Methods and devices for performing matrix assisted laser desorption/lonization protocols
    91.
    发明申请
    Methods and devices for performing matrix assisted laser desorption/lonization protocols 审中-公开
    用于执行矩阵辅助激光解吸/离子化方案的方法和装置

    公开(公告)号:US20040185448A1

    公开(公告)日:2004-09-23

    申请号:US10393532

    申请日:2003-03-20

    CPC分类号: H01J49/0418 G01N1/4044

    摘要: Methods and devices for performing matrix assisted laser desorption/ionization protocols are provided. In accordance with the subject methods, an analyte is first deposited into a fluid retaining structure present on a substrate surface. The fluid retaining structure includes a material that changes from a first fluid state to a second solid state in response to an applied stimulus. The resultant retained analyte is then digested with an analyte-digesting reagent to produce fragments of the analyte. The resultant fragments are then ionized for subsequent mass spectrometry analysis. Also provided are devices, e.g., sample holders, suitable for use in the subject methods. Kits for use in the subject methods are also provided.

    摘要翻译: 提供了用于执行矩阵辅助激光解吸/电离方案的方法和装置。 根据本发明的方法,首先将分析物沉积到存在于基底表面上的流体保持结构中。 流体保持结构包括响应于施加的刺激从第一流体状态变为第二固态的材料。 然后将得到的残留分析物用分析物消化试剂消化以产生分析物的碎片。 然后将所得片段电离以用于随后的质谱分析。 还提供了适用于本发明方法的装置,例如样品架。 还提供了在主题方法中使用的套件。

    Tissue treatment
    92.
    发明申请
    Tissue treatment 审中-公开
    组织治疗

    公开(公告)号:US20040053212A1

    公开(公告)日:2004-03-18

    申请号:US10451448

    申请日:2003-06-20

    IPC分类号: C12Q001/00 A23C003/00

    CPC分类号: G01N1/44 G01N1/31 G01N1/4044

    摘要: The present invention describes a method of isolating or extracting fluid from a tissue comprising treating the tissue with microwaves and collecting the resulting tissue fluid.

    摘要翻译: 本发明描述了从组织中分离或提取流体的方法,包括用微波处理组织并收集所得到的组织液。

    Quartz member for semiconductor manufacturing equipment and method for metal analysis in quartz member
    93.
    发明申请
    Quartz member for semiconductor manufacturing equipment and method for metal analysis in quartz member 审中-公开
    石英构件用于半导体制造设备和金属分析方法的石英构件

    公开(公告)号:US20030000458A1

    公开(公告)日:2003-01-02

    申请号:US10181980

    申请日:2002-07-24

    IPC分类号: C30B001/00

    摘要: Quartz member such as a quartz tube for semiconductor manufacturing equipment capable of heat treating a substrate to be treated without causing contamination, a manufacturing method of such quartz member, thermal treatment equipment furnished with such quartz member, and an analysis method of metal in quartz member are provided. A quartz specimen is immersed in hydrofluoric acid to expose a layer to be analyzed located at a prescribed depth. On an exposed surface, a decomposition liquid such as hydrofluoric acid or nitric acid is dripped to decompose only an extremely thin layer to be analyzed, followed by recovering of the decomposition liquid. The decomposition liquid is quantitatively analyzed by use of atomic absorption spectroscopy (AAS) or the like to measure an amount of metal contained in the decomposition liquid. From a difference of thicknesses before and after the decomposition and an area of dripped decomposition liquid, a volume of a decomposed layer to be analyzed is obtained. From this and the amount of metal contained in the decomposition liquid, a concentration of metal contained in the layer to be analyzed, in addition a diffusion coefficient of a layer to be analyzed is calculated. With thus obtained diffusion coefficient as an index, quartz material in which metal diffuses with difficulty is sorted out. With thus sorted quartz material, a quartz member used for semiconductor manufacturing equipment such as a quartz tube is manufactured.

    摘要翻译: 石英部件,例如能够对被处理基板进行热处理而不引起污染的半导体制造设备的石英管,这种石英部件的制造方法,配备有这种石英部件的热处理设备以及石英部件中的金属分析方法 被提供。 将石英样品浸入氢氟酸中以暴露位于规定深度的被分析层。 在暴露的表面上,滴加氢氟酸或硝酸等分解液,仅分解极薄的待分析层,然后回收分解液。 通过使用原子吸收光谱法(AAS)等对分解液进行定量分析,以测量分解液中所含的金属的量。 根据分解前后的厚度差和滴落分解液的面积,得到待分析体积的分解层。 由此和分解液中所含的金属的量,计算待分析层中所含的金属的浓度,另外计算待分析层的扩散系数。 以这样获得的扩散系数作为指标,分析难以扩散金属的石英材料。 通过这样排列的石英材料,制造了用于诸如石英管的半导体制造设备的石英部件。

    Method for detecting metal contamination on a silicon chip by implanting arsenic
    94.
    发明申请
    Method for detecting metal contamination on a silicon chip by implanting arsenic 失效
    通过植入砷来检测硅芯片上的金属污染的方法

    公开(公告)号:US20020137343A1

    公开(公告)日:2002-09-26

    申请号:US10105507

    申请日:2002-03-26

    IPC分类号: H01L021/302 H01L021/461

    摘要: Embodiments of the present invention relate to implanting arsenic into a wafer to quickly detect if there is metal contamination, such as iron, aluminum, or manganese, on the wafer. In accordance with an aspect of the present invention, a method for detecting metal contamination of a silicon chip comprises implanting arsenic ions into the silicon chip, and etching the silicon chip with a chemical etching solution. The existence of any metal contamination is detected by observing occurrence of silicon pits on the silicon chip caused by reaction between the arsenic ions and the metal contamination and etching with the chemical etching solution.

    摘要翻译: 本发明的实施例涉及将砷注入晶片​​以快速检测在晶片上是否存在诸如铁,铝或锰的金属污染物。 根据本发明的一个方面,一种用于检测硅芯片的金属污染的方法包括将砷离子注入到硅芯片中,并用化学蚀刻溶液蚀刻硅芯片。 通过观察由砷离子和金属污染物之间的反应引起的硅芯片上的硅坑的发生以及用化学蚀刻溶液的蚀刻来检测是否存在任何金属污染。

    Hydride formation analytical apparatus
    95.
    发明授权
    Hydride formation analytical apparatus 失效
    氢化物形成分析仪

    公开(公告)号:US06171552B2

    公开(公告)日:2001-01-09

    申请号:US09016416

    申请日:1998-01-30

    IPC分类号: G01N3320

    摘要: The present invention provides for a hydride formation analytical apparatus which forms hydrides of target components contained in a sample liquid and then analyzes them. The hydride formation analytical apparatus comprises a sample-introducing part, a reagent-introducing part, a reaction part, a gas-liquid separating part and a detecting part, wherein an acid-feeding part and a reducing agent-feeding part are part of the reagent-introducing part; the hydride gas of the sample is formed by the aid of the acid and the reducing agent fed into the above reaction part; and this is introduced into the detecting part for analysis.

    摘要翻译: 本发明提供一种氢化物形成分析装置,其形成包含在样品液体中的目标组分的氢化物,然后分析它们。 氢化物形成分析装置包括样品引入部分,试剂引入部分,反应部分,气液分离部分和检测部分,其中酸进料部分和还原剂进料部分是 试剂引入部分; 借助于进料到上述反应部分的酸和还原剂形成样品的氢化物气体; 并将其引入检测部分进行分析。

    Method and apparatus for the quantitative measurement of the corrosivity
effect of residues present on the surface of electronic circuit
assemblies
    97.
    发明授权
    Method and apparatus for the quantitative measurement of the corrosivity effect of residues present on the surface of electronic circuit assemblies 失效
    用于定量测量存在于电子电路组件表面上的残留物的腐蚀性影响的方法和装置

    公开(公告)号:US5783938A

    公开(公告)日:1998-07-21

    申请号:US804795

    申请日:1997-02-24

    摘要: An apparatus and test method for determining the cleanliness (based on corrosivity) of a specific area on an electronic circuit assembly, such as the area between holes or pads on a single side of an assembly. The apparatus includes: (1) an extraction cell for providing an extraction fluid to an electronic circuit assembly ("ECA") area to be measured; (2) an extraction fluid for extracting residue from the ECA area to be measured; (3) a test cell with two or more electrodes and a voltage source for providing a voltage to the electrodes; and (4) a timer for measuring the time between the application of the voltage and an electrical short between the electrodes. The method includes: (1) positioning an extraction cell over an electronic circuit assembly area to be measured; (2) dispensing an extraction fluid into the extraction cell; (3) contacting the ECA area to be measured with the extraction fluid for a time sufficient to extract residue from the ECA area; (4) transferring the extraction fluid to a test cell made of two or more electrodes; (5) applying a voltage to the electrodes; and (6) measuring the time between the application of the voltage and an electrical short between the electrodes.

    摘要翻译: 一种用于确定电子电路组件上的特定区域的清洁度(基于腐蚀性)的装置和测试方法,例如在组件的单​​侧上的孔或焊盘之间的区域。 该装置包括:(1)提取单元,用于将提取流体提供给待测量的电子电路组件(“ECA”)区域; (2)提取流体,用于从待测量的ECA区域中提取残留物; (3)具有两个或多个电极的测试电池和用于向电极提供电压的电压源; 以及(4)计时器,用于测量施加电压与电极之间的电短路之间的时间。 该方法包括:(1)将提取单元定位在要测量的电子电路组件区域上; (2)将提取液分配到提取池中; (3)将待测量的ECA区域与提取液接触足以从ECA区域中提取残留物的时间; (4)将提取流体输送到由两个或更多个电极制成的测试电池; (5)向电极施加电压; 和(6)测量施加电压和电极之间的电短路之间的时间。

    Method for processing biomaterials
    98.
    发明授权
    Method for processing biomaterials 失效
    生物材料加工方法

    公开(公告)号:US4094640A

    公开(公告)日:1978-06-13

    申请号:US764541

    申请日:1977-01-31

    摘要: A method for processing biomaterial, particularly meat, in which coarsely comminuted biomaterial with a moisture of up to 80% is dried in a processing vessel down to a residual moisture of about 5-10% and subsequently burned at a pressure of 20 to 40 bar in pure oxygen permitting metal traces, particularly mercury, cadmium, lead and arsenic, to be readily determined analytically in the process solution.

    摘要翻译: 一种用于处理生物材料,特别是肉的方法,其中具有高达80%的水分的粗粉碎的生物材料在处理容器中干燥至约5-10%的残余水分,随后在20至40巴的压力下燃烧 在允许金属痕迹,特别是汞,镉,铅和砷的纯氧中,可以在工艺溶液中分析地容易地确定。

    MICROORGANISM DETECTION APPARATUS AND MICROORGANISM DETECTION METHOD

    公开(公告)号:US20240240223A1

    公开(公告)日:2024-07-18

    申请号:US18563600

    申请日:2022-05-13

    IPC分类号: C12Q1/04 G01N1/40

    摘要: A microorganism detection apparatus detects contaminating microorganisms in a sample. For detecting the contaminating microorganisms more quickly than a conventional apparatus, the microorganism detection apparatus includes a pre-treatment unit that sorts out contaminating microorganisms from a sample and concentrates the contaminating microorganisms, and a measurement unit that measures an ATP content in a concentrate obtained as a result of concentration by the pre-treatment unit. The pre-treatment unit sorts out the contaminating microorganisms from the sample by removing cells other than the contaminating microorganisms in the sample by physical disruption, chemical disruption, and/or filtering.