公开(公告)号：US07388676B2

公开(公告)日：2008-06-17

申请号：US11335393

申请日：2006-01-18

Applicant: Yasuhiro Sawada

Inventor： Yasuhiro Sawada

IPC: G01N21/41

CPC classification number: G01M11/0228 ,  G01N21/45

Abstract: An image processing apparatus is disclosed which can produce refractive index distribution data with high accuracy without limiting directions in which transmitted wavefronts are measured. The image processing apparatus has a simulating section which simulates a transmitted wavefront in each of the directions to produce a second transmitted wavefront image based on first refractive index distribution data, a comparing section which produces first information indicating the result of comparison between the second transmitted wavefront image and the first transmitted wavefront image, and a changing section which changes the first refractive index distribution data based on the first information to produce second refractive index distribution data. In the apparatus, the processing in the sections is repeated using the second refractive index distribution data as the first refractive index distribution data to produce the resulting second refractive index distribution data which is used as the output refractive index distribution data.

Abstract translation: 公开了一种图像处理装置，其可以高精度地产生折射率分布数据，而不限制测量透射波前的方向。 该图像处理装置具有模拟部分，其模拟在每个方向上的发射波前，以基于第一折射率分布数据产生第二透射波前图像;比较部分，其产生指示第二透射波阵面之间的比较结果的第一信息 图像和第一透射波前图像，以及改变部分，其基于第一信息改变第一折射率分布数据，以产生第二折射率分布数据。 在该装置中，使用第二折射率分布数据作为第一折射率分布数据重复各部分中的处理，以产生用作输出折射率分布数据的所得到的第二折射率分布数据。

公开(公告)号：US07304747B2

公开(公告)日：2007-12-04

申请号：US11604668

申请日：2006-11-27

Applicant: Xavier Colonna De Lega

Inventor： Xavier Colonna De Lega

IPC: G01B11/02 ,  G01B9/02

CPC classification number: G01B9/02084 ,  G01B9/02058 ,  G01B9/0209 ,  G01B11/2441 ,  G01M11/0228 ,  G01M11/0271 ,  G01N21/45

Abstract: Methods and related systems for determining properties of optical systems (e.g., interferometers) and/or optical elements (e.g., lenses and/or lens systems) are described. For example, information related to an optical thickness mismatch of an interferometer can be determined by providing scanning interferometry data. The data typically include obtaining one or more interference signals each corresponding to a different spatial location of a test object. A phase is determined for each of multiple frequencies of each interference signal. The information related to the optical thickness mismatch is determined based on the phase for each of the multiple frequencies of the interference signal(s).

公开(公告)号：US20070146687A1

公开(公告)日：2007-06-28

申请号：US10587348

申请日：2004-10-19

Applicant: Fabien Divo ,  Stephane Boutinon

Inventor： Fabien Divo ,  Stephane Boutinon

IPC: G01B9/00

CPC classification number: G02C13/005 ,  B24B9/146 ,  B24B13/0055 ,  G01M11/0228

Abstract: The device includes receiver elements (121, 114) for receiving the ophthalmic lens; on either side of the receiver elements, firstly lighting elements (S) for illuminating the ophthalmic lens (103) installed on the receiver elements, and secondly acquisition elements (122, 125, C) for acquiring the shadow of the ophthalmic lens illuminated by the lighting elements (S); measurement elements (S, 124, C) suitable for measuring the optical deflection power exerted by the ophthalmic lens on at least one light ray and for delivering a signal representative of the deflection power; and an electronic and computer system including geometrical correction calculation instructions for deducing from the measured deflection power a corrected shape for at least a portion of the shadow of the ophthalmic lens as perceived by the acquisition elements (122, 125, C).

Abstract translation: 该装置包括用于接收眼科镜片的接收器元件（121,114） 在接收器元件的任一侧上，首先是用于照亮安装在接收器元件上的眼科镜片（103）的照明元件（S），其次用于获取由所述接收器元件照亮的眼镜​​片的阴影的采集元件（122,125，C） 照明元件（S）; 测量元件（S，124，C），适于测量由至少一个光线引起的眼科镜片所产生的光学偏转能力，并传递代表偏转光焦度的信号; 以及包括几何校正计算指令的电子和计算机系统，用于根据所测量的偏转功率，对由所述获取元件（122,125，C）感知到的所述眼科镜片的阴影的至少一部分进行校正的形状。

公开(公告)号：US07142311B2

公开(公告)日：2006-11-28

申请号：US11131649

申请日：2005-05-17

Applicant: Xavier Colonna De Lega

Inventor： Xavier Colonna De Lega

IPC: G01B11/02

CPC classification number: G01B9/02084 ,  G01B9/02058 ,  G01B9/0209 ,  G01B11/2441 ,  G01M11/0228 ,  G01M11/0271 ,  G01N21/45

Abstract: Methods and related systems for determining properties of optical systems (e.g., interferometers) and/or optical elements (e.g., lenses and/or lens systems) are described. For example, information related to an optical thickness mismatch of an interferometer can be determined by providing scanning interferometry data. The data typically include obtaining one or more interference signals each corresponding to a different spatial location of a test object. A phase is determined for each of multiple frequencies of each interference signal. The information related to the optical thickness mismatch is determined based on the phase for each of the multiple frequencies of the interference signal(s).

Abstract translation: 描述了用于确定光学系统（例如，干涉仪）和/或光学元件（例如，透镜和/或透镜系统）的性质的方法和相关系统。 例如，可以通过提供扫描干涉测量数据来确定与干涉仪的光学厚度失配有关的信息。 数据通常包括获得每个对应于测试对象的不同空间位置的一个或多个干扰信号。 确定每个干扰信号的多个频率中的每一个的相位。 基于干涉信号的多个频率中的每一个的相位确定与光学厚度失配有关的信息。

公开(公告)号：US20060152709A1

公开(公告)日：2006-07-13

申请号：US11327324

申请日：2006-01-09

Applicant: Satoshi Imaizumi

Inventor： Satoshi Imaizumi

IPC: G01B9/00

CPC classification number: G01M11/0228

Abstract: A lens meter having a simple configuration, which is capable of precisely measuring optical characteristics such as refractive power distribution in a wide range of a subject lens to be measured at a time. The lens meter has a projection unit which projects a measurement light bundle, a projection lens which projects the measurement light bundle from the projection unit onto the subject lens placed on an optical axis of the projection lens, a diaphragm having an aperture disposed between the projection unit and the projection lens, and a two-dimensional photodetector which photo-receives the measurement light bundle passed through the subject lens after passed through the aperture of the diaphragm and the projection lens, and wherein the projection unit forms a target pattern, and the aperture of the diaphragm is disposed at a front focal point of the projection lens.

Abstract translation: 一种具有简单结构的透镜仪，其能够精确地测量一次要测量的被摄体透镜的宽范围内的光学特性，例如屈光度分布。 透镜计具有投影单元，其投影测量光束，将测量光束从投影单元投影到放置在投影透镜的光轴上的被摄体透镜上的投影透镜，具有设置在投影单元 单元和投影透镜，以及二次光电检测器，其在通过光阑和投影透镜的孔之后照射接收经过被摄体透镜的测量光束，并且其中投影单元形成目标图案，并且 隔膜的孔径设置在投影透镜的前焦点处。

公开(公告)号：US20060077378A1

公开(公告)日：2006-04-13

申请号：US10960025

申请日：2004-10-08

Applicant: Ki-Jun Nam ,  Sang-Jun Han

Inventor： Ki-Jun Nam ,  Sang-Jun Han

IPC: G01B9/00

CPC classification number: G01M11/0228

Abstract: An optical system for an automatic lens meter for measuring the refractive power of a lens to be examined. The optical system includes a light source for generating a measuring light beam, a convex collimator lens, disposed a predetermined focal distance from the light source, for collimating the measuring light beam, so that the light beam move in parallel, an expanding concave lens, disposed downstream of a lens to be examined, for expanding the measuring light beam with respect to an optic axis, a plural-apertures stop, disposed downstream of the expanding concave lens and formed with a plurality of apertures along the circumference thereof at predetermined angular intervals, for separating the measuring light beam into a plurality of measuring light beams, a prism lens in which a convex lens and a fixed prism assembly are integrally formed, disposed directly downstream of the plural-apertures stop, having the convex lens to focus the plural measuring light beams passed through the plural-apertures stop, and the same number of prisms as the number of the plural apertures to deflect the focused light beams so as to maintain the light beams in the separated beams, and an image forming lens, disposed downstream of the prism lens, for forming aperture images of the measuring light beams, passed through the prism lens, on a two-dimensional sensor array.

公开(公告)号：US20020149745A1

公开(公告)日：2002-10-17

申请号：US10110383

申请日：2002-04-10

Inventor： Yasufumi Fukuma ,  Takeyuki Kato

IPC: A61B003/00

CPC classification number: G01M11/0235 ,  G01M11/0228

Abstract: A refractive power measuring method is disclosed wherein a pattern plate 8 is disposed at a certain position in a measuring optical path in a measuring optical system 1, a measuring light emitted from a measuring light source 5 is received by a photosensor 9 through the pattern plate 8, a soft contact lens TL is disposed at a certain position in the measuring optical path, and a change of a pattern light received by the photosensor 9 is obtained to determine optical characteristic values of the soft contact lens. According to this method, the soft contact lens TL is disposed in a wet state at a certain position of the measuring optical path and scattered light resulting from scatter of the measuring light on a surface of the soft contact lens TL is received by the photosensor 9, then a state of scatter of the scattered light is determined from a change of a received light signal outputted from the photosensor 9 and there are obtained optical characteristic values when the received light signal is below a preset value.

Abstract translation: 公开了一种折射率测量方法，其中图案板8设置在测量光学系统1中的测量光路中的特定位置，从测量光源5发射的测量光通过图案板被光电传感器9接收 如图8所示，柔性隐形眼镜TL设置在测量光路中的某个位置处，并且获得由光传感器9接收的图案光的改变以确定软性隐形眼镜的光学特性值。 根据该方法，柔软的隐形眼镜TL在测量光路的特定位置处于湿润状态，并且由软性隐形眼镜TL的表面上的测量光散射产生的散射光被光传感器9接收 ，则根据从光电传感器9输出的接收光信号的变化来确定散射光的散射状态，并且当接收到的光信号低于预设值时获得光学特性值。

公开(公告)号：US5847819A

公开(公告)日：1998-12-08

申请号：US845025

申请日：1997-04-21

Applicant: Eiichi Yanagi

Inventor： Eiichi Yanagi

IPC: G01M11/02 ,  G01B9/00

CPC classification number: G01M11/0214 ,  G01M11/0207 ,  G01M11/0228

Abstract: A lens meter is provided which includes a light source portion (1) which emits measuring light (P) having at least three different wavelengths; a light receiving portion (3) which receives the measuring light (P) which has passed through a to-be-inspected lens immersed in a liquid (12) as a medium; an in-medium optical characteristic measuring device for measuring an optical characteristic of the lens (13) in the medium about each wavelength, based on a deviated quantity of the measuring light detected by the light receiving portion (3); a refractive index calculating device for calculating a refractive index of material of the lens (13), based on a difference of the optical characteristic of the lens in the medium among the wavelengths; and a converting device for converting the optical characteristic of the lens (13) in the medium into an optical characteristic of the lens (13) in the air, based on the refractive index calculated by the refractive index calculating device.

Abstract translation: 提供了一种透镜计，其包括发射具有至少三个不同波长的测量光（P）的光源部分（1） 受光部（3），其容纳已经通过浸在作为介质的液体（12）中的被检查透镜的测量光（P）; 基于由所述光接收部分（3）检测到的测量光的偏离量来测量所述介质中围绕每个波长的透镜（13）的光学特性的介质内光学特征测量装置; 折射率计算装置，用于根据所述介质中的所述透镜的所述光学特性的差异来计算所述透镜（13）的材料的折射率; 以及转换装置，用于基于由折射率计算装置计算的折射率，将介质中的透镜（13）的光学特性转换成空气中的透镜（13）的光学特性。

公开(公告)号：US5742381A

公开(公告)日：1998-04-21

申请号：US739270

申请日：1996-10-29

Applicant: Yasunori Ueno

Inventor： Yasunori Ueno

IPC: G01B11/24 ,  G01B11/255 ,  G01M11/00 ,  G01M11/02 ,  G02C7/02 ,  G01B9/00

CPC classification number: G01M11/0264 ,  G01B11/255 ,  G01M11/0228

Abstract: Apparatus and methods for measuring refractive power and radius of curvature of a lens are disclosed. The apparatus comprises a refractive-power measurement subsystem in combination with a curvature-radius measurement subsystem. Each subsystem has its own optical axis and includes at least two point sources of light symmetrically situated relative to the respective optical axis in a plane perpendicular to the axis. Light fluxes from the light sources pass through or reflect from, respectively, the subject lens and impinge on a light-position sensor such as a CCD. The optical axes are preferably separate but become coaxial before reaching the light-position sensor. The refractive-index measurement subsystem senses the positions of images of the light sources on the light-position sensor as affected by refraction of light fluxes passing through the subject lens relative to positions of images obtained with no lens is being measured. The curvature-radius measurement subsystem senses the positions of images of the light sources as affected by reflection of light fluxes from the lens surface relative to positions of images obtained when the surface is planar.

Abstract translation: 公开了用于测量透镜的屈光力和曲率半径的装置和方法。 该装置包括与曲率半径测量子系统组合的折射率测量子系统。 每个子系统具有其自己的光轴并且包括在垂直于轴线的平面中相对于相应光轴对称地定位的至少两个点光源。 来自光源的光通量分别穿过或者从目镜透镜反射并撞击在诸如CCD的光位置传感器上。 光轴优选是分开的，但在到达光位置传感器之前变得同轴。 折射率测量子系统检测光源位置传感器上的光源的图像的位置，其影响相对于无透镜获得的图像的位置而穿过被摄体透镜的光束的折射。 曲率半径测量子系统感测光源的图像的位置受到来自透镜表面的光束的反射相对于当表面是平面时获得的图像的位置的影响。

公开(公告)号：US5289254A

公开(公告)日：1994-02-22

申请号：US768523

申请日：1992-02-06

Applicant: Bernhard Braunecker ,  Bernhard Gaechter ,  Andre Huiser, deceased

Inventor： Bernhard Braunecker ,  Bernhard Gaechter ,  Andre Huiser, deceased

IPC: G01M11/02 ,  G01B9/00

CPC classification number: G01M11/0228

Abstract: Process and apparatus for testing optical components (12) or systems which are contained in an apparatus consisting of a focusing optical system (1) and a space-resolving light detector (2) close to the focal plane thereof, it being provided that a source (3), containing a collimator (32), for a narrowly delimited precisely parallel light beam with a plane wavefront is moved rectilinearly in a plane parallel to the wavefront, at a plurality of positions of the source (3) the signal of the light detector (2) is determined, tilting movements of the source (3) perpendicular to the line direction are detected by an apparatus with a second collimator (52) and space-sensitive detector (51), and the aperture of the optical system (1) is scanned twice with line directions rotated relative to one another through approximately 90.degree., and in addition an individual line coming close to the axis of rotation is scanned in a position rotated through approximately 45.degree..

Abstract translation: PCT No.PCT / EP91 / 00219 Sec。 371日期：1992年2月6日 102（e）日期1992年2月6日PCT 1991年2月5日PCT PCT。 出版物WO91 / 日期：1991年8月22日。用于测试由聚焦光学系统（1）和靠近其焦平面的空间分辨光检测器（2）组成的设备中的光学部件（12）或系统的测试过程和装置 设置在源极的多个位置处，包括准直器（32）的用于狭窄界定的具有平面波前的精确平行光束的源（3）在平行于波前的平面中直线移动 3）确定光检测器（2）的信号，通过具有第二准直器（52）和空间敏感检测器（51）的装置检测垂直于线方向的源极（3）的倾斜运动，并且 光学系统（1）的孔径被扫描两次，线相对于彼此旋转大约90度，另外靠近旋转轴线的单独的线被扫描在大约45度旋转的位置。