable of supplying power; a second power line capable of supplying power independently from the first power line; a main circuit connected to the second power line; a detector that detects the supply of power from the first power line or the second power line; and a controller connected to the first power line and the second power line, wherein the controller controls a voltage or a current supplied from the first power line and supplies the voltage or the current to the main circuit when the detector detects supply of power from the first power line.
摘要:
It is possible to provide a circuit and method for carrying out a parallel test using BOST (Built Out Self Test). The circuit includes first transfer circuits (11-1, 11-2, . . . ) that extract a data pattern supplied to a complete operating article chip (10) in a BOST (3) from the BOST and that successively transmit the data pattern in response to a clock signal, and second transfer circuits (12-1, 12-2, . . . ) that extract output data from the complete operating article chip (10) as an expectation value pattern and that successively transmit the expectation value pattern in response to the clock signal. The data pattern supplied to the complete operating article chip (10) is applied to one chip to be measured (10-1) and the data pattern from a corresponding stage of the first transfer circuits (11-1, 11-2, . . . ) is applied to each of other chips to be measured (10-2, . . . ). A comparator (14-1) compares output data from the one chip to be measured (10-1) to the output data from the complete operating article chip (10) to decide whether or not they coincide. Corresponding to the other chips to be measured (10-2, . . . ), a comparator (14-2, . . . ) compares respective output data from the other chips to be measured to the expectation value pattern from the corresponding stage of the second transfer circuits (12-1, 12-2, . . . ) to decide whether or not they coincide.
摘要:
A semiconductor device (1) includes a semiconductor wafer (11) on which a plurality of semiconductor chip forming regions (1A) is formed, a circuit section (12) which is provided within each of the semiconductor chip forming regions (1A) of the semiconductor wafer (11), a control circuit section (14), provided within each of the semiconductor chip forming regions (1A) and connected to the circuit section (12), that controls electric power supplied to the circuit section (12), a power supply line (18) connected to the plurality of control circuit section (14), and a reference power line (17) connected to the plurality of control circuit section (14). In each of the control circuit sections (14), a voltage of electric power supplied from the power supply line (18) is controlled on the basis of a reference voltage from the reference power line (17).