公开(公告)号：US20180314231A1

公开(公告)日：2018-11-01

申请号：US15583728

申请日：2017-05-01

申请人： Honeywell International Inc.

发明人： Sridhar Srinivasan

IPC分类号： G05B19/4065 ,  G06N5/02

摘要： A method for damage prediction includes obtaining a damage prediction model for equipment used in an industrial process, where the damage prediction model mathematically represents expected damage to the equipment based on a plurality of characteristics of a process input and a plurality of characteristics of the equipment. The method also includes obtaining actual values for the plurality of characteristics of the process input. The method further includes determining a predicted rate of damage to the equipment by the process input based on the actual values for the plurality of characteristics of the process input, the plurality of characteristics of the equipment, and the damage prediction model. The method additionally includes generating an indication of a safety level of the process input for the equipment and displaying the indication of the safety level of the process input for the equipment.

公开(公告)号：US20180307203A1

公开(公告)日：2018-10-25

申请号：US15956876

申请日：2018-04-19

申请人： FANUC Corporation

发明人： Nobuaki AIZAWA ,  Tomokazu KAYANUMA

IPC分类号： G05B19/408 ,  G05B13/02 ,  G05B19/402 ,  G05B19/4065

CPC分类号： G05B19/4083 ,  G05B13/0265 ,  G05B19/402 ,  G05B19/4065 ,  G05B2219/37245 ,  G05B2219/49061

摘要： A machining defect factor estimation device includes a machine learning device that learns an occurrence factor of a machined-surface defect based on an inspection result on a machined surface of a workpiece. The machine learning device observes the inspection result on the machined surface of the workpiece from an inspection device, as a state variable, acquires label data indicating the occurrence factor of the machined-surface defect, and learns the state variable and the label data in a manner such that they are correlated each other.

公开(公告)号：US20180246494A1

公开(公告)日：2018-08-30

申请号：US15902560

申请日：2018-02-22

申请人： FANUC CORPORATION

发明人： Yasuhiro NAKAHAMA

IPC分类号： G05B19/4065 ,  G05B19/18 ,  G05B19/408 ,  G06F15/18 ,  G06N3/02

CPC分类号： G05B19/4065 ,  G05B19/182 ,  G05B19/4083 ,  G05B2219/37252 ,  G06F15/76 ,  G06N3/02 ,  G06N3/0454 ,  G06N3/084 ,  G06N20/00

摘要： A scattering direction, a scattering range, a scattering speed, or the like of chip generated by machining is acquired by image pickup unit, and a state (such as wearing and fracture) of a tool is estimated from the acquired dynamic information. A machine learning device is used to perform the estimation and the machine learning device is caused to learn a state of a tool relative to the combination of a plurality of dynamic information on the vicinity of the tool, and the state of the tool is estimated based on a result of the learning.

公开(公告)号：US20180180551A1

公开(公告)日：2018-06-28

申请号：US15853074

申请日：2017-12-22

申请人： Nuctech Company Limited

发明人： Jianhong Zhang ,  Ankai Wang ,  Hongqiu Wang ,  Rui Fan ,  Huacheng Feng

IPC分类号： G01N21/65 ,  G01J5/00 ,  G01N21/01 ,  G05B19/4065 ,  G01J3/44

CPC分类号： G01N21/65 ,  G01J3/44 ,  G01J3/4412 ,  G01J5/0003 ,  G01N21/01 ,  G01N2201/06113 ,  G01N2201/063 ,  G02B27/141 ,  G05B19/4065 ,  G05B2219/49353

摘要： A Raman spectrum inspection apparatus and a security monitoring method for a Raman spectrum inspection apparatus are provided. The Raman spectrum inspection apparatus includes: a laser device configured to emit an exciting light; an optical device configured to guide the exciting light to an object to be detected and collect a light signal from the object; a spectrometer configured to split the collected light signal to generate a Raman spectrum of the object; and a security detector configured to detect an infrared light emitted from the object.

公开(公告)号：US09981359B2

公开(公告)日：2018-05-29

申请号：US14716459

申请日：2015-05-19

申请人： Fu Tai Hua Industry (Shenzhen) Co., Ltd. ,  HON HAI PRECISION INDUSTRY CO., LTD.

发明人： Bang-Bing Yin ,  Le-Hua Li ,  Wei Qu ,  Wei-Min Yang ,  Xue Qin

IPC分类号： B23Q17/09 ,  G05B19/4065 ,  B23Q17/22

CPC分类号： B23Q17/0909 ,  B23Q17/22 ,  G05B19/4065 ,  G05B2219/37245 ,  G05B2219/50203 ,  G05B2219/50276

摘要： A broken tool detection mechanism applied in a CNC machine includes a base support, a first conductive elastic sheet securely mounted on the base support, and a second conductive elastic sheet. The second conductive elastic sheet is mounted on the base support, at least partially located over the first conductive elastic sheet, and spaced apart from the second conductive elastic sheet by a predetermined distance. The second conductive elastic sheet is pushed towards the first conductive elastic sheet so that the first conductive elastic sheet and the second conductive elastic sheet make electrical contact.

公开(公告)号：US20180143616A1

公开(公告)日：2018-05-24

申请号：US15574779

申请日：2015-07-01

申请人： LANDMARK GRAPHICS CORPORATION

发明人： Samuel ROBELLO ,  Aravind PRABHAKAR ,  Christopher Neil MARLAND

IPC分类号： G05B19/4065 ,  E21B44/00

CPC分类号： G05B19/4065 ,  E21B44/00

摘要： Systems and methods for predicting drilling tool failure based on an analysis of at least one of a plot of jerk and inverse jerk for the drilling tool and a plot of drilling tool failure pattern trends data.

公开(公告)号：US20180107192A1

公开(公告)日：2018-04-19

申请号：US15729823

申请日：2017-10-11

申请人： FANUC CORPORATION

发明人： Satoru Endo ,  Shinya Nakamura ,  Hideaki Maeda

IPC分类号： G05B19/4068 ,  G05B19/401 ,  G05B19/4065 ,  G05B19/19

摘要： An information processing device displays an NC machining program and a physical state of a machine tool that is operated based on the NC machining program. The information processing device acquires, during execution of a block in a machining block, data indicative of the physical state of the machine tool, associates the block that was being executed with the acquired data and stores the block and the data that have been associated. In addition, the information processing device refers to the database and draw the block using a color according to an intensity of the data, and displays the NC machining program.

公开(公告)号：US20180052443A1

公开(公告)日：2018-02-22

申请号：US15552923

申请日：2016-02-24

申请人： INTERFLUX SINGAPORE PTE LTD

发明人： Willem Jeanne V. Van Riet ,  Erik Poortman

IPC分类号： G05B19/4065 ,  B05B12/08 ,  B23K3/08

CPC分类号： G05B19/4065 ,  B05B12/08 ,  B05B12/082 ,  B05B13/041 ,  B05B15/40 ,  B05B15/55 ,  B23K3/082 ,  G05B2219/45235 ,  H05K3/3489 ,  H05K2203/0746

摘要： A control system for a fluxer, the control system comprising: a variable speed pump configured to provide pressurised flow of liquid flux from a flux supply tank; a pulse-width-modulated (PWM) valve coupled to the variable speed pump; a jet nozzle coupled to the PWM valve and configured to eject a jet of flux drops onto a substrate to form flux points, lines or areas thereon; and a controller coupled to the variable speed pump and the PWM valve; wherein the controller is configured to generate PWM signals to control the PWM valve, and pump speed signals to control the variable speed pump, to thereby selectively and individually control volume of individual flux drops, and pressure and flow of the liquid flux, to form the flux points, lines or areas on the substrate.

公开(公告)号：US09849554B2

公开(公告)日：2017-12-26

申请号：US15227229

申请日：2016-08-03

申请人： Arizona Board of Regents on behalf of Arizona State University

发明人： Angela A. Sodemann ,  Anuj K. Bajaj ,  Jason R. Vaughn

IPC分类号： B23Q17/09 ,  B23Q11/00 ,  B23Q17/24 ,  B23C1/00 ,  B23C9/00 ,  G05B19/4065 ,  G06T3/40 ,  G06T7/00 ,  G06T7/13 ,  G06T7/136

CPC分类号： B23Q17/0952 ,  B23C2230/04 ,  B23C2230/08 ,  B23Q11/0046 ,  B23Q11/0075 ,  B23Q17/0904 ,  B23Q17/2452 ,  G05B19/4065 ,  G05B2219/37256 ,  G05B2219/37258 ,  G06T3/403 ,  G06T7/0004 ,  G06T7/13 ,  G06T7/136 ,  G06T2207/10024 ,  G06T2207/20192 ,  G06T2207/30242 ,  Y10T408/21 ,  Y10T408/50 ,  Y10T409/303752 ,  Y10T409/30392 ,  Y10T409/304088 ,  Y10T409/306888 ,  Y10T409/30728

摘要： The wear status of a micro-endmill tool may be inferred by monitoring the chip production rate of the tool in operation. Chips may be extracted from a work area, captured on an adhesive surface, imaged, and counted to determine the chip production rate. When the rate of chip production falls, the feed rate of the micro-endmill may be increased to a level suitable for the current state of tool wear. In this manner, costly and inconvenient work stoppages to evaluate the wear status of a tool are eliminated.

公开(公告)号：US20170364056A1

公开(公告)日：2017-12-21

申请号：US15608360

申请日：2017-05-30

申请人： DMG MORI CO., LTD.

发明人： Katsuhiko Ono ,  Shizuo Nishikawa ,  Masataka Sakamoto ,  Kengo Kawai

IPC分类号： G05B19/4065 ,  G06F17/30

CPC分类号： G05B19/4065 ,  G05B2219/37249 ,  G06F16/23 ,  G06F16/489

摘要： A machining management apparatus includes a tool information storage storing therein information relating to each cutting tool used in a machine tool and storing therein a coefficient n and a coefficient C in a tool life equation corresponding to tool life influencing factors including at least a workpiece and a cutting tool material, and an adapted cutting speed calculator executing a machining condition receiving processing of receiving information on the tool life influencing factors and information on a desired cutting speed, a coefficient recognition processing of recognizing the coefficient n and the coefficient C corresponding to the tool life influencing factors by referring to the tool information storage based on the received tool life influencing factor information, and a cutting speed calculation processing of calculating a cutting speed adapted to the desired cutting time according to the tool life equation based on the recognized coefficient n and coefficient C.