Abstract:
Methods of fabricating transistors and semiconductor devices and structures thereof are disclosed. In one embodiment, a method of fabricating a transistor includes forming a gate dielectric over a workpiece, forming a gate over the gate dielectric, and forming a stress-inducing material over the gate, the gate dielectric, and the workpiece. Sidewall spacers are formed from the stress-inducing material on sidewalls of the gate and the gate dielectric.
Abstract:
Semiconductor devices and methods of manufacturing thereof are disclosed. In a preferred embodiment, a method of manufacturing a semiconductor device includes providing a workpiece, and forming a recess in the workpiece. The recess has a depth having a first dimension. A first semiconductive material is formed in the recess to partially fill the recess in a central region to a height having a second dimension. The second dimension is about one-half or greater of the first dimension. A second semiconductive material is formed over the first semiconductive material in the recess to completely fill the recess, the second semiconductive material being different than the first semiconductive material.
Abstract:
Resistors, semiconductor devices, and methods of manufacture thereof are disclosed. In one embodiment, a method of fabricating a resistor includes forming a semiconductive material over a workpiece, and patterning at least the semiconductive material, forming a gate of a transistor in a first region of the workpiece and forming a resistor in a second region of the workpiece. At least one substance is implanted into the semiconductive material of the gate of the transistor or the resistor so that the semiconductive material is different for the gate of the transistor and the resistor.
Abstract:
Semiconductor devices and methods of manufacturing thereof are disclosed. In a preferred embodiment, a method of manufacturing a semiconductor device includes providing a workpiece, and forming a recess in the workpiece. The recess has a depth having a first dimension. A first semiconductive material is formed in the recess to partially fill the recess in a central region to a height having a second dimension. The second dimension is about one-half or greater of the first dimension. A second semiconductive material is formed over the first semiconductive material in the recess to completely fill the recess, the second semiconductive material being different than the first semiconductive material.
Abstract:
A light distribution board having an improved light grating structure including a plurality of light gratings each with multiple focuses, the light distribution board is used on a light outputting surface of a lamp, in which at least a transparent board is provided on at least one of its surfaces with a plurality of light gratings each having multiple focuses, each light grating having multiple focuses is composed of two or more arciform (concave or convex) lenses and at least one lens with a non-arciform surface to form a light grating having at least two focuses. With this structure, light beams can be uniformly distributed and can avoid the phenomenon of Gauss distribution that makes the area below the lamp especially bright, and avoid the phenomenon of dazzling of eyes during looking at the light emitting member in the lamp, and the light beams become more tender under the condition that lose of brightness is minimum.
Abstract:
Semiconductor devices and methods of manufacture thereof are disclosed. In a preferred embodiment, a method of manufacturing a semiconductor device includes providing a semiconductor wafer, forming at least one isolation structure within the semiconductor wafer, and forming at least one feature over the semiconductor wafer. A top portion of the at least one isolation structure is removed, and a liner is formed over the semiconductor wafer, the at least one feature, and the at least one isolation structure. A fill material is formed over the liner. The fill material and the liner are removed from over at least a portion of a top surface of the semiconductor wafer.
Abstract:
The disclosure relates to nanotube composite structures and related methods and systems. In particular, structures, methods and systems are provided herein to allow for precise, tunable separation between nanomaterials such as carbon nanotubes.
Abstract:
There is disclosed a method of applying stress to a channel region underneath a gate of a field-effect-transistor, which includes the gate, a source region, and a drain region. The method includes steps of embedding stressors in the source and drain regions of the FET; forming a stress liner covering the gate and the source and drain regions; removing a portion of the stress liner, the portion of the stress liner being located on top of the gate of the FET; removing at least a substantial portion of the gate of a first gate material and thus creating an opening therein; and filling the opening with a second gate material.
Abstract:
An electronic environment sensing instrument having an analog indicator has a casing having a front panel with a scale, an electronic sensing and driving assembly mounted in the casing, a needle and a DC power supply. The electronic driving indicator assembly has a detecting and driving circuit to sense and measure an environmental parameter outside the casing and generates a control signal, a drive unit to receive the control signal and rotate a specific amount in a specific direction based on the control signal and a gear assembly connected to and driven by the drive unit. The needle is attached to and driven by the gear assembly and points to a specific value on the scale corresponding to the sensed environmental parameter.
Abstract:
Semiconductor devices and methods of manufacturing thereof are disclosed. Isolation regions are formed that include a stress-altering material at least partially lining a trench formed within a workpiece. The isolation regions include an insulating material disposed over the stress-altering material.