Impedance matching transceiver
    92.
    发明授权

    公开(公告)号:US11296670B2

    公开(公告)日:2022-04-05

    申请号:US16750625

    申请日:2020-01-23

    Abstract: Impedance matching transceivers may include a tuning circuit to match the transceiver module impedance to the housing conditions. In some examples, the impedance matching is controlled by tuning-circuits that may be integrated into a transceiver module by using a fan-out package (FO PKG). One example of a tuning circuit may include a switch to isolate the parallel capacitors, such that when the switch is on or closed the parallel capacitors are active.

    INTEGRATED CIRCUIT (IC) WITH RECONSTITUTED DIE INTERPOSER FOR IMPROVED CONNECTIVITY, AND RELATED METHODS OF FABRICATION

    公开(公告)号:US20220084947A1

    公开(公告)日:2022-03-17

    申请号:US17024214

    申请日:2020-09-17

    Abstract: An integrated circuit (IC) with reconstituted die interposer for improved connectivity has at least one device or component mounted on an exterior upper surface that couples to a die in an interposer layer within the package. The interposer layer may have interconnect structures, where a first interconnect structure has vias of a first pitch and a second interconnect structure has vias of a second pitch greater than the first pitch. In this manner, the interposer layer acts as a device that can allow conductive coupling for other devices with those pitches to support interconnections between those devices and other devices within the interposer layer.

    Die-to-wafer hybrid bonding with forming glass

    公开(公告)号:US11152272B2

    公开(公告)日:2021-10-19

    申请号:US16682554

    申请日:2019-11-13

    Abstract: Certain aspects provide a three-dimensional integrated circuit (3DIC) and techniques for fabricating a 3DIC. For example, certain aspects provide a semiconductor device that generally includes one or more first integrated circuits (ICs), a first plurality of pads coupled to components of the one or more first ICs, one or more second ICs, forming glass (FG) material disposed adjacent to the one or more second ICs, and a second plurality of pads, wherein at least one of the second plurality of pads is coupled to components of the one or more second ICs, and wherein at least a portion of the first plurality of pads is bonded to at least a portion of the second plurality of pads.

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