Image forming apparatus and image forming method
    92.
    发明授权
    Image forming apparatus and image forming method 有权
    图像形成装置及图像形成方法

    公开(公告)号:US08308262B2

    公开(公告)日:2012-11-13

    申请号:US12574339

    申请日:2009-10-06

    摘要: An image forming apparatus includes an image forming portion to form an image on a sheet using an erasable ink, a sheet supply tray to load the sheet on which the image was formed using the erasable ink, a mark detecting portion to detect a mark indicating that the image formed on the sheet conveyed from the sheet supply tray includes a confidential information, and an overwriting portion to overwrite so as not to make recognizable the image of at least an area including the confidential information out of the image formed on the sheet, in case that the mark is detected by the mark detecting portion.

    摘要翻译: 图像形成装置包括使用可擦除墨水在片材上形成图像的图像形成部分,使用可擦除墨水对其上形成有图像的片材进行加载的片材供给托盘;标记检测部分,用于检测指示 形成在从供纸托盘输送的纸张上的图像包括机密信息和覆盖部分,以覆盖以至于不能将形成在纸张上的图像中的至少包括机密信息的区域的图像识别为 标记被标记检测部分检测到的情况。

    APPARATUS AND METHOD FOR INSPECTING PATTERN
    93.
    发明申请
    APPARATUS AND METHOD FOR INSPECTING PATTERN 有权
    用于检查图案的装置和方法

    公开(公告)号:US20120176602A1

    公开(公告)日:2012-07-12

    申请号:US13423862

    申请日:2012-03-19

    IPC分类号: G01N21/88

    摘要: A method and apparatus for inspecting defects includes emitting an ultraviolet light from an ultraviolet light source, illuminating a specimen with the ultraviolet light in which a polarization condition of the ultraviolet light is controlled, controlling a polarization condition of light reflected from the specimen which is illuminated by the polarization condition controlled ultraviolet light, detecting the light reflected from the specimen, processing the detected light so as to detect defects, and outputting information about the defects. The ultraviolet light source is disposed in a clean environment supplied with clean gas and separated from outside.

    摘要翻译: 用于检查缺陷的方法和装置包括从紫外光源发射紫外光,用受紫外光的偏振条件的紫外线照射样本,控制从被照射的样本反射的光的偏振状态 通过偏光条件控制的紫外光,检测从样本反射的光,处理检测到的光以检测缺陷,并输出关于缺陷的信息。 紫外光源设置在清洁环境中,并提供清洁气体并与外界分离。

    IMAGE FORMING APPARATUS AND PROCESSING METHOD FOR REUSE OF SHEET
    94.
    发明申请
    IMAGE FORMING APPARATUS AND PROCESSING METHOD FOR REUSE OF SHEET 有权
    图像形成装置及其再利用处理方法

    公开(公告)号:US20120141154A1

    公开(公告)日:2012-06-07

    申请号:US13307446

    申请日:2011-11-30

    申请人: Minoru Yoshida

    发明人: Minoru Yoshida

    IPC分类号: G03G15/20

    摘要: According to one embodiment, an image forming apparatus includes an image forming section, a fixing device, and a control section. The image forming section forms images on a sheet with a recolorable decolorable colorant and an undecolorable colorant. The fixing device heats the sheet to fix the recolorable decolorable colorant and the undecolorable colorant on the sheet. The control section performs temperature control for the fixing device and fixes the recolorable decolorable colorant and the undecolorable colorant on the sheet at temperature higher than decoloring start temperature of the recolorable decolorable colorant to thereby fix the recolorable decolorable colorant on the sheet in a decolored state and fix the undecolorable colorant on the sheet in a colored state.

    摘要翻译: 根据一个实施例,图像形成装置包括图像形成部分,定影装置和控制部分。 图像形成部分在具有可着色的可脱色着色剂和不可剥离着色剂的片材上形成图像。 定影装置加热片材以将可着色的可脱色着色剂和不可剥离的着色剂固定在片材上。 控制部进行定影装置的温度控制,并且在可再发色的不可着色着色剂的脱色开始温度以上的温度下将可再发色的不可脱色的着色剂和不可脱色的着色剂固着在片材上,从而将脱色后的可着色着色剂固着在片材上, 在彩色状态下将未解决的着色剂固定在片材上。

    DEFECT INSPECTION METHOD AND APPARATUS
    95.
    发明申请
    DEFECT INSPECTION METHOD AND APPARATUS 审中-公开
    缺陷检查方法和装置

    公开(公告)号:US20120128230A1

    公开(公告)日:2012-05-24

    申请号:US13362151

    申请日:2012-01-31

    IPC分类号: G06K9/00

    摘要: An inspection method, including: illuminating a light on a wafer on which plural chips having identical patterns are formed; imaging corresponding areas of two chips formed on the wafer to obtain inspection images and reference images with an image sensor; and processing the obtained inspection image and the reference image to produce a difference image which indicates a difference between the inspection image and the reference image and detect a defect by comparing the difference image with a threshold, wherein a threshold applied to a difference image which is produced by comparing the inspection image and the reference image obtained by imaging peripheral portion of the wafer is different from a threshold applied to a difference image which is produced by comparing the inspection image and the reference image obtained by imaging central portion of the wafer.

    摘要翻译: 一种检查方法,包括:在其上形成有多个具有相同图案的芯片的晶片上照射光; 对形成在晶片上的两个芯片的对应区域进行成像,以获得具有图像传感器的检查图像和参考图像; 并且处理所获得的检查图像和参考图像以产生指示检查图像和参考图像之间的差异的差异图像,并且通过将差异图像与阈值进行比较来检测缺陷,其中应用于差分图像的阈值是 通过比较检查图像和通过对晶片的周边部分进行成像获得的参考图像而产生的参考图像与通过比较检查图像和通过对晶片的中心部分进行成像而获得的参考图像而产生的差分图像的阈值不同。

    Light diffusion sheet and backlight unit using the same
    96.
    发明授权
    Light diffusion sheet and backlight unit using the same 有权
    光扩散片和使用其的背光单元

    公开(公告)号:US08110276B2

    公开(公告)日:2012-02-07

    申请号:US11546139

    申请日:2006-10-11

    申请人: Minoru Yoshida

    发明人: Minoru Yoshida

    IPC分类号: E01F9/04

    摘要: An object of the present invention is to provide a light diffusion sheet having a favorable cost reduction capability due to excellent scratching preventive property of the front face, and having in addition thereto, a favorable directional light diffusion function, transmittivity of rays of light, and a thin film character; and a backlight unit capable of promoting performances such as luminance as well as price reduction, and thin and light modeling capability. The light diffusion sheet of the present invention has a light diffusion sheet including a transparent substrate layer, and a light diffusion layer overlaid on the front face side of the substrate layer, wherein the light diffusion layer has resin beads and a resin binder, characterized in that the light diffusion layer has protruding parts having a shape of a partial spherical body on the front face in a scattering manner. It is preferred that mean height of the protruding parts be 1 μm or greater and 10 μm or less, mean diameter of the protruding parts be 4 μm or greater and 18 μm or less, mean occupancy rate of the protruding parts be 2% or greater and 20% or less, and surface roughness (Ra) of the light diffusion layer be 1.5 μm or greater and 10 μm or less. As the beads, small monodisperse beads as a principal component, and large beads as a sub component may be included.

    摘要翻译: 本发明的目的是提供一种由于前表面的防刮擦性优异而具有良好的降低成本的光扩散片,并且还具有良好的定向光扩散功能,光线的透射率和 一个薄膜人物; 以及能够促进诸如亮度以及价格降低等性能以及薄型和轻型建模能力的背光单元。 本发明的光扩散片具有包括透明基板层和覆盖在基板层的正面侧的光扩散层的光漫射片,其中,光扩散层具有树脂珠和树脂粘合剂,其特征在于, 光扩散层具有在散射方式的前表面上具有局部球体形状的突出部分。 优选突出部的平均高度为1μm以上且10μm以下,突出部的平均直径为4μm以上且18μm以下,突出部的平均占有率为2%以上 和20%以下,光扩散层的表面粗糙度(Ra)为1.5μm以上且10μm以下。 作为珠粒,可以包括作为主要成分的小单分散珠粒和作为亚成分的大珠粒。

    PATTERN INSPECTION DEVICE OF SUBSTRATE SURFACE AND PATTERN INSPECTION METHOD OF THE SAME
    97.
    发明申请
    PATTERN INSPECTION DEVICE OF SUBSTRATE SURFACE AND PATTERN INSPECTION METHOD OF THE SAME 有权
    基板表面图案检测装置及其图案检测方法

    公开(公告)号:US20120013890A1

    公开(公告)日:2012-01-19

    申请号:US13145968

    申请日:2009-12-10

    IPC分类号: G01N21/956 G01N21/47

    摘要: There is provided a pattern inspection device for a substrate surface which can inspect a substrate including a pattern whose size is equal to or smaller than light resolution limit at high speed. The pattern inspection device for the substrate surface includes: a near-field optical head 101 having a fine repetitive pattern; a θ driving unit 311 of scanning an inspected substrate 900 relatively to the near-field optical head 101; a space holding mechanism of holding a space between the near-field optical head 101 and the inspected substrate 900 constant; alight source 110 of irradiating light to the near-field optical head 101; a detection system 201 of detecting an intensity of scattered light generated by interaction between the fine repetitive pattern on the near-field optical head 101 and a fine pattern on a surface of the inspected substrate 900; and a signal processing unit 321 of inspecting the fine pattern on the inspected substrate 900 based on an output of the detection system 201.

    摘要翻译: 提供了一种用于基板表面的图案检查装置,其能够高速检查尺寸等于或小于光分辨率极限的图案的基板。 用于基板表面的图案检查装置包括:具有精细重复图案的近场光学头101; a&thetas; 驱动单元311,其相对于近场光学头101扫描被检查的基板900; 在近场光学头101和被检查基板900之间保持一定间隔的空间保持机构; 将光照射到近场光学头101的光源110; 检测系统201,用于检测由近场光学头101上的细重复图案与被检查基板900的表面上的微细图案之间的相互作用产生的散射光的强度; 以及基于检测系统201的输出来检查被检查基板900上的精细图案的信号处理单元321。

    Developing device
    98.
    发明授权
    Developing device 有权
    开发设备

    公开(公告)号:US08045897B2

    公开(公告)日:2011-10-25

    申请号:US12550639

    申请日:2009-08-31

    IPC分类号: G03G15/08

    CPC分类号: G03G15/0893 G03G15/0877

    摘要: A developing device includes a developer tank configured to contain a developer including a toner and a carrier, the developer tank having a discharge port which is provided in a lateral side surface of the developer tank and configured to discharge the developer, a developing agent supplier configured to develop a latent image by using the toner contained in the developer tank, and a plate-shaped member configured to be formed in a direction of height from a lower end of the discharge port and partially cover the discharge port to regulate the discharge of the developer.

    摘要翻译: 显影装置包括:显影剂罐,其构造成容纳包含调色剂和载体的显影剂,所述显影剂罐具有排出口,所述排出口设置在所述显影剂罐的侧面上,并构造成排出所述显影剂;显影剂供应器配置 通过使用包含在显影剂罐中的调色剂来显影潜像;以及板状构件,其被构造成从排出口的下端沿高度方向形成,并且部分地覆盖排出口以调节排出口 开发者

    Structure of fixing planting base
    99.
    发明授权
    Structure of fixing planting base 失效
    固定种植基地结构

    公开(公告)号:US08015750B2

    公开(公告)日:2011-09-13

    申请号:US12085960

    申请日:2006-10-20

    IPC分类号: A01G9/02

    摘要: A structure for fixing a planting base 100 supporting a planted raising member 106 by a bottom plate 101 to a laying face 300, the structure being provided with a cylinder portion 105 which projects from the bottom plate 101 of the planting base 100 to a top side and top and bottom of which are opened in which an inner diameter is gradually contracted from a top end to a bottom side, a bolt 110 constituting a fixing member is inserted to the cylinder portion 105, the bolt 110 is screwed to and fixed by an anchor holder 120 of the laying face 300 until a position at which a bolt head portion 110a is brought into contact with and caught by an inner face of the cylinder portion 105, and a top face of the bolt head portion 110a is arranged at a height the same as that of a top end of the cylinder portion 105, or arranged at inside of the cylinder portion 105.

    摘要翻译: 用于将通过底板101支撑植入升高构件106的种植基座100固定到铺设面300的结构,该结构设置有从种植基座100的底板101突出到顶侧的圆筒部105 其顶部和底部被打开,其中内径从顶端逐渐收缩到底侧,构成固定构件的螺栓110插入到气缸部分105中,螺栓110被螺纹固定并固定在其上 敷设面300的锚定保持器120直到螺栓头部110a与圆筒部105的内表面接触并被其卡住的位置以及螺栓头部110a的上表面的高度 与圆筒部105的顶端相同,或者配置在圆筒部105的内侧。

    Weatherstrip
    100.
    发明授权

    公开(公告)号:US07999038B2

    公开(公告)日:2011-08-16

    申请号:US11699524

    申请日:2007-01-29

    摘要: A weatherstrip composition includes the following polymer A group and polymer B group, Polymer A group. A polymer group is made up of a domain 1 consisting of crosslinked product of a polymer selected from a group consisting of ethylene polymer, ethylene/α-olefin copolymer (where the α-olefin has from 3 to 20 carbons), ethylene/α-olefin/diene copolymer (where the .alpha.-olefin has from 3 to 20 carbons), homopolymer rubber of a conjugated diene monomer, copolymer polymerized with a conjugated diene monomer and an aromatic vinyl monomer, and hydrogenated copolymer polymerized with a conjugated diene monomer and an aromatic vinyl monomer (where the hydrogenation of all double bonds except for the aromatic groups is at least 50%), and a domain 2 is made up of crosslinked product of ethylene polymer or ethylene/α-olefin copolymer (where the α-olefin has from 3 to 20 carbons).

    摘要翻译: 挡风玻璃组合物包括以下聚合物A组和聚合物B组,聚合物A组。 聚合物组由由乙烯聚合物,乙烯/α-烯烃共聚物(其中α-烯烃具有3-20个碳原子)组成的组中的聚合物的交联产物,乙烯/ 烯烃/二烯共聚物(其中α-烯烃具有3至20个碳原子),共轭二烯单体的均聚物橡胶,共轭二烯单体和芳族乙烯基单体聚合的共聚物和与共轭二烯单体聚合的氢化共聚物 芳香族乙烯基单体(除了芳香族基团以外的全部双键的氢化为至少50%),结构域2由乙烯聚合物或乙烯/α-烯烃共聚物的交联体(其中α- 烯烃具有3至20个碳)。