摘要:
An intake valve device includes a throttle body defining a bore for the flow of intake air. A throttle shaft is rotatably mounted to the throttle body. A slit is formed in the throttle shaft in a diametrical direction and extends throughout the diameter of the throttle shaft. The slit has opposing end walls along the rotational axis of the throttle shaft. A throttle valve is inserted into the slit of the throttle shaft and fixed in position relative to the throttle shaft. Possible intake air leakage channels are defined between the outer periphery of the throttle valve and the end walls of the slit. At least one restriction portion is formed on the throttle valve so as to extend into at least one of the possible leakage channels in order to narrow the possible leakage channel and reduce or inhibit the leakage of intake air.
摘要:
A storage construction in which a spare tire of a motor vehicle is stored, comprising: a tire storage portion for storing the spare tire, which is disposed under a floor panel of the motor vehicle; a hoisting cable at one end of which a hanger engageable with a hub hole of the spare tire is provided; a hoist around which the other end of the hoisting cable is wound and which lifts the spare tire by winding the hoisting cable so as to store the spare tire in the tire storage portion and lowers the spare tire from the tire storage portion by unwinding the hoisting cable; an operating handle which is detachably inserted into an insertion portion of the hoist from a cabin of the motor vehicle such that winding and unwinding of the hoisting cable by the hoist are performed by operating the operating handle; a detachment preventing device which prevents detachment of the operating handle from the hoist before the spare tire is lifted to a hoisting completion position by the hoist; and a contact member which is secured to the hoisting cable and is brought into contact, when the spare tire has been lifted to the hoisting completion position by the hoist, with the detachment preventing device so as to set the detachment preventing device to an inoperative state such that the operating handle can be detached from the hoist.
摘要:
A word processor is provided with a handwriting text processing function. A display displays document and text processing information. A pointing device enters handwritten text processing figures on a display. A memory stores text processing instructions associated with an text processing figure drawn on the screen. A direction in which the pointing device is moved on the screen to draw a figure, a length of the drawn figure on the screen, and/or which of several regions of the display the pointing device is presently pointing to are determined and used to distinguish different text processing functions associated with the same basic handwritten text processing figure. The word processor uses this information to selectively execute different kinds of text processing instructions such as an up-scroll of the screen, a down-scroll of the screen, a display of document head, a display of document tail, a display of underline, a display of line head, an arbitrary cursor movement, and a cursor shift on the same line.
摘要:
To process a signal from a plurality of detectors without being affected by a variation in the height of a substrate, and to detect more minute defects on the substrate, a defect inspection device is provided with a photoelectric converter having a plurality of rows of optical sensor arrays in each of first and second light-collecting/detecting unit and a processing unit for processing a detection signal from the first and the second light-collecting/detecting unit to determine the extent to which the positions of the focal points of the first and the second light-collecting/detecting unit are misaligned with respect to the surface of a test specimen, and processing the detection signal to correct a misalignment between the first and the second light-collecting/detecting unit, and the corrected detection signal outputted from the first and the second light-collecting/detecting unit are combined together to detect the defects on the test specimen.
摘要:
An invention being applied is a defect detecting apparatus that has: an illuminating optical system with a laser light source for irradiating a sample on whose surface a pattern is formed with light; a detecting optical system with a sensor for detecting light generated from the sample illuminated by the illuminating optical system; and a signal processing unit that extracts a defect from an image based on the light detected by the detecting optical system, in which an amplification rate of the sensor is dynamically changed during a time when the light is detected by the detecting optical system.
摘要:
A defect inspection method includes: illuminating an area on surface of a specimen as a test object under a specified illumination condition; scanning a specimen to translate and rotate the specimen; detecting scattering lights to separate each of scattering lights scattered in different directions from the illuminated area on the specimen into pixels to be detected according to a scan direction at the scanning a specimen and a direction approximately orthogonal to the scan direction; and processing to perform an addition process on each of scattering lights that are detected at the step and scatter approximately in the same direction from approximately the same area of the specimen, determine presence or absence of a defect based on scattering light treated by the addition process, and compute a size of the determined defect using at least one of the scattering lights corresponding to the determined defect.
摘要:
A defect inspection method and device for irradiating a linear region on a surface-patterned sample mounted on a planarly movable table, with illumination light from an inclined direction relative to a direction of a line normal to the sample, next detecting in each of a plurality of directions an image of the light scattered from the sample irradiated with the illumination light, then processing signals obtained by the detection of the images of the scattered light, and thereby detecting a defect present on the sample; wherein the step of detecting the scattered light image in the plural directions is performed through elliptical lenses in which elevation angles of the optical axes thereof are different from each other, within one plane perpendicular to a plane formed by the normal to the surface of the table on which to mount the sample and the longitudinal direction of the linear region irradiated with the irradiation light, the elliptical lenses being formed of circular lenses having left and right portions thereof cut.
摘要:
A communication processing device includes a communication data processing circuit that (i) issues an access request for a buffer specified by a descriptor, among a plurality of buffers in a first memory, and (ii) outputs a predetermined switching permission signal at a time when a data access for one of the plurality of buffers is completed. The communication processing device also includes a second memory and a transmission destination switching circuit. The second memory includes a plurality of alternative buffers corresponding to the plurality of buffers. The transmission destination switching circuit switches a transmission destination of the access request from one of the plurality of buffers in the first memory to one of the plurality of alternative buffers in the second memory, based on the switching permission signal.
摘要:
Proposed is a defect inspection method whereby: illuminating light having a substantially uniform illumination intensity distribution in one direction of a sample surface irradiated on the sample surface; multiple scattered light components, which are output in multiple independent directions, are detected among the scattered light from the sample surface and multiple corresponding scattered light detection signals are obtained; at least one of the multiple scattered light detection signals is processed and the presence of defects is determined; at least one of the multiple scattered light detection signals that correspond to each of the points determined by the processing as a defect is processed and the dimensions of the defect are determined; and the position and dimensions of the defect on the sample surface, at each of the points determined as a defect, are displayed.
摘要:
Disclosed is a defect inspection method which makes it possible to scan the entire surface of a sample and detect minute defects without causing thermal damage to the sample. A defect inspection method in which a pulse laser emitted from a light source is subjected to pulse division and irradiated on the surface of a sample which moves in one direction while the divided-pulse pulse laser is rotated, reflection light from the sample irradiated by the divided-pulse pulse laser is detected, the signal of the detected reflection light is processed to detect defects on the sample, and information regarding a detected defect is output to a display screen, wherein the barycentric position of the light intensity of the divided-pulse pulse laser is monitored and adjusted.