Analog to digital converter for solid-state image pickup device
    91.
    发明授权
    Analog to digital converter for solid-state image pickup device 有权
    用于固态摄像装置的模数转换器

    公开(公告)号:US08736732B2

    公开(公告)日:2014-05-27

    申请号:US12722121

    申请日:2010-03-11

    IPC分类号: H04N5/335

    摘要: There is provided a solid-state image pickup device including ADCs that can be arranged in a limited space. The potential of a pixel signal outputted through a vertical readout line is held at a node. A plurality of capacitors are capacitively coupled to the node at which the pixel signal is held. The potential of the node is decreased in a stepwise manner by sequentially switching the voltages of the counter electrodes of the capacitors by the control of transistors. A comparator compares the potential of the node with the potential of the dark state of the pixel, and determines the upper bits of a digital value when the potential of the node becomes lower than the potential of the dark state. Following this, the conversion of the lower bits of the digital value is started. Therefore, it is possible to simplify the configuration of each ADC and arrange each ADC in a limited space.

    摘要翻译: 提供了包括可以在有限空间中布置的ADC的固态图像拾取装置。 通过垂直读出线输出的像素信号的电位被保持在节点处。 多个电容器电容耦合到保持像素信号的节点。 通过晶体管的控制,通过依次切换电容器对置电极的电压,逐步降低节点的电位。 比较器将节点的电位与像素的暗状态的电位进行比较,并且当节点的电位变得低于黑暗状态的电位时,确定数字值的高位。 此后,开始数字值的低位的转换。 因此,可以简化每个ADC的配置,并将每个ADC排列在有限的空间内。

    Oscillator and charge pump circuit using the same
    94.
    发明授权
    Oscillator and charge pump circuit using the same 失效
    振荡器和电荷泵电路使用相同

    公开(公告)号:US07804368B2

    公开(公告)日:2010-09-28

    申请号:US12155876

    申请日:2008-06-11

    IPC分类号: H03B27/00

    CPC分类号: H03K3/0315 H03K17/063

    摘要: The present invention provides a current-limited oscillator capable of performing stable operation even when it is driven with a low power-supply voltage, and a charge pump circuit using the oscillator. A current-limited oscillator has a delay section that includes a plurality of series-connected inverters to delay an output pulse on the basis of a current limiting level indication signal, and the oscillator further includes at least one first transistor that limits a first current between the inverters and a high potential power supply and at least one second transistor that limits a second current between the inverters and a low potential power supply, wherein at least one of the plurality of inverters is configured as a first inverter that is connected with the first transistor and is not connected with the second transistor, and at least another of the plurality of inverters is configured as a second inverter that is not connected with the first transistor and is connected with the second transistor.

    摘要翻译: 本发明提供一种即使在以低电源电压驱动的情况下也能够稳定工作的电流限制型振荡器和使用该振荡器的电荷泵电路。 限流振荡器具有延迟部分,该延迟部分包括多个串联的反相器,用于基于限流电平指示信号来延迟输出脉冲,并且该振荡器还包括至少一个第一晶体管,其限制第一电流 所述逆变器和高电位电源以及限制所述逆变器之间的第二电流和低电位电源的至少一个第二晶体管,其中所述多个逆变器中的至少一个被配置为与所述第一逆变器连接的第一逆变器 并且不与第二晶体管连接,并且多个反相器中的至少另一个被配置为不与第一晶体管连接并与第二晶体管连接的第二反相器。

    SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT
    95.
    发明申请
    SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT 失效
    包括内部电压发生电路的半导体器件

    公开(公告)号:US20100109761A1

    公开(公告)日:2010-05-06

    申请号:US12683838

    申请日:2010-01-07

    IPC分类号: G05F1/10

    CPC分类号: G05F1/468 G11C5/025 G11C5/147

    摘要: A semiconductor integrated circuit device has a negative voltage generation circuit provided at each power supply circuit unit for six memory macros. Therefore, the response with respect to variation in a negative voltage is increased. In a standby mode, a negative voltage supply line for the six memory macros is connected by a switch circuit, and only a negative voltage generation circuit of one power supply circuit unit among six negative voltage generation circuits of the six power supply circuit units is rendered active. Thus, increase in standby current can be prevented.

    摘要翻译: 半导体集成电路器件具有设置在每个用于六个存储器宏的电源电路单元的负电压产生电路。 因此,相对于负电压的变化的响应增加。 在待机模式下,通过开关电路连接六个存储器宏的负电压供给线,并且仅在六个电源电路单元的六个负电压产生电路中仅一个电源电路单元的负电压产生电路 活性。 因此,可以防止待机电流的增加。

    SOLID STATE IMAGING DEVICE
    96.
    发明申请
    SOLID STATE IMAGING DEVICE 审中-公开
    固态成像装置

    公开(公告)号:US20100033609A1

    公开(公告)日:2010-02-11

    申请号:US12473876

    申请日:2009-05-28

    IPC分类号: H04N5/335

    CPC分类号: H04N5/3742 H04N5/378

    摘要: To obtain a solid state imaging device having a data transfer function capable of outputting digital data after A/D conversion to the outside in a high speed.Each of eight stage data blocks in a data bus part has a data line pair and an amplifier part which is coupled to the data line pair. Then, the amplifier part amplifies a signal of the data line pair on an amplifier data line pair to output the amplified signal as block data outputs at timing indicated by an amplifier enable signal and an amplifier control signal. Further, the eight stage data blocks are coupled with each other from the first stage to the last stage so that the preceding stage block data outputs may be provided to the following stage data line pair as block data inputs, respectively.

    摘要翻译: 获得具有数据传送功能的固态成像装置,该数据传输功能能够在高速A / D转换到外部之后输出数字数据。 数据总线部分中的八级数据块中的每一个具有数据线对和耦合到数据线对的放大器部分。 然后,放大器部分放大放大器数据线对上的数据线对的信号,以在由放大器使能信号和放大器控制信号指示的定时处输出放大信号作为块数据输出。 此外,八级数据块从第一级到最后级彼此耦合,使得前级级块数据输出可以分别作为块数据输入提供给后级数据线对。

    Temperature detecting semiconductor device
    97.
    发明申请
    Temperature detecting semiconductor device 审中-公开
    温度检测半导体器件

    公开(公告)号:US20090058543A1

    公开(公告)日:2009-03-05

    申请号:US12289230

    申请日:2008-10-23

    IPC分类号: G01K7/00

    CPC分类号: G01K7/01

    摘要: There is provided a technique which is capable of detecting a temperature of a semiconductor device with high precision. A temperature detection circuit detecting a temperature of a semiconductor device includes a first short-cycle oscillator generating a first clock signal having positive temperature characteristics with respect to a frequency, a second short-cycle oscillator generating a second clock signal having negative temperature characteristics with respect to the frequency, and a temperature signal generation unit generating a temperature signal which is varied according to the temperature of the semiconductor device based on the first and second clock signals.

    摘要翻译: 提供了能够高精度地检测半导体器件的温度的技术。 检测半导体器件的温度的温度检测电路包括:第一短周期振荡器,其产生相对于频率具有正温度特性的第一时钟信号;第二短周期振荡器,产生具有负温度特性的第二时钟信号 以及温度信号生成单元,其基于第一和第二时钟信号产生根据半导体器件的温度而变化的温度信号。

    Temperature detecting semiconductor device
    98.
    发明授权
    Temperature detecting semiconductor device 有权
    温度检测半导体器件

    公开(公告)号:US07459983B2

    公开(公告)日:2008-12-02

    申请号:US11452317

    申请日:2006-06-14

    IPC分类号: G01K7/00

    CPC分类号: G01K7/01

    摘要: There is provided a technique which is capable of detecting a temperature of a semiconductor device with high precision. A temperature detection circuit detecting a temperature of a semiconductor device includes a first short-cycle oscillator generating a first clock signal having positive temperature characteristics with respect to a frequency, a second short-cycle oscillator generating a second clock signal having negative temperature characteristics with respect to the frequency, and a temperature signal generation unit generating a temperature signal which is varied according to the temperature of the semiconductor device based on the first and second clock signals.

    摘要翻译: 提供了能够高精度地检测半导体器件的温度的技术。 检测半导体器件的温度的温度检测电路包括:第一短周期振荡器,其产生相对于频率具有正温度特性的第一时钟信号;第二短周期振荡器,产生具有负温度特性的第二时钟信号 以及温度信号生成单元,其基于第一和第二时钟信号产生根据半导体器件的温度而变化的温度信号。

    Internal voltage generating circuit and semiconductor integrated circuit device
    99.
    发明授权
    Internal voltage generating circuit and semiconductor integrated circuit device 有权
    内部电压发生电路和半导体集成电路器件

    公开(公告)号:US07456680B2

    公开(公告)日:2008-11-25

    申请号:US11135488

    申请日:2005-05-24

    IPC分类号: G05F1/10 G05F3/02

    CPC分类号: G05F1/465

    摘要: A voltage for reference at a voltage level higher than a target value is produced from a constant current provided from a constant current generating circuit, and is subjected to resistance division by a resistance division circuit to produce a reference voltage at the target level, and then a final reference voltage is produced by a voltage follower. An internal voltage generating circuit thus provided can generate the reference voltage having the desired voltage level with high accuracy as well as an internal voltage based on the reference voltage by controlling temperature characteristic even with a low power supply voltage.

    摘要翻译: 在从恒定电流产生电路提供的恒定电流中产生高于目标值的电压电压的参考电压,并通过电阻分割电路进行电阻分割以产生目标电平的参考电压,然后 最终的参考电压由电压跟随器产生。 由此提供的内部电压产生电路即使在低电源电压下也可以通过控制温度特性,以高精度产生具有所需电压电平的基准电压以及基于参考电压的内部电压。

    Semiconductor memory device
    100.
    发明申请
    Semiconductor memory device 有权
    半导体存储器件

    公开(公告)号:US20070263466A1

    公开(公告)日:2007-11-15

    申请号:US11797804

    申请日:2007-05-08

    IPC分类号: G11C7/02

    摘要: When data “1” is stored in a memory cell, a bit line is driven to an H level (control line drive potential) and the other bit line is driven to an L level (reference potential) when a sense operation is completed. When a verify write operation is initiated, a charge line is driven from an H level (power supply potential) to an L level (reference potential). By the GIDL current from a source line, accumulation of holes is initiated again for a storage node subsequent to discharge of holes, whereby the potential of the storage node rises towards an H level (period α). When the charge line is driven to an H level from an L level, the potential of the storage node further rises (period β).

    摘要翻译: 当数据“1”被存储在存储单元中时,当感测操作完成时,位线被驱动到H电平(控制线驱动电位),另一个位线被驱动到L电平(参考电位)。 当启动验证写操作时,充电线从H电平(电源电位)驱动到L电平(参考电位)。 通过来自源极线的GIDL电流,在空穴放电之后对于存储节点再次开始空穴累积,由此存储节点的电位向上升到H电平(周期α)。 当充电线从L电平驱动到H电平时,存储节点的电位进一步上升(周期β)。