公开(公告)号：US11835525B2

公开(公告)日：2023-12-05

申请号：US16840220

申请日：2020-04-03

Applicant: MIFTEK CORPORATION

Inventor： Masanobu Yamamoto ,  J. Paul Robinson

IPC: G01N33/58 ,  B01L3/00 ,  G01N35/00 ,  G01N15/14 ,  G01N33/49 ,  G01N21/64

CPC classification number: G01N33/582 ,  B01L3/00 ,  G01N15/1427 ,  G01N15/1429 ,  G01N15/1434 ,  G01N33/4915 ,  G01N35/00069 ,  G01N15/1456 ,  G01N15/1459 ,  G01N15/1484 ,  G01N21/645 ,  G01N2035/00881 ,  G01N2201/1045

Abstract: A measurement system includes a system for causing relative motion between a sample and an irradiation spot. The sample includes fluorescent markers having respective wavelengths. A gating system provides a gating signal based at least in part on resultant light substantially at an irradiation wavelength. A detection system detects fluorescent light from the irradiated markers and provides detection signals representing the fluorescent light detected concurrently with a gate-open signal. In some examples, the detection system detects fluorescent light at multiple wavelengths and provides respective detection signals. A spectral discriminator arranged optically between the sample and the detection system receives the fluorescent light from the sample and provides respective fluorescent light at the wavelengths to the detection system. A flow cytometer can spectrally disperse resultant fluorescent light and measure the wavelengths separately. Light from a sample disposed over a reflective phase grating can be dispersed, measured, and gated.

公开(公告)号：US20160069794A1

公开(公告)日：2016-03-10

申请号：US14846934

申请日：2015-09-07

Applicant: University of Vienna

Inventor： Alipasha Vaziri ,  Robert Prevedel

IPC: G01N21/25 ,  G01N33/483

CPC classification number: G01N33/4833 ,  A61B5/4064 ,  G01J3/4406 ,  G01N21/636 ,  G01N21/6458 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2201/0635 ,  G01N2201/0697 ,  G01N2201/1045 ,  G02B21/02 ,  G02B21/16 ,  G02B2207/114

Abstract: Devices and methods for recording dynamics of cellular and/or biochemical processes, including a device including one or more dispersive elements configured to receive a pulsed laser beam with a spectrum of different wavelengths and disperse the spectrum of the pulsed laser beam; and one or more first elements configured to receive the dispersed spectrum of the pulsed laser beam, and generate a multiphoton excitation area in a biological sample by re-overlapping in time and space the dispersed spectrum of the pulsed laser beam on an area in the biological sample, wherein the device is configured to record at high speed changes of cellular and biochemical processes of a population of cells of the biological sample based on generation of the multiphoton excitation area in the biological sample.

Abstract translation: 用于记录细胞和/或生物化学过程的动力学的装置和方法，包括包括一个或多个分散元件的装置，其被配置为接收具有不同波长的光谱的脉冲激光束并分散脉冲激光束的光谱; 以及被配置为接收脉冲激光束的分散光谱的一个或多个第一元件，并且通过在脉冲激光束的时间和空间上重新重叠生物样品中的多光子激发区域，使脉冲激光束的分散光谱在生物样品中的一个区域上 样品，其中所述装置被配置为基于所述生物样品中的多光子激发区域的产生，高速地记录所述生物样品的细胞群的细胞和生化过程的变化。

公开(公告)号：US20150041658A1

公开(公告)日：2015-02-12

申请号：US14385033

申请日：2012-04-10

Applicant: Hyang-Sook Chun ,  Sung-Wook Choi ,  Hyun-Joo Chang ,  Na-Ri Lee ,  Gyeong-Sik Ok

Inventor： Hyang-Sook Chun ,  Sung-Wook Choi ,  Hyun-Joo Chang ,  Na-Ri Lee ,  Gyeong-Sik Ok

IPC: G01N21/35 ,  G02B3/00

CPC classification number: G01N21/3581 ,  G01N21/8806 ,  G01N21/94 ,  G01N2201/06113 ,  G01N2201/1045 ,  G01N2201/105 ,  G02B3/00 ,  H01Q15/08

Abstract: An object inspection apparatus includes a terahertz wave supplying unit for generating a terahertz wave and moving a path of the terahertz wave according to time so that the terahertz wave is supplied to an object to be inspected, a focusing lens located between the terahertz wave supplying unit and the object to be inspected to focus the terahertz wave supplied by the terahertz wave supplying unit, a rotating plate having a plate shape and including a plurality of the focusing lenses with different distances from the center thereof, the rotating plate rotating in the circumferential direction so that one of the focusing lenses is located at a path of the terahertz wave according to the path movement of the terahertz wave, and a terahertz wave detecting unit for collecting and detecting a terahertz wave incident to the object to be inspected.

Abstract translation: 物体检查装置包括：太赫兹波提供单元，用于产生太赫兹波，并根据时间移动太赫兹波的路径，使得太赫兹波被提供给被检测物体;聚焦透镜，位于太赫波提供单元 以及要被检查的物体聚焦太赫兹波供给单元提供的太赫兹波，具有板形的旋转板，并且包括多个离其中心距离不同的聚焦透镜，旋转板沿圆周方向旋转 使得一个聚焦透镜根据太赫兹波的路径移动位于太赫兹波的路径，以及用于收集和检测入射到待检查对象的太赫兹波的太赫兹波检测单元。

公开(公告)号：US07595874B1

公开(公告)日：2009-09-29

申请号：US11672794

申请日：2007-02-08

Applicant: Vladimir M. Pelekhaty ,  Anatoliy Kachurin ,  William Warren ,  Kenneth Church ,  Heather Fahlenkamp ,  Russell Higbee

Inventor： Vladimir M. Pelekhaty ,  Anatoliy Kachurin ,  William Warren ,  Kenneth Church ,  Heather Fahlenkamp ,  Russell Higbee

IPC: G01J3/30

CPC classification number: G01N21/6458 ,  G01N1/36 ,  G01N15/1434 ,  G01N2201/104 ,  G01N2201/1045 ,  G01N2201/112 ,  G02B21/26 ,  G02B21/365

Abstract: Detection of a rarely occurring event within one or more biological samples includes (a) processing each biological sample to provide a gellable liquid solution comprising concentrated biological sample and a flourochrome designed to associate with a rarely occurring event within the concentrated biological sample; (b) depositing the solution in a layer on a surface of a slide; and (c) scanning the solution on the slide with energy adapted to cause fluorescence of the flourochrome to detect potential instances of the rarely occurring event within the concentrated biological sample in the solution.

Abstract translation: 在一个或多个生物样品中检测到很少发生的事件包括（a）处理每个生物样品以提供包含浓缩的生物样品和设计成与浓缩的生物样品中罕见事件相关的荧光染料的可胶凝液体溶液; （b）将溶液沉积在载玻片表面上的层中; 和（c）用适于引起荧光色素的能量扫描载玻片上的溶液以检测溶液中浓缩的生物样品内很少发生的事件的潜在情况。

公开(公告)号：US5377001A

公开(公告)日：1994-12-27

申请号：US913236

申请日：1992-07-14

Applicant: Cosmas Malin ,  Edgar F. Steigmeier ,  Thomas Nesensohn ,  Harry L. Sawatzki ,  Heinrich Auderset

Inventor： Cosmas Malin ,  Edgar F. Steigmeier ,  Thomas Nesensohn ,  Harry L. Sawatzki ,  Heinrich Auderset

IPC: G01M11/02 ,  G01N21/89 ,  G01N21/93 ,  G01N21/95 ,  G01N21/00

CPC classification number: G01M11/0278 ,  G01N21/9501 ,  G01N2021/8822 ,  G01N2021/8867 ,  G01N2021/8907 ,  G01N21/93 ,  G01N21/9503 ,  G01N2201/1045

Abstract: This apparatus permits the non-destructive examination of entire surfaces for defects and contamination, and can detect microscopically small dot-shaped and linear defects and extremely fine macroscopic non-homogeneous areas. For this purpose, an astigmatic lens system (5) is placed in the optical path between light source (2) and objective (9) which produces a cigar-shaped intermediate image (31), in which the feed offset in scanning the surface (10) depends on the intermediate image (31) and is equal to the length of the intermediate image (31) projected upon this surface (10). A dark-field stop assembly (18) with an adjustable dark-field deflection system (8) is placed in the optical path between the lens system (5) and the objective (9), which projects the light beam (1) after deflection exactly centered at right angles through the objective (9) upon the surface of the object (10). The light reflected by the surface (10) and collected by the objective (9) is projected to a photo detector. An electronic analysis system (21) breaks down the amplified output signals from the photo detector (19) into measured values due to dot-shaped, linear, and planiform defects. The electronic analysis system (21) is connected via a computer unit (22) to peripheral equipment (23, 24, 25) which permits the representation of all the measured values obtained in a measuring cycle.

Abstract translation: 该装置允许对整个表面进行无损检测以用于缺陷和污染，并且可以检测微小的点状和线性缺陷以及极细的宏观非均匀区域。 为此目的，将散光透镜系统（5）放置在光源（2）和物镜（9）之间的光路中，产生一个雪茄形中间图像（31），其中扫描表面的进给偏移 10）取决于中间图像（31）并且等于投影在该表面（10）上的中间图像（31）的长度。 具有可调暗场偏转系统（8）的暗场停止组件（18）被放置在透镜系统（5）和物镜（9）之间的光路中，其在偏转之后突出光束（1） 在物体（10）的表面上通过物镜（9）以正交的角度准确地居中。 由表面（10）反射并由物镜（9）收集的光被投射到光电探测器。 电子分析系统（21）由于点状，线性和平面状缺陷将放大的从光检测器（19）输出的信号分解为测量值。 电子分析系统（21）经由计算机单元（22）连接到外围设备（23,24,25），其允许表示在测量周期中获得的所有测量值。

公开(公告)号：US4822165A

公开(公告)日：1989-04-18

申请号：US062182

申请日：1987-06-15

Applicant: Harald Schmalfuss ,  Friedel Sinsel ,  Reinhold Bolz

Inventor： Harald Schmalfuss ,  Friedel Sinsel ,  Reinhold Bolz

IPC: G01M11/00 ,  G01N21/88 ,  G01N21/95 ,  G01N21/958 ,  G02B26/10

CPC classification number: G01N21/8806 ,  G01N2021/9511 ,  G01N2201/1045

Abstract: A device for illuminating components of transparent material by dot-scanning so that the components may be tested for surface irregularities and occlusions which comprises a component rotatably mounted so that the component may be rotated on its axis at a predetermined speed, a light source for generating a parallel light beam for illuminating the component, and a mechanism for periodically linearly deflecting the light beam at a frequency greater than the predetermined rotational speed of the component. The periodically linearly deflecting mechanism is disposed in the path of the light beam between the parallel light beam generating source and the component. The device also includes a focusing lens for focusing the light beam in a testing plane, where the focusing lens is disposed between the periodically linearly deflecting mechanism and the component at a location whereby the focal point of the focusing lens is at the edge of the periodically linearly deflecting mechanism. The device further includes an adjustable tilting mirror disposed between the focusing lens and the component for deflecting the light beam onto the component, whereby the dot-scanning light beam can then be detected by a testing device.

Abstract translation: 一种用于通过点阵扫描来照亮透明材料的部件的装置，使得可以测试这些部件的表面不规则性和遮挡物，其包括可旋转地安装的部件，使得部件可以以其预定速度在其轴线上旋转，用于产生光源 用于照亮部件的平行光束，以及用于以大于部件的预定旋转速度的频率周期性地线性偏转光束的机构。 周期性线性偏转机构设置在平行光束产生源和部件之间的光束的路径中。 该装置还包括用于将光束聚焦在测试平面中的聚焦透镜，其中聚焦透镜设置在周期性线性偏转机构和位置之间的部件处，由此聚焦透镜的焦点位于周期性 线性偏转机制。 该装置还包括设置在聚焦透镜和部件之间的可调节倾斜镜，用于将光束偏转到部件上，由此可以由测试装置检测点扫描光束。

公开(公告)号：US4747684A

公开(公告)日：1988-05-31

申请号：US89893

申请日：1987-08-27

Applicant: Sidney Weiser

Inventor： Sidney Weiser

IPC: G01N21/55 ,  G01N21/01 ,  G01N21/47

CPC classification number: G01N21/55 ,  G01N2201/1045 ,  G01N2201/1087

Abstract: A specific small area of a crystal sample is scanned by a laser beam which rotates about an axis substantially perpendicular to the sample surface such that the intersection of the beam with a plane above and parallel to the surface describes a true spiral or a stepwise spiral pattern. The laser beam is reflected different amounts for different beam positions to produce a reflectance pattern indicative of crystallographic orientation.

Abstract translation: 晶体样品的特定小区域被激光束扫描，激光束围绕基本上垂直于样品表面的轴线旋转，使得光束与平面在平面上方并且平行于表面的交叉描述了真正的螺旋或逐步螺旋图案 。 对于不同的光束位置，激光束被反射不同的量以产生指示晶体取向的反射率图案。

公开(公告)号：US08139840B1

公开(公告)日：2012-03-20

申请号：US12100500

申请日：2008-04-10

Applicant: Yunxian Chu ,  Alexander Slobodov

Inventor： Yunxian Chu ,  Alexander Slobodov

IPC: G06K9/00

CPC classification number: G01N21/8851 ,  G01N21/9501 ,  G01N2021/8825 ,  G01N2021/8864 ,  G01N2021/8896 ,  G01N2021/95676 ,  G01N2201/1045

Abstract: An inspection system and method for serial high-speed image data transfer is provided herein. According to one embodiment, the method may include receiving multiple channels of image data at an input data rate and buffering the image data at the input data rate until the buffered data reaches a predetermined size. Once the predetermined size has been reached, the method may include packing the buffered data, encoding the data packet, serializing the encoded data packet and converting the encoded data packet into an optical signal. In some cases, the image data may be packed along with a data header containing information about the system. Once converted, each optical signal (i.e., representing one data packet) may be transmitted serially over one or more fibre channels to a processing node of the inspection system. In most cases, the data is packed, encoded, serialized and transmitted to the processing node at a data rate much higher than the input data rate. The processing node analyzes the optical signal to detect defects on a specimen under inspection.

Abstract translation: 本文提供了一种用于串行高速图像数据传输的检查系统和方法。 根据一个实施例，该方法可以包括以输入数据速率接收多个通道的图像数据，并以输入数据速率缓冲图像数据，直到缓冲的数据达到预定的大小。 一旦达到预定尺寸，该方法可以包括打包缓冲数据，对数据包进行编码，串行编码数据包并将编码数据包转换成光信号。 在一些情况下，图像数据可以与包含关于系统的信息的数据标题一起打包。 一旦转换，每个光信号（即，表示一个数据分组）可以通过一个或多个光纤信道被串行发送到检查系统的处理节点。 在大多数情况下，数据被打包，编码，串行化并以比输入数据速率高得多的数据速率传送到处理节点。 处理节点分析光信号，检测被检样品上的缺陷。

公开(公告)号：US20100085561A1

公开(公告)日：2010-04-08

申请号：US12571791

申请日：2009-10-01

Applicant: Eiji KAMIYAMA ,  Takehiro TSUNEMORI ,  Kazuhiro YAMAMOTO ,  Kenji AOKI

Inventor： Eiji KAMIYAMA ,  Takehiro TSUNEMORI ,  Kazuhiro YAMAMOTO ,  Kenji AOKI

IPC: G01N21/00

CPC classification number: G01N21/9501 ,  G01N2201/1045 ,  G01N2201/106

Abstract: A laser scattering defect inspection system includes: a stage unit that rotates a workpiece W and transports the workpiece W in one direction; a laser light source that emits a laser beam LB toward the workpiece W mounted on the stage unit; an optical deflector that scans the laser beam LB emitted from the laser light source on the workpiece W; an optical detector that detects the laser beam LB scattered from the surface of the workpiece W; a storage unit that stores defect inspection conditions for each inspection step of a manufacturing process of the workpiece W, where the conditions include the rotation speed and the moving speed of the workpiece W by the stage unit, the scan width on the workpiece W and the scan frequency by the optical deflector; and a control unit that reads the defect inspection conditions stored for each inspection step in the storage unit and controls the driving of the stage unit and the optical deflector under the conditions.

Abstract translation: 激光散射缺陷检查系统包括：台架单元，其使工件W旋转并沿一个方向输送工件W; 激光光源，其向安装在平台单元上的工件W发射激光束LB; 光学偏转器，其对从工件W上的激光光源发射的激光束LB进行扫描; 检测从工件W的表面散射的激光束LB的光检测器; 存储单元，其存储工件W的制造过程的每个检查步骤的缺陷检查条件，其中条件包括工件W的工件W的转速和移动速度，工件W上的扫描宽度和 扫描频率由光学偏转器; 以及控制单元，其读取存储单元中的每个检查步骤存储的缺陷检查条件，并且在条件下控制台单元和光偏转器的驱动。

公开(公告)号：US07088443B2

公开(公告)日：2006-08-08

申请号：US10360512

申请日：2003-02-06

Applicant: Mehdi Vaez-Iravani ,  Guoheng Zhao ,  Stanley E. Stokowski

Inventor： Mehdi Vaez-Iravani ,  Guoheng Zhao ,  Stanley E. Stokowski

IPC: G01N21/00

CPC classification number: G01N21/95623 ,  G01N21/47 ,  G01N21/94 ,  G01N2201/1045

Abstract: A cylindrical mirror or lens is used to focus an input collimated beam of light onto a line on the surface to be inspected, where the line is substantially in the plane of incidence of the focused beam. An image of the beam is projected onto an array of charge-coupled devices parallel to the line for detecting anomalies and/or features of the surface, where the array is outside the plane of incidence of the focused beam. For inspecting surface with a pattern thereon, the light from the surface is first passed through a spatial filter before it is imaged onto the charge-coupled devices. The spatial filter includes stripes of scattering regions that shift in synchronism with relative motion between the beam and the surface to block Fourier components from the pattern. The spatial filter may be replaced by reflective strips that selectively reflects scattered radiation to the detector, where the reflective strips also shifts in synchronism with the relative motion.

Abstract translation: 使用圆柱形镜或透镜将输入的准直光束聚焦到要检查的表面上的线上，其中线基本上在聚焦束的入射平面中。 光束的图像被投影到平行于线的电荷耦合器件的阵列上，用于检测表面的异常和/或特征，其中阵列位于聚焦光束的入射平面之外。 为了在其上检查具有图案的表面，来自表面的光首先在其被成像到电荷耦合器件之前通过空间滤光器。 空间滤波器包括散射区域的条带，其与波束和表面之间的相对运动同步地移动，以阻止来自图案的傅立叶分量。 空间滤波器可以被选择性地将散射的辐射反射到检测器的反射条替代，其中反射条也与相对运动同步地移动。